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Deep learning (DL) methods have shown remarkable successes in medical image segmentation, often using large amounts of annotated data for model training. However, acquiring a large number of diverse labeled 3D medical image datasets is…

Computer Vision and Pattern Recognition · Computer Science 2024-11-22 Delin An , Pengfei Gu , Milan Sonka , Chaoli Wang , Danny Z. Chen

This paper addresses the problem of defect segmentation in semiconductor manufacturing. The input of our segmentation is a scanning-electron-microscopy (SEM) image of the candidate defect region. We train a U-net shape network to segment…

Computer Vision and Pattern Recognition · Computer Science 2022-10-20 Nati Ofir , Ran Yacobi , Omer Granoviter , Boris Levant , Ore Shtalrid

We consider a resource-constrained Edge Device (ED), such as an IoT sensor or a microcontroller unit, embedded with a small-size ML model (S-ML) for a generic classification application and an Edge Server (ES) that hosts a large-size ML…

Machine Learning · Computer Science 2024-10-03 Vishnu Narayanan Moothedath , Jaya Prakash Champati , James Gross

Hyperspectral imaging (HSI) shows great promise for surgical applications, offering detailed insights into biological tissue differences beyond what the naked eye can perceive. Refined labelling efforts are underway to train vision systems…

Computer Vision and Pattern Recognition · Computer Science 2025-10-07 Junwen Wang , Oscar Maccormac , William Rochford , Aaron Kujawa , Jonathan Shapey , Tom Vercauteren

Real-time gas classification is an essential issue and challenge in applications such as food and beverage quality control, accident prevention in industrial environments, for instance. In recent years, the Deep Learning (DL) models have…

Signal Processing · Electrical Eng. & Systems 2020-10-05 Juan C. Rodriguez Gamboa , Adenilton J. da Silva , Ismael C. S. Araujo , Eva Susana Albarracin E. , Cristhian M. Duran A

Hyperspectral image fusion (HIF) is critical to a wide range of applications in remote sensing and many computer vision applications. Most traditional HIF methods assume that the observation model is predefined or known. However, in real…

Computer Vision and Pattern Recognition · Computer Science 2021-04-01 Wu Wang , Yue Huang , Xinhao Ding

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many…

Image and Video Processing · Electrical Eng. & Systems 2021-03-26 Qianru Zhang , Meng Zhang , Chinthaka Gamanayake , Chau Yuen , Zehao Geng , Hirunima Jayasekara , Xuewen Zhang , Chia-wei Woo , Jenny Low , Xiang Liu

Single particle imaging (SPI) at X-ray free electron lasers (XFELs) is a technique to determine the 3D structure of nanoscale objects like biomolecules from a large number of diffraction patterns of copies of these objects in random…

Image and Video Processing · Electrical Eng. & Systems 2022-10-20 Abhishek Mall , Kartik Ayyer

Surface defect detection of steel, especially the recognition of multi-scale defects, has always been a major challenge in industrial manufacturing. Steel surfaces not only have defects of various sizes and shapes, which limit the accuracy…

Image and Video Processing · Electrical Eng. & Systems 2025-08-12 Cong Chen , Ming Chen , Hoileong Lee , Yan Li , Jiyang Yu

Ensuring the safety of surgical instruments requires reliable detection of visual defects. However, manual inspection is prone to error, and existing automated defect detection methods, typically trained on natural/industrial images, fail…

Computer Vision and Pattern Recognition · Computer Science 2025-09-29 Joseph Huang , Yichi Zhang , Jingxi Yu , Wei Chen , Seunghyun Hwang , Qiang Qiu , Amy R. Reibman , Edward J. Delp , Fengqing Zhu

The efficacy of Artificial Intelligence (AI) in micro/nano manufacturing is fundamentally constrained by the scarcity of high-quality and physically grounded training data for defect inspection. Lithography defect data from semiconductor…

Computer Vision and Pattern Recognition · Computer Science 2025-12-11 Yuehua Hu , Jiyeong Kong , Dong-yeol Shin , Jaekyun Kim , Kyung-Tae Kang

Hyperspectral imaging (HSI) provides rich spectral information for precise material classification and analysis; however, its high dimensionality introduces a computational burden and redundancy, making dimensionality reduction essential.…

Artificial Intelligence · Computer Science 2025-09-03 Salma Haidar , José Oramas

Embedding image features into a binary Hamming space can improve both the speed and accuracy of large-scale query-by-example image retrieval systems. Supervised hashing aims to map the original features to compact binary codes in a manner…

Machine Learning · Computer Science 2016-11-17 Guosheng Lin , Chunhua Shen , Anton van den Hengel

Transformers trained with self-supervised learning using self-distillation loss (DINO) have been shown to produce attention maps that highlight salient foreground objects. In this paper, we demonstrate a graph-based approach that uses the…

Computer Vision and Pattern Recognition · Computer Science 2022-03-25 Yangtao Wang , Xi Shen , Shell Hu , Yuan Yuan , James Crowley , Dominique Vaufreydaz

Vision-based industrial inspection (VII) aims to locate defects quickly and accurately. Supervised learning under a close-set setting and industrial anomaly detection, as two common paradigms in VII, face different problems in practical…

Computer Vision and Pattern Recognition · Computer Science 2024-08-01 Zilong Zhang , Chang Niu , Zhibin Zhao , Xingwu Zhang , Xuefeng Chen

Deep convolutional neural networks are widely used in medical image segmentation but require many labeled images for training. Annotating three-dimensional medical images is a time-consuming and costly process. To overcome this limitation,…

Computer Vision and Pattern Recognition · Computer Science 2024-07-08 Weiyi Xie , Nathalie Willems , Nikolas Lessmann , Tom Gibbons , Daniele De Massari

In computer chip manufacturing, the study of etch patterns on silicon wafers, or metrology, occurs on the nano-scale and is therefore subject to large variation from small, yet significant, perturbations in the manufacturing environment. An…

Machine Learning · Computer Science 2019-10-23 Jack Kenney , John Valcore , Scott Riggs , Edward Rietman

Defective surgical instruments pose serious risks to sterility, mechanical integrity, and patient safety, increasing the likelihood of surgical complications. However, quality control in surgical instrument manufacturing often relies on…

Computer Vision and Pattern Recognition · Computer Science 2025-10-17 Qurrat Ul Ain , Atif Aftab Ahmed Jilani , Zunaira Shafqat , Nigar Azhar Butt

This proposes a novel ensemble deep learning-based model to accurately classify, detect and localize different defect categories for aggressive pitches and thin resists (High NA applications).In particular, we train RetinaNet models using…

Image and Video Processing · Electrical Eng. & Systems 2022-06-29 Bappaditya Deya , Dipam Goswamif , Sandip Haldera , Kasem Khalilb , Philippe Leraya , Magdy A. Bayoumi

Despite the remarkable performance of supervised medical image segmentation models, relying on a large amount of labeled data is impractical in real-world situations. Semi-supervised learning approaches aim to alleviate this challenge using…

Computer Vision and Pattern Recognition · Computer Science 2025-09-17 Yunyao Lu , Yihang Wu , Ahmad Chaddad , Tareef Daqqaq , Reem Kateb
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