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Related papers: 3D surface profilometry using neutral helium atoms

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Accurate and reliable measurements of three-dimensional surface structures are important for a broad range of technological and research applications, including materials science, nanotechnology, and biomedical research. Scanning helium…

Instrumentation and Detectors · Physics 2025-06-26 Aleksandar Radic , Sam Lambrick , Chenyang Zhao , Nick von Jeinsen , Andrew Jardine , David Ward , Paul Dastoor

Neutral helium atom microscopy, also referred to as scanning helium microscopy and commonly abbreviated SHeM or NAM (neutral atom microscopy), is a novel imaging technique that uses a beam of neutral helium atoms as an imaging probe. The…

Atomic and Molecular Clusters · Physics 2022-07-29 Adrià Salvador Palau , Sabrina Daniela Eder , Gianangelo Bracco , Bodil Holst

Scanning helium microscopy (SHeM) is an emerging technique that uses a beam of neutral atoms to image and analyse surfaces. The low energies ($\sim$64 meV) and completely non-destructive nature of the probe particles provide exceptional…

Scanning Helium Microscopy (SHeM) offers a combination of spatial and angular resolution via a pinhole-collimated beam of thermal energy, neutral helium-4 atoms for non-destructive imaging. This thesis introduces a novel 3D imaging mode,…

Applied Physics · Physics 2024-03-27 Aleksandar Radic

We present helium atom micro-diffraction as an ideal technique for characterization of 2D materials due to its ultimate surface sensitivity combined with sub-micron spatial resolution. Thermal energy neutral helium scatters from the valence…

Functional properties of nanomaterials strongly depend on their surface atomic structure, but they often become largely different from their bulk structure, exhibiting surface reconstructions and relaxations. However, most of the surface…

Materials Science · Physics 2021-10-01 Juhyeok Lee , Chaehwa Jeong , Yongsoo Yang

Surface scattering of neutral helium beams created by supersonic expansion is an established technique for measuring structural and dynamical properties of surfaces on the atomic scale. Helium beams have also been used in Fraunhofer and…

The study explores machine learning methods for revealing chemical sensitivity in Helium spin-echo spectroscopy, in order to obtain ultra-sensitive surface analytic technique. We model bi-species co-adsorbed systems and demonstrate that by…

Chemical Physics · Physics 2020-12-04 Reinis Irmejs , Nadav Avidor

Neutral helium atom microscopy is a novel microscopy technique that offers strictly surface-sensitive, non-destructive imaging. Several experiments have been published in recent years where images are obtained by scanning a helium beam spot…

Instrumentation and Detectors · Physics 2023-08-24 Ranveig Flatabø , Sabrina D. Eder , Thomas Reisinger , Gianangelo Bracco , Peter Baltzer , Björn Samelin , Bodil Holst

There is only a handful of scanning techniques that can provide surface topography at nanometre resolution. At the same time, there are no methods that are capable of non-invasive imaging of the three-dimensional surface topography of a…

Instrumentation and Detectors · Physics 2017-03-07 Tatiana Latychevskaia , Wei-Hao Hsu , Wei-Tse Chang , Chun-Yueh Lin , Ing-Shouh Hwang

The study of Stark broadening of neutral helium lines, despite significant advances over recent decades, has not led to updated large grids of helium line profiles relevant to the spectroscopic study of helium-rich stars. While the…

Solar and Stellar Astrophysics · Physics 2026-03-05 Patrick Tremblay , Alain Beauchamp , Pierre Bergeron , Antoine Bédard

Visualising the free surface of superfluid helium offers a rare opportunity to explore wave dynamics in the limit of vanishing viscosity. Such measurements are nonetheless challenging due to helium's low refractive index contrast,…

In this study, we investigate high-accuracy three-dimensional surface detection in smoothed particle hydrodynamics for free-surface flows. A new geometrical method is first developed to enhance the accuracy of free-surface particle…

Fluid Dynamics · Physics 2023-06-14 Wen-Bin Liu , Dong-Jun Ma , Jian-Zhen Qian , Ming-Yu Zhang , An-Min He , Nan-Sheng Liu , Pei Wang

The 3D characterization of microstructures is crucial for understanding and designing functional materials. However, the scanning electron microscope (SEM), widely used in scientific research, captures only 2D electron intensity…

Image and Video Processing · Electrical Eng. & Systems 2026-04-06 Shuo Chen , Yijin Li , Xi Zheng , Guofeng Zhang

Using electron tomography in combination with spatially resolved electron energy-loss spectroscopy at high energy resolution, we are able to map the valency of the Ce ions in CeO$_{2-x}$ nanocrystals. Our three-dimensional results show a…

Materials Science · Physics 2014-07-10 Bart Goris , Stuart Turner , Sara Bals , Gustaaf Van Tendeloo

Material thermal properties characterization at nanoscales remains a challenge even if progresses were done in developing specific characterization techniques like the Scanning Thermal Microscopy (SThM). In the present work, we propose a…

Applied Physics · Physics 2020-07-10 Gilles Pernot , Anas Metjari , Hadrien Chaynes , Mathieu Weber , Mykola Isaiev , David Lacroix

Helium atom scattering (HAS) is a well established technique for examining the surface structure and dynamics of materials at atomic sized resolution. The HAS technique Helium spin-echo spectroscopy opens up the possibility of compressing…

Materials Science · Physics 2015-10-05 Alex Jones , Anton Tamtögl , Irene Calvo-Almazán , Anders Hansen

This work presents a polyhedral scaled boundary finite element method (PSBFEM) for three dimensional seepage analysis. We first derive the scaled boundary formulation for 3D seepage problems, and subsequently incorporate Wachspress shape…

Numerical Analysis · Mathematics 2025-06-11 Mingjiao Yan , Yang Yang , Zongliang Zhang , Dengmiao Hao , Chao Su , Qingsong Duan

The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…

Computer Vision and Pattern Recognition · Computer Science 2016-02-18 Wichai Shanklin

This article presents a new optical measurement method employing a HSI (Hue, Saturation and Intensity) colour model to form trapezoidal structured patterns for morphology reconstruction of a measured object at a high speed. Profilometry on…

Optics · Physics 2015-05-19 L C Chen , X L Nguyen , Y S Shu
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