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As Cyber-Physical Systems (CPS) become increasingly pervasive and autonomous, ensuring the resilience of their embedded logic is critical to maintaining safety and integrity. Among the most stealthy and damaging threats are non-invasive…
Understanding fault types can lead to novel approaches to debugging and runtime verification. Dealing with complex faults, particularly in the challenging area of embedded systems, craves for more powerful tools, which are now becoming…
Fault injections are increasingly used to attack/test secure applications. In this paper, we define formal models of runtime monitors that can detect fault injections that result in test inversion attacks and arbitrary jumps in the control…
The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault…
Rapidly shrinking technology node and voltage scaling increase the susceptibility of Soft Errors in digital circuits. Soft Errors are radiation-induced effects while the radiation particles such as Alpha, Neutrons or Heavy Ions, interact…
In recent years, the increasing complexity in scientific simulations and emerging demands for training heavy artificial intelligence models require massive and fast data accesses, which urges high-performance computing (HPC) platforms to…
Soft errors have a significant impact on the circuit reliability at nanoscale technologies. At the architectural level, soft errors are commonly modeled by a probabilistic bit-flip model. In developing such abstract fault models, an…
Soft errors are a type of transient digital signal corruption that occurs in digital hardware components such as the internal flip-flops of CPU pipelines, the register file, memory cells, and even internal communication buses. Soft errors…
Smaller feature size, higher clock frequency and lower power consumption are of core concerns of today's nano-technology, which has been resulted by continuous downscaling of CMOS technologies. The resultant 'device shrinking' reduces the…
Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can…
Whereas contemporary Error Correcting Codes (ECC) designs occupy a significant fraction of total die area in chip-multiprocessors (CMPs), approaches to deal with the vulnerability increase of CMP architecture against Single Event Upsets…
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Hardened circuits are currently required in…
Quantum computing is a new technology that is expected to revolutionize the computation paradigm in the next few years. Qubits exploit the quantum physics proprieties to increase the parallelism and speed of computation. Unfortunately,…
Embedded systems in safety-critical environments are continuously required to deliver more performance and functionality, while expected to provide verified safety guarantees. Nonetheless, platform-wide software verification (required for…
For many IoT domains, Machine Learning and more particularly Deep Learning brings very efficient solutions to handle complex data and perform challenging and mostly critical tasks. However, the deployment of models in a large variety of…
Electromagnetic Fault Injection (EMFI) is a powerful technique for inducing bit flips and instruction-level perturbations on microcontrollers, yet existing literature lacks a unified methodology for systematically mapping spatial…
Satellites are used for a multitude of applications, including communications, Earth observation, and space science. Neural networks and deep learning-based approaches now represent the state-of-the-art to enhance the performance and…
Fault injection attacks induce hardware failures in circuits and exploit these faults to compromise the security of the system. It has been demonstrated that FIAs can bypass system security mechanisms, cause faulty outputs, and gain access…
If devices are physically accessible optical fault injection attacks pose a great threat since the data processed as well as the operation flow can be manipulated. Successful physical attacks may lead not only to leakage of secret…
Upcoming certification actions related to the security of machine learning (ML) based systems raise major evaluation challenges that are amplified by the large-scale deployment of models in many hardware platforms. Until recently, most of…