Related papers: Convolutional Neural Networks for Automatic Detect…
A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…
Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…
It is well known that electroencephalograms (EEGs) often contain artifacts due to muscle activity, eye blinks, and various other causes. Detecting such artifacts is an essential first step toward a correct interpretation of EEGs. Although…
Viruses are submicroscopic agents that can infect all kinds of lifeforms and use their hosts' living cells to replicate themselves. Despite having some of the simplest genetic structures among all living beings, viruses are highly…
Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…
The rapid progress of generative models has intensified the need for reliable and robust detection under real-world conditions. However, existing detectors often overfit to generator-specific artifacts and remain highly sensitive to…
State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…
Quality control of apparel items is mandatory in modern textile industry, as consumer's awareness and expectations about the highest possible standard is constantly increasing in favor of sustainable and ethical textile products. Such a…
Soot is an important material with impacts that depend on particle morphology. Transmission electron microscopy (TEM) represents one of the most direct routes to qualitatively assess particle characteristics. However, producing quantitative…
Endoscopy is a routine imaging technique used for both diagnosis and minimally invasive surgical treatment. Artifacts such as motion blur, bubbles, specular reflections, floating objects and pixel saturation impede the visual interpretation…
Defect detection is a basic and essential task in automatic parts production, especially for automotive engine precision parts. In this paper, we propose a new idea to construct a deep convolutional network combining related knowledge of…
Surgical tool segmentation in endoscopic images is an important problem: it is a crucial step towards full instrument pose estimation and it is used for integration of pre- and intra-operative images into the endoscopic view. While many…
Recording atomic-resolution transmission electron microscopy (TEM) images is becoming increasingly routine. A new bottleneck is then analyzing this information, which often involves time-consuming manual structural identification. We have…
Electroencephalography (EEG) measures the electrical brain activity in real-time by using sensors placed on the scalp. Artifacts, due to eye movements and blink, muscular/cardiac activity and generic electrical disturbances, have to be…
Automatic defect detection is a challenging task because of the variability in texture and type of fabric defects. An effective defect detection system enables manufacturers to improve the quality of processes and products. Automation…
In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…
Numerous image processing techniques (IPTs) have been employed to detect crack defects, offering an alternative to human-conducted onsite inspections. These IPTs manipulate images to extract defect features, particularly cracks in surfaces…
In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…
The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…
Scanning transmission electron microscopy (STEM) is now the primary tool for exploring functional materials on the atomic level. Often, features of interest are highly localized in specific regions in the material, such as ferroelectric…