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Simulating high-resolution Synthetic Aperture Radar (SAR) images in complex scenes has consistently presented a significant research challenge. The development of a microwave-domain surface scattering model and its reversibility are poised…
Material decomposition for imaging multiple contrast agents in a single acquisition has been made possible by spectral CT: a modality which incorporates multiple photon energy spectral sensitivities into a single data collection. This work…
Using spherical mirrors in place of wide-angle cameras allows for cost-effective monitoring of manufacturing processes in hazardous environment, where a camera would normally not operate. This includes environments of high heat, vacuum and…
Polarization is well known for its ability to decompose diffuse and specular reflections. However, the existing decomposition methods only focus on direct reflection and overlook multiple reflections, especially specular inter-reflection.…
Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan…
With the advent of both modern X-ray fluorescence (XRF) methods and improved analytical reliability requirements the demand for suitable reference samples has increased. Especially in nanotechnology with the very low areal mass depositions,…
Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to…
We describe a diffraction microscopy technique based on refractive optics to study structural variations in crystals. The X-ray beam diffracted by a crystal was magnified by beryllium parabolic refractive lenses on a 2D X-ray camera. The…
Polarizing filters provide a powerful way to separate diffuse and specular reflection; however, traditional methods rely on several captures and require proper alignment of the filters. Recently, camera manufacturers have proposed to embed…
X-ray ptychography is one of the versatile techniques for nanometer resolution imaging. The magnitude of the diffraction patterns is recorded on a detector and the phase of the diffraction patterns is estimated using phase retrieval…
Magnetron sputtering is a widely used physical vapor deposition technique. Reactive sputtering is used for the deposition of, e.g, oxides, nitrides and carbides. In fundamental research, versatility is essential when designing or upgrading…
A shearing interferometer is presented which uses polarization control to shear the wavefront and to modulate the interference pattern. The shear is generated by spatial walk-off in a birefringent crystal. By adjusting the orientation of…
Copper deposition has been carried out at various time span on glass slide and silicon substrate by using indigenously developed unbalanced type DC magnetron sputtering system. The main objective of this work is to study the crystalline…
Imaging of the Bragg reflected x-ray beam is proposed and validated as an in-situ method for characterization of performance of double-crystal monochromators under the heat load of intense synchrotron radiation. A sequence of images is…
Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam…
Metasurfaces have attracted extensive interests due to their ability to locally manipulate optical parameters of light and easy integration to complex optical systems. Particularly, metasurfaces can provide a novel platform for splitting…
Magnetic x-ray diffraction combined with x-ray focusing optics is used to image individual antiferromagnetic spin density wave domains in a chromium single crystal at the micron scale. The cross section for non-resonant magnetic x-ray…
This paper proposed a novel and temporal phase-shift digital shearography system for simultaneous measurement of first order displacement derivative in orthogonal shear directions. Dual lasers with wavelengths of 532nm and 637nm, three…
The displacement field of an object surface can be measured by using speckle interferometry. This technique is based on the phenomenon of laser speckle and consists in correlating speckle interferograms taken after and before the…
Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the…