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On- and off-axis electron energy loss spectroscopy (EELS) is a powerful method for probing local electronic structure on single atom level. However, many materials undergo electron-beam induced transformation during the scanning…

Materials Science · Physics 2023-10-23 Kevin M. Roccapriore , Riccardo Torsi , Joshua Robinson , Sergei V. Kalinin , Maxim Ziatdinov

Purpose/Objectives: To develop and assess a strategy of using deep learning (DL) to generate virtual monochromatic CT (VMCT) images from a single-energy CT (SECT) scan. Materials/Methods: The proposed data-driven VMCT imaging consists of…

Medical Physics · Physics 2020-05-21 Wei Zhao , Tianling Lyu , Yang Chen , Lei Xing

Medical images usually suffer from image degradation in clinical practice, leading to decreased performance of deep learning-based models. To resolve this problem, most previous works have focused on filtering out degradation-causing…

Image and Video Processing · Electrical Eng. & Systems 2023-04-17 Haoxuan Che , Siyu Chen , Hao Chen

In industry, defect detection is crucial for quality control. Non-destructive testing (NDT) methods are preferred as they do not influence the functionality of the object while inspecting. Automated data evaluation for automated defect…

Computer Vision and Pattern Recognition · Computer Science 2026-02-06 Natascha Jeziorski , Petra Gospodnetić , Claudia Redenbach

Building detection from satellite multispectral imagery data is being a fundamental but a challenging problem mainly because it requires correct recovery of building footprints from high-resolution images. In this work, we propose a deep…

Computer Vision and Pattern Recognition · Computer Science 2020-10-12 Geesara Prathap , Ilya Afanasyev

Unsupervised anomaly detection (UAD) is a key ingredient of automated visual inspection in modern manufacturing. The reconstruction-based methods appeal because they have basic architectural design and they process data quickly but they…

Computer Vision and Pattern Recognition · Computer Science 2026-02-03 Dmytro Filatov , Valentyn Fedorov , Vira Filatova , Andrii Zelenchuk

Modification of physical properties of materials and design of materials with on-demand characteristics is at the heart of modern technology. Rare application relies on pure materials--most devices and technologies require careful design of…

Deep learning has been successfully applied to low-dose CT (LDCT) image denoising for reducing potential radiation risk. However, the widely reported supervised LDCT denoising networks require a training set of paired images, which is…

Machine Learning · Computer Science 2023-02-09 Yuhui Ruan , Qiao Yuan , Chuang Niu , Chen Li , Yudong Yao , Ge Wang , Yueyang Teng

Segmentation-based, two-stage neural network has shown excellent results in the surface defect detection, enabling the network to learn from a relatively small number of samples. In this work, we introduce end-to-end training of the…

Computer Vision and Pattern Recognition · Computer Science 2020-07-16 Jakob Božič , Domen Tabernik , Danijel Skočaj

Medical image denoising is considered among the most challenging vision tasks. Despite the real-world implications, existing denoising methods have notable drawbacks as they often generate visual artifacts when applied to heterogeneous…

Image and Video Processing · Electrical Eng. & Systems 2025-03-11 S M A Sharif , Rizwan Ali Naqvi , Woong-Kee Loh

We present helium atom micro-diffraction as an ideal technique for characterization of 2D materials due to its ultimate surface sensitivity combined with sub-micron spatial resolution. Thermal energy neutral helium scatters from the valence…

In the photolithographic process vital to semiconductor manufacturing, various types of defects appear during EUV pattering. Due to ever-shrinking pattern size, these defects are extremely small and cause false or missed detection during…

Utility companies increasingly rely on drone imagery for post-event and routine inspection, but training accurate defect-type classifiers remains difficult because defect examples are rare and inspection datasets are often limited or…

Computer Vision and Pattern Recognition · Computer Science 2026-03-10 Xuesong Wang , Caisheng Wang

Dual energy computed tomography (DECT) has become of particular interest in clinic recent years. The DECT scan comprises two images, corresponding to two photon attenuation coefficients maps of the objects. Meanwhile, the DECT images are…

Medical Physics · Physics 2017-11-21 Sui Li , Yongbo Wang , Yuting Liao , Ji He , Dong Zeng , Zhaoying Bian , Jianhua Ma

This study introduces a novel self-supervised learning approach for volumetric segmentation of defect indications captured by phased array ultrasonic testing data from Carbon Fiber Reinforced Polymers (CFRPs). By employing this…

Signal Processing · Electrical Eng. & Systems 2024-11-13 Shaun McKnight , Vedran Tunukovic , Amine Hifi , Gareth Pierce , Ehsan Mohseni , Charles MacLeod , Tom OHare

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

Computer Vision and Pattern Recognition · Computer Science 2024-07-18 Amit Prasad , Bappaditya Dey , Victor Blanco , Sandip Halder

By acquiring two sets of tomographic measurements at distinct X-ray spectra, the dual-energy CT (DECT) enables quantitative material-specific imaging. However, the conventionally decomposed material basis images may encounter severe image…

Visual steel surface defect detection is an essential step in steel sheet manufacturing. Several machine learning-based automated visual inspection (AVI) methods have been studied in recent years. However, most steel manufacturing…

Computer Vision and Pattern Recognition · Computer Science 2021-01-19 Praveen Damacharla , Achuth Rao M. V. , Jordan Ringenberg , Ahmad Y Javaid

Machine learning offers attractive solutions to challenging image processing tasks. Tedious development and parametrization of algorithmic solutions can be replaced by training a convolutional neural network or a random forest with a high…

Computer Vision and Pattern Recognition · Computer Science 2025-01-31 Katja Schladitz , Claudia Redenbach , Tin Barisin , Christian Jung , Natascha Jeziorski , Lovro Bosnar , Juraj Fulir , Petra Gospodnetić

The development of X-Ray microscopy (XRM) technology has enabled non-destructive inspection of semiconductor structures for defect identification. Deep learning is widely used as the state-of-the-art approach to perform visual analysis…

Computer Vision and Pattern Recognition · Computer Science 2025-07-24 Lile Cai , Ramanpreet Singh Pahwa , Xun Xu , Jie Wang , Richard Chang , Lining Zhang , Chuan-Sheng Foo
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