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The classical method of determining the atomic structure of complex molecules by analyzing diffraction patterns is currently undergoing drastic developments. Modern techniques for producing extremely bright and coherent X-ray lasers allow a…

Biomolecules · Quantitative Biology 2015-10-12 Tomas Ekeberg , Stefan Engblom , Jing Liu

Accurately measuring the size, morphology, and structure of nanoparticles is very important, because they are strongly dependent on their properties for many applications. In this paper, we present a deep-learning based method for…

Materials Science · Physics 2022-07-29 Claudius Zelenka , Marius Kamp , Kolja Strohm , Akram Kadoura , Jacob Johny , Reinhard Koch , Lorenz Kienle

We report a theoretical analysis showing that Rayleigh scattering could be used to monitor the growth of nanoparticles under arc discharge conditions. We compute the Rayleigh scattering cross sections of the nanoparticles by combining light…

Chemical Physics · Physics 2017-03-01 Biswajit Santra , Mikhail N. Shneider , Roberto Car

We demonstrate a smart laser-diffraction analysis technique for particle mixture identification. We retrieve information about the size, geometry, and ratio concentration of two-component heterogeneous particle mixtures with an efficiency…

Image and Video Processing · Electrical Eng. & Systems 2022-02-03 Arturo Villegas , Mario A. Quiroz-Juarez , Alfred U'Ren , Juan P. Torres , Roberto de J. Leon-Montiel

To what extent can particulate random media be characterised using direct wave backscattering from a single receiver/source? Here, in a two dimensional setting, we show using a machine learning approach that both the particle radius and…

Computational Physics · Physics 2018-08-15 Artur L. Gower , Robert M. Gower , Jonathan Deakin , William J. Parnell , I. David Abrahams

Our visual perception of our surroundings is ultimately limited by the diffraction limit, which stipulates that optical information smaller than roughly half the illumination wavelength is not retrievable. Over the past decades, many…

Unprecedented atomic-scale measurement resolution has recently been demonstrated in single-shot optical localization metrology based on deep-learning analyses of diffraction patterns of topologically structured light scattered from objects.…

Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…

When subjected to monochromatic incident light a nanoparticle will emit light which then interferes with the incident beam. With sufficient contrast and sufficiently close to the particle this interference pattern may be recorded with a…

Optics · Physics 2019-02-26 T. G. Myers , H. Ribera , W. S. Bacsa

Some new unusual physical phenomena and effects associated with dielectric mesoscale particles with Mie size parameter near 10 were studied and have been discovered during the last decade. In this paper, we propose nanoholes structured…

Optics · Physics 2023-05-16 Oleg V. Minin , Song Zhou , Yinghui Cao , Pavel Baranov , Igor V. Minin

In this work we report a theoretical study of the lateral resolution granted by a simple glass microcylinder. In this 2D study, we had in mind the 3D analogue -- a microsphere whose ability to form a deeply subwavelength and strongly…

Optics · Physics 2022-03-03 R. Heydarian , C. Simovski

Intense short-wavelength pulses from free-electron lasers and high-harmonic-generation sources enable diffractive imaging of individual nano-sized objects with a single x-ray laser shot. The enormous data sets with up to several million…

High-precision measurements implemented by means of light is desired in all fields of science. However, light is a wave and Rayleigh criterion gives us a diffraction limitation in classical optics which restricts to get arbitrary high…

Quantum Physics · Physics 2015-01-26 Ruifeng Liu , Pei Zhang , Yu Zhou , Hong Gao , Fuli Li

This article explains an optimization-based approach for counting and localizing stars within a small cluster, based on photon counts in a focal plane array. The array need not be arranged in any particular way, and relatively small numbers…

Instrumentation and Methods for Astrophysics · Physics 2022-04-13 Michael Robinson , Christopher Capraro

Locating the center of convex objects is important in both image processing and unsupervised machine learning/data clustering fields. The automated analysis of biological images uses both of these fields for locating cell nuclei and for…

Computer Vision and Pattern Recognition · Computer Science 2018-04-12 James Kapaldo , Xu Han , Domingo Mery

Nanoparticles occur in various environments as a consequence of man-made processes, which raises concerns about their impact on the environment and human health. To allow for proper risk assessment, a precise and statistically relevant…

We define disentanglement as how far class-different data points from each other are, relative to the distances among class-similar data points. When maximizing disentanglement during representation learning, we obtain a transformed feature…

Machine Learning · Computer Science 2021-08-02 Abien Fred Agarap

A multilayered particle is illuminated by plane acoustic or electromagnetic waves of one or several frequencies. We consider the inverse scattering problem for the identification of the layers and of the refraction coefficients of the…

Mathematical Physics · Physics 2016-09-07 Semion Gutman

The speckle pattern produced when a laser is scattered by a disordered medium has recently been shown to give a surprisingly accurate or broadband measurement of wavelength. Here it is shown that deep learning is an ideal approach to…

Optics · Physics 2020-06-22 Roopam K. Gupta , Graham D. Bruce , Simon J. Powis , Kishan Dholakia

Accurately tracking particles and determining their coordinate along the optical axis is a major challenge in optical microscopy, especially when extremely high precision is needed. In this study, we introduce a deep learning approach using…

Image and Video Processing · Electrical Eng. & Systems 2025-08-05 Andrey Alexandrov , Giovanni Acampora , Giovanni De Lellis , Antonia Di Crescenzo , Chiara Errico , Daria Morozova , Valeri Tioukov , Autilia Vittiello
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