Related papers: An analysis on improvement of x-ray diffractometer…
Information on the lattice parameter of single crystals with known crystallographic structure allows for estimations of sample quality and composition. In many cases it is suffcient to determine one lattice parameter or the lattice spacing…
Ga(In, Al)N alloys are used as an active layer or cladding layer in light emitting diodes and laser diodes. x-ray diffraction is extensively used to evaluate the crystalline quality, the chemical composition and the residual strain in…
X-ray diffraction was demonstrated from shock-compressed polycrystalline metal on nanosecond time scales. Laser ablation was used to induce shock waves in polycrystalline foils of Be, 25 to 125 microns thick. A second laser pulse was used…
A flexible apparatus for calibration of the absolute flux at the focal plane of the X-ray Source of a Powder Diffractometer, based on a fast scintillator counter, is presented. The measured fluxes, depending on the high voltage on the X-ray…
Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to…
X-ray polarimetry promises to give qualitatively new information about high-energy astrophysical sources, such as binary black hole systems, micro-quasars, active galactic nuclei, neutron stars, and gamma-ray bursts. We designed, built and…
Dynamically compressed materials in longitudinal waves are described by two physical models: hydrostatic pressure, with equal, normal, principal stresses or material uniaxially strained in the wave propagation direction. These models are…
A novel method and experimental configuration are proposed that allow the collection of high-quality X-ray absorption spectroscopy (XAS) data in transmission mode on a standard laboratory diffractometer. This configuration makes use of…
We devised and built a versatile facility for the calibration of the next generation X-ray polarimeters with unpolarized and polarized radiation. The former is produced at 5.9 keV by means of a Fe55 radioactive source or by X-ray tubes,…
The appraisal of metallic materials requires application of advanced characterisation techniques. In this paper, the use has been made of Scanning Electron Microscopy, Transmission Electron Microscopy, X-ray diffraction (XRD) and Energy…
Diffractive optical elements such as periodic gratings are fundamental devices in X-ray imaging - a technique that medical, material science and security scans rely upon. Fabrication of such structures with high aspect ratios at the…
Aluminum single crystals are tested using X-Ray Bragg diffraction, which may have applications in microscopy and electronics fabrication industry. Yet, their efficiency for x- ray beam diffraction depends on the accurate crystal…
X-ray characterisation methods have undoubtedly enabled cutting-edge advances in all aspects of materials research. Despite the enormous breadth of information that can be extracted from these techniques, the challenge of radiation-induced…
X-ray polarimetry has seen a growing interest in recent years. Improvements in detector technology and focusing X-ray optics now enable sensitive astrophysical X-ray polarization measurements. These measurements will provide new insights…
The functionality of materials is determined by their composition and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them. The characterisation of the material's…
We report on Monte Carlo studies of the hard X-ray polarimeter X-Calibur. The polarimeter will be used in the focal plane of a grazing incidence hard X-ray telescope. It combines a low-Z Compton scatterer with a high-Z Cadmium Zinc…
X-ray reflectometry (XRR) provides researchers and manufacturers with a non-destructive way to determine thickness, roughness, and density of thin films deposited on smooth substrates. Due to the nested nature of equations modeling this…
Monochromators and analyzers for X-rays of energy $>$ 5 keV are overwhelmingly made from silicon crystals, of which large specimens of high purity and low defect density are readily available. Germanium and diamond crystals are also…
AMORPH utilizes a new Bayesian statistical approach to interpreting X-ray diffraction results of samples with both crystalline and amorphous components. AMORPH fits X-ray diffraction patterns with a mixture of narrow and wide components,…
We consider geometry parameter estimation in industrial sawmill fan-beam X-ray tomography. In such industrial settings, scanners do not always allow identification of the location of the source-detector pair, which creates the issue of…