Related papers: X-ray dark-field via spectral propagation-based im…
Light-matter interaction is exploited in spectroscopic techniques to access information about molecular, atomic or nuclear constituents of the sample of interest. While scattered light carries both amplitude and phase information of the…
Most material discrimination in security inspections is based on dual-energy x-ray imaging, which enables the determination of a material's effective atomic number (Zeff) as well as electron density and its consequent classification as…
The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray…
Talbot-Lau X-ray phase-contrast imaging is a novel imaging modality, which provides not only an X-ray absorption image, but also additionally a differential phase image and a dark-field image. The dark-field image is related to small angle…
Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam…
X-ray single particle imaging involves the measurement of a large number of noisy diffraction patterns of isolated objects in random orientations. The missing information about these patterns is then computationally recovered in order to…
Achieving high spatial resolution is the goal of many imaging systems. Designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task in imaging system design. On the other hand,…
X-ray parametric down-conversion is a fundamental nonlinear effect that promises a wide range of possible applications. Nevertheless, it has been scarcely investigated and unequivocal evidence of the effect is still missing for certain…
When a macroscopic-sized non-crystalline sample is illuminated using coherent x-ray radiation, a bifurcation of photon energy flow may occur. The coarse-grained complex refractive index of the sample may be considered to attenuate and…
X-ray fluorescence holography (XFH) is a method for obtaining diffraction-limited images of the local atomic structure around a given type of emitter. The reconstructed wave-field represents a distorted image of the scatterer electron…
We previously demonstrated near-field speckle scanning based x-ray imaging to be an easy-to-implement phase sensing method capable of providing both high sensitivity and high resolution. Yet, this performance combination could only be…
Recently introduced angular-memory-effect based techniques enable non-invasive imaging of objects hidden behind thin scattering layers. However, both the speckle-correlation and the bispectrum analysis are based on the statistical average…
Paganin's method for image reconstruction in propagation-based phase-contrast X-ray imaging and tomography has enjoyed broad acceptance in recent years, with over one thousand publications citing its use. The present paper discusses…
The hyperspectral X-ray imaging has been long sought in various fields from material analysis to medical diagnosis. Here we propose a new semiconductor detector structure to realize energy-resolved imaging at potentially low cost. The…
In this paper, a new phase-retrieval algorithm from an X-ray schlieren image is proposed. The schlieren method allows phase-contrast imaging with an objective lens and a knife-edge filter placed at the back focal plane of the objective.…
X-ray single particle imaging (SPI) has offered the potential to visualize structures of biomolecules at near-atomic resolution. However, state-of-the-art structures at X-ray free electron lasers (XFELs) are limited to moderate resolution,…
A solution to the inversion problem of scattering would offer aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being…
Unresolved spatially-random microstructure, in an illuminated sample, can lead to position-dependent blur when an image of that sample is formed. For a small propagation distance, between the exit surface of the sample and the entrance…
Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an…
Speckle-based phase-contrast X-ray imaging (SB-PCXI) can reconstruct high-resolution images of weakly-attenuating materials that would otherwise be indistinguishable in conventional attenuation-based imaging. The experimental setup of…