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Quantitative Transmission Electron Microscopy (TEM) during in-situ straining experiment is able to reveal the motion of dislocations -- linear defects in the crystal lattice of metals. In the domain of materials science, the knowledge about…

Computer Vision and Pattern Recognition · Computer Science 2023-09-08 Karina Ruzaeva , Kishan Govind , Marc Legros , Stefan Sandfeld

The fabrication of micro- and nano-scale silicon electronic devices requires precision lithography and controlled processing to ensure that the electronic properties of the device are optimized. Importantly, the Si-SiO2 interface plays a…

The properties of bulk nanostructured materials are often controlled by atomic scale features like segregation along defects or composition gradients. Here we discuss about the complimentary use of TEM and APT to obtain a full description…

Materials Science · Physics 2009-04-15 Xavier Sauvage , Williams Lefebvre , Cécile Genevois , S. Ohsaki , Kazuhiro Hono

Recent advances in scanning transmission electron and scanning tunneling microscopies allow researchers to measure materials structural and electronic properties, such as atomic displacements and charge density modulations, at an Angstrom…

Electrochemistry is the underlying mechanism in a variety of energy conversion and storage systems, and it is well known that the composition, structure, and properties of electrochemical materials near active interfaces often deviates…

Materials Science · Physics 2018-02-07 Ahmad Eshghinejad , Ehsan Nasr Esfahani , Chihou Lei , Jiangyu Li

Mechanical strain is a powerful technique for tuning electronic structure and interactions in quantum materials. In a system with tetragonal symmetry, a tunable uniaxial in-plane strain can be used to probe nematic correlations in the same…

By stacking various two-dimensional (2D) atomic crystals [1] on top of each other, it is possible to create multilayer heterostructures and devices with designed electronic properties [2-5]. However, various adsorbates become trapped…

Mesoscale and Nanoscale Physics · Physics 2012-09-06 S. J. Haigh , A. Gholinia , R. Jalil , S. Romani , L. Britnell , D. C. Elias , K. S. Novoselov , L. A. Ponomarenko , A. K. Geim , R. Gorbachev

We discuss observations of InN nanowires (NWs) by plan-view high-resolution transmission electron microscopy (TEM). The main difficulties arise from suitable methods available for plan-view specimen preparation. We explore different…

Materials Science · Physics 2014-09-30 E Luna , J Grandal , E Gallardo , J M Calleja , M A Sánchez-García , E Calleja , A Trampert

The knowledge of the local electronic structure of heterogeneous solid materials is crucial for understanding their electronic, magnetic, transport, optical, and other properties. VASP, one of the mostly used packages for density-functional…

Materials Science · Physics 2022-05-18 Lucas Lodeiro , Tomáš Rauch

Over the last decade, scanning transmission electron microscopy (STEM) has emerged as a powerful tool for probing atomic structures of complex materials with picometer precision, opening the pathway toward exploring ferroelectric,…

Data Analysis, Statistics and Probability · Physics 2021-12-23 Ayana Ghosh , Christopher T. Nelson , Mark Oxley , Xiaohang Zhang , Maxim Ziatdinov , Ichiro Takeuchi , Sergei V. Kalinin

Analysis of nanoscale short-range chemical and/or structural order via (scanning) transmission electron microscopy (S/TEM) imaging is fundamentally limited by projection of the three dimensional sample, which averages informational along…

Materials Science · Physics 2022-08-25 Michael Xu , Abinash Kumar , James M. LeBeau

Hexagonal FeN monolayers on Cu(001) show a stripe pattern composed of dark and bright stripes as observed recently by scanning tunneling microscopy (STM). Here a harmonic mesh model is proposed to interpret those results. It uses a planar…

Materials Science · Physics 2020-12-01 Wolfgang Kappus

We recast the Howie-Whelan equations for generating simulated transmission electron microscope (TEM) images, replacing the dependence on local atomic displacements with atomic positions only. This allows very rapid computation of simulated…

Materials Science · Physics 2024-09-04 D. R. Mason , M. Boleininger , J. Haley , E. Prestat , G. He , F. Hofmann , S. L. Dudarev

Scanning Electron Microscopes (SEMs) are widely renowned for their ability to analyze the surface structures of microscopic objects, offering the capability to capture highly detailed, yet only grayscale, images. To create more expressive…

Computer Vision and Pattern Recognition · Computer Science 2024-10-30 Takuma Nishimura , Andreea Dogaru , Martin Oeggerli , Bernhard Egger

In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…

Computer Vision and Pattern Recognition · Computer Science 2025-03-19 Ganesh Raghavendran , Bing Han , Fortune Adekogbe , Shuang Bai , Bingyu Lu , William Wu , Minghao Zhang , Ying Shirley Meng

Automated analysis of high-resolution transmission electron microscopy (HRTEM) images is increasingly essential for advancing research in organic electronics, where precise characterization of nanoscale crystal structures is crucial for…

Computational Engineering, Finance, and Science · Computer Science 2024-12-25 Dhruv Gamdha , Ryan Fair , Adarsh Krishnamurthy , Enrique Gomez , Baskar Ganapathysubramanian

Electron tomography has become a commonly used tool to investigate the three-dimensional (3D) structure of nanomaterials, including colloidal nanoparticle assemblies. However, electron microscopy is typically carried out under high vacuum…

Trained neural networks are promising tools to analyze the ever-increasing amount of scientific image data, but it is unclear how to best customize these networks for the unique features in transmission electron micrographs. Here, we…

Materials Science · Physics 2022-11-23 Katherine Sytwu , Catherine Groschner , Mary C. Scott

Thermal transport in nanostructures plays a critical role in modern technologies. As devices shrink, techniques that can measure thermal properties at nanometer and nanosecond scales are increasingly needed to capture transient,…

Van der Waals materials composed of stacks of individual atomic layers have attracted considerable attention due to their exotic electronic properties that can be altered by, for example, manipulating the twist angle of bilayer materials or…

Materials Science · Physics 2021-05-14 Michael J Zachman , Jacob Madsen , Xiang Zhang , Pulickel M Ajayan , Toma Susi , Miaofang Chi