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Related papers: Light-enhanced van der Waals force microscopy

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Apertureless scanning near-field optical microscopy (a-SNOM) is typically limited to ~10 nm resolution by the tip apex size. We demonstrate that ~1-nm resolution can be achieved under continuous-wave (CW) illumination by exploiting Fano…

Atomic force microscopy (AFM or SPM) imaging is one of the best matches with machine learning (ML) analysis among microscopy techniques. The digital format of AFM images allows for direct utilization in ML algorithms without the need for…

Biological Physics · Physics 2025-01-07 Igor Sokolov

Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general…

Mesoscale and Nanoscale Physics · Physics 2018-03-15 Zeno Schumacher , Andreas Spielhofer , Yoichi Miyahara , Peter Grutter

Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…

Materials Science · Physics 2015-06-25 Stephen Jesse , Arthur P. Baddorf , Sergei V. Kalinin

Factorization Machines (FMs) are a supervised learning approach that enhances the linear regression model by incorporating the second-order feature interactions. Despite effectiveness, FM can be hindered by its modelling of all feature…

Machine Learning · Computer Science 2017-08-17 Jun Xiao , Hao Ye , Xiangnan He , Hanwang Zhang , Fei Wu , Tat-Seng Chua

Antiferromagnetic (AFM) van der Waals (vdW) materials provide a novel platform for synthetic AFM spintronics, in which the spin-related functionalities are derived from manipulating spin configurations between the layers. Metallic vdW…

Feature detectors and descriptors are key low-level vision tools that many higher-level tasks build on. Unfortunately these fail in the presence of challenging light transport effects including partial occlusion, low contrast, and…

Computer Vision and Pattern Recognition · Computer Science 2019-01-15 Donald G. Dansereau , Bernd Girod , Gordon Wetzstein

We study the force of light on a two-level atom near an ultrathin optical fiber using the mode function method and the Green tensor technique. We show that the total force consists of the driving-field force, the spontaneous-emission recoil…

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…

Other Condensed Matter · Physics 2009-11-10 P. S. Fodor , H. Zhu , N. G. Patil , J. Levy

Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing…

Materials Science · Physics 2020-07-31 Boyuan Huang , Zhenghao Li , Jiangyu Li

Near-field scanning optical microscopy has been an indispensable tool for designing, characterizing and understanding the functionalities of diverse nanoscale photonic devices. As the advances in fabrication technology have driven the…

The magnetic properties of arrays of nanowires (NWs) and nanotubes (NTs), 150 nm in diameter, electrodeposited inside nanoporous polycarbonate membranes are investigated. The comparison of the nanoscopic magnetic force microscopy (MFM)…

Materials Science · Physics 2014-07-30 M. R. Tabasum , F. Zighem , J. De La Torre Medina , A. Encinas , L. Piraux , B. Nysten

Optical tweezers, with their high precision, dynamic control, and non-invasiveness, are increasingly important in scientific research and applications at the micro and nano scales. However, manipulation by optical tweezers is challenged by…

Microscopy is an essential tool in scientific research, enabling the visualization of structures at micro- and nanoscale resolutions. However, the field of microscopy often encounters limitations in field-of-view (FOV), restricting the…

Image and Video Processing · Electrical Eng. & Systems 2025-03-17 Huanhuan Zhao , Ruben Millan-Solsona , Marti Checa , Spenser R. Brown , Jennifer L. Morrell-Falvey , Liam Collins , Arpan Biswas

Delay-and-sum (DAS) algorithms are widely used for beamforming in linear array photoacoustic imaging systems and are characterized by fast execution. However, these algorithms suffer from various drawbacks like low resolution, low contrast,…

Medical Physics · Physics 2021-07-29 Souradip Paul , Subhamoy Mandal , Mayanglambam Suheshkumar Singh

Quantifying the nanomechanical properties of soft-matter using multi-frequency atomic force microscopy (AFM) is crucial for studying the performance of polymers, ultra-thin coatings, and biological systems. Such characterization processes…

Tip enhanced IR spectra and imaging have been widely used in cutting-edge studies for the in-depth understanding of the composition, structure and function of interfaces at the nanoscale. However, molecular monolayer sensitivity has only…

We show that for nanoparticles with giant polarizability $\alpha$ (a prominent example being the recently studied Na$_{14}$F$_{13}$ molecular clusters) van der Waals forces are significantly enhanced at interparticle distances shorter than…

Mesoscale and Nanoscale Physics · Physics 2016-03-01 K. Makhnovets , A. Kolezhuk

Taking advantages of ultra-narrow bandwidth and high noise rejection performance of the Faraday anomalous dispersion optical filter (FADOF), simultaneously with the coherent amplification of atomic stimulated emission, a stimulated…

Optics · Physics 2017-10-16 Duo Pan , Tiantian Shi , Bin Luo , Jingbiao Chen , Hong Guo

We present first-principles total-energy electronic-structure calculations that provide the microscopic mechanism of the Ag atom diffusion between the half unit cells (HUCs) on the Si(111)-(7x7) surface with and without the tip of the…

Materials Science · Physics 2017-02-08 Batnyam Enkhtaivan , Atsushi Oshiyama