Related papers: Iterative Phase Retrieval Algorithms for Scanning …
Multi-energy CT has long demonstrated its ability to enhance image quality with material decomposition. Yet, it has largely been limited to applications that already have high contrast. More recently, x-ray phase-contrast (XPC) imaging has…
High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…
Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…
In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan pattern in STEM imaging on the beam damage in a specific…
In order to efficiently image a non-absorbing sample (a phase object), dedicated phase contrast optics are required. Typically, these optics are designed with the assumption that the sample is weakly scattering, implying a linear relation…
Scanning transmission electron microscopy (STEM) is a powerful tool to reveal the morphologies and structures of materials, thereby attracting intensive interests from the scientific and industrial communities. The outstanding spatial…
Quantitative differential phase contrast imaging of materials in atomic-resolution scanning transmission electron microscopy using segmented detectors is limited by various factors, including coherent and incoherent aberrations, detector…
2D and 4D transverse phase-space of a low-energy ion-beam is measured with two of the most common emittance scanners. The article covers the description of the installation, the setup, the settings, the experiment and the benchmark of the…
Scanning Transmission Electron Microscopy (STEM) coupled with Electron Energy Loss Spectroscopy (EELS) presents a powerful platform for detailed material characterization via rich imaging and spectroscopic data. Modern electron microscopes…
Temperature-induced phase transition in BaTiO3 has been explored using the machine learning analysis of domain morphologies visualized via variable-temperature scanning transmission electron microscopy (STEM) imaging data. This approach is…
Detection of phase variations across optically transparent samples is often a difficult task. We propose and demonstrate a compact, lightweight and low cost quantitative phase contrast imager. Light diffracted from a pinhole is incident on…
Phase contrast techniques, such as differential interference contrast (DIC) microscopy, are widely used to provide morphological images of unstained biological samples. The trans-illumination geometry required for these techniques has…
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and…
Phase retrieval algorithms have become an important component in many modern computational imaging systems. For instance, in the context of ptychography and speckle correlation imaging, they enable imaging past the diffraction limit and…
Ptychography promises diffraction limited resolution without the need for high resolution lenses. To achieve high resolution one has to solve the phase problem for many partially overlapping frames. Here we review some of the existing…
Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo-3D topographic information. However, contrast…
Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent…
The Shear TEsting Programme (STEP) is a collaborative project to improve the accuracy and reliability of weak lensing measurement, in preparation for the next generation of wide-field surveys. We review sixteen current and emerging shear…
Characterisation of rare microstructural features in scanning electron microscopy (SEM) requires imaging large areas at high resolution. This leads to prohibitively long acquisition times. We present an open-source Python framework that…
The contemporary superconductive electronics is widely using planar circuits with micrometer-scale elements for a variety of applications. With the rise of complexity of a circuit and increased number of its components, a simple impedance…