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Building a scalable machine learning system for unsupervised anomaly detection via representation learning is highly desirable. One of the prevalent methods is using a reconstruction error from variational autoencoder (VAE) via maximizing…

Machine Learning · Computer Science 2020-05-08 Seonho Park , George Adosoglou , Panos M. Pardalos

The growing availability of the data collected from smart manufacturing is changing the paradigms of production monitoring and control. The increasing complexity and content of the wafer manufacturing process in addition to the time-varying…

Machine Learning · Computer Science 2021-11-16 Xiaoye Qian , Chao Zhang , Jaswanth Yella , Yu Huang , Ming-Chun Huang , Sthitie Bom

In recent years, Artificial Neural Networks (ANNs) have been introduced in Structural Health Monitoring (SHM) systems. A semi-supervised method with a data-driven approach allows the ANN training on data acquired from an undamaged…

Machine Learning · Computer Science 2023-08-15 Andrea Pollastro , Giusiana Testa , Antonio Bilotta , Roberto Prevete

Deep generative models have been demonstrated as problematic in the unsupervised out-of-distribution (OOD) detection task, where they tend to assign higher likelihoods to OOD samples. Previous studies on this issue are usually not…

Machine Learning · Computer Science 2024-01-04 Zezhen Zeng , Bin Liu

Surface defect detection plays a critical role in industrial quality inspection. Recent advances in artificial intelligence have significantly enhanced the automation level of detection processes. However, conventional semantic segmentation…

Computer Vision and Pattern Recognition · Computer Science 2025-07-01 Hang-Cheng Dong , Lu Zou , Bingguo Liu , Dong Ye , Guodong Liu

Deep learning-based methods have become the de facto standard for industrial defect detection. However, their data-hungry nature and inherent "black-box" characteristics often lead to performance bottlenecks and limited trustworthiness in…

Computer Vision and Pattern Recognition · Computer Science 2026-05-19 Hang-Cheng Dong , Guodong Liu , Dong Ye , Bingguo Liu

Semiconductor manufacturing is a complex, multistage process. Automated visual inspection of Scanning Electron Microscope (SEM) images is indispensable for minimizing equipment downtime and containing costs. Most previous research considers…

Computer Vision and Pattern Recognition · Computer Science 2025-05-13 Manuel Barusco , Francesco Borsatti , Youssef Ben Khalifa , Davide Dalle Pezze , Gian Antonio Susto

Deep learning methodologies have been employed in several different fields, with an outstanding success in image recognition applications, such as material quality control, medical imaging, autonomous driving, etc. Deep learning models rely…

Computer Vision and Pattern Recognition · Computer Science 2022-03-11 Saul Calderon-Ramirez , Shengxiang Yang , David Elizondo

Deep learning has enabled realistic face manipulation (i.e., deepfake), which poses significant concerns over the integrity of the media in circulation. Most existing deep learning techniques for deepfake detection can achieve promising…

Computer Vision and Pattern Recognition · Computer Science 2022-12-26 Bosheng Yan , Chang-Tsun Li , Xuequan Lu

Semi-supervised learning is sought for leveraging the unlabelled data when labelled data is difficult or expensive to acquire. Deep generative models (e.g., Variational Autoencoder (VAE)) and semisupervised Generative Adversarial Networks…

Machine Learning · Computer Science 2019-05-09 Xiang Zhang , Lina Yao , Feng Yuan

We present an automated vision-based system for defect detection and classification of laser power meter sensor coatings. Our approach addresses the critical challenge of identifying coating defects such as thermal damage and scratches that…

Computer Vision and Pattern Recognition · Computer Science 2025-09-26 Dongqi Zheng , Wenjin Fu , Guangzong Chen

Online reviews are an important source of feedback for understanding customers. In this study, we follow novel approaches that target this absence of actionable insights by classifying reviews as defect reports and requests for improvement.…

Computation and Language · Computer Science 2020-04-21 Gino V. H. Mangnoesing , Maria Mihaela Trusca , Flavius Frasincar

Semiconductor manufacturing is on the cusp of a revolution: the Internet of Things (IoT). With IoT we can connect all the equipment and feed information back to the factory so that quality issues can be detected. In this situation, more and…

Computer Vision and Pattern Recognition · Computer Science 2023-04-25 YuanFu Yang , Min Sun

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection…

Computer Vision and Pattern Recognition · Computer Science 2025-11-26 Amirhossein Khadivi Noghredeh , Abdollah Safari , Fatemeh Ziaeetabar , Firoozeh Haghighi

In this paper we present a new approach to solve semi-supervised classification tasks for biomedical applications, involving a supervised autoencoder network. We create a network architecture that encodes labels into the latent space of an…

Machine Learning · Computer Science 2022-08-24 Cyprien Gille , Frederic Guyard , Michel Barlaud

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

Computer Vision and Pattern Recognition · Computer Science 2024-07-16 Bappaditya Dey , Vic De Ridder , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge

Although semi-supervised variational autoencoder (SemiVAE) works in image classification task, it fails in text classification task if using vanilla LSTM as its decoder. From a perspective of reinforcement learning, it is verified that the…

Computation and Language · Computer Science 2016-11-28 Weidi Xu , Haoze Sun , Chao Deng , Ying Tan

Recently, fault diagnosis methods for marine machinery systems based on deep learning models have attracted considerable attention in the shipping industry. Most existing studies assume fault classes are consistent and known between the…

Artificial Intelligence · Computer Science 2025-11-04 Chuyue Lou , M. Amine Atoui

Classical methods for model order selection often fail in scenarios with low SNR or few snapshots. Deep learning-based methods are promising alternatives for such challenging situations as they compensate lack of information in the…

Signal Processing · Electrical Eng. & Systems 2023-12-07 Michael Baur , Franz Weißer , Benedikt Böck , Wolfgang Utschick

Efficient automated print defect mapping is valuable to the printing industry since such defects directly influence customer-perceived printer quality and manually mapping them is cost-ineffective. Conventional methods consist of…

Computer Vision and Pattern Recognition · Computer Science 2020-01-29 Augusto C. Valente , Cristina Wada , Deangela Neves , Deangeli Neves , Fábio V. M. Perez , Guilherme A. S. Megeto , Marcos H. Cascone , Otavio Gomes , Qian Lin