Related papers: Development of a high-frequency dielectric spectro…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
The design of a wideband decimeter-wave (200 - 900 MHz) spectrometer with a magnetic induction of up to ~ 10 T is described. This spectrometer is intended for studying electronic - nuclear oscillations in antiferromagnets at low…
A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver full two-dimensional map of RIXS intensity in one shot with parallel detection…
We propose the use of a frequency-dependent photothermal measurement as a complement to light-flash, i.e. time-dependent, measurements to determine the through-plane thermal diffusivity of small, thin samples, e.g. semiconducting polymers…
Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors…
Terahertz spectroscopy is a promising tool for analyzing the picosecond dynamics of biomolecules, which is influenced by surrounding water molecules. However, water causes extreme losses to terahertz signals, preventing sensitive…
Accurate characterization of ferroelectric properties in polymer piezoelectrics is critical for optimizing the performance of flexible and wearable ultrasound transducers, such as screen-printed PVDF devices. Standard charge measurement…
Emission spectra of several organic liquid-scintillator mixtures which are relevant for the proposed LENA detector have been measured by exciting the medium with electrons of ~10keV. The results are compared with spectra resulting from…
A major aspect in power line distribution networks is the constant monitoring of the network properties. With the advent of the smart grid concept, distributed monitoring has started complementing the information of the central stations. In…
Laser speckle can provide a powerful tool that may be used for metrology, for example measurements of the incident laser wavelength with a resolution beyond that which may be achieved in a commercial device. However, to realise highest…
Two laboratory emission spectrometers have been designed and described previously. Here, we present a follow-up study with special focus on absolute intensity calibration of the new SURFER-spectrometer (SUbmillimeter Receiver For Emission…
A novel THz near-field spectrometer is presented which allows to perform biological and medical studies with high spectral resolution combined with a spatial resolution down to l/100. In the setup an aperture much smaller than the used…
The diffraction spectrum of coherent waves scattered from fractal supports is calculated exactly. The fractals considered are of the class generated iteratively by successive dilations and translations, and include generalizations of the…
Vibrational levels of the electronic ground states in dye molecules have not been previously explored at high resolution in solid matrices. We present new spectroscopic measurements on single polycyclic aromatic molecules of…
To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…
Accurate measurement of light wavelength is critical for applications in spectroscopy, optical communication, and semiconductor manufacturing, ensuring precision and consistency of sensing, high-speed data transmission and device…
Pixel size in cameras and other refractive imaging devices is typically limited by the free-space diffraction. However, a vast majority of semiconductor-based detectors are based on materials with substantially high refractive index. We…
The structural complexity and instability of many interference phase microscopy methods are the major obstacles toward high-precision phase measurement. In this vein, improving more efficient configurations as well as proposing new methods…
An instrument has been developed for precision controlled exposures of electronic devices and material samples in particle beams. The instrument provides simultaneously a real time record of the profile of the beam and the fluence received.…
A modification of the Drude dispersive model based on fractional time derivative is presented. The dielectric susceptibility is calculated analytically and simulated numerically, showing a good agreement between theoretical description and…