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The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…

Instrumentation and Detectors · Physics 2020-08-06 Magnus Nord , Robert W. H. Webster , Kirsty A. Paton , Stephen McVitie , Damien McGrouther , Ian MacLaren , Gary W. Paterson

Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…

Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the…

Fourier Ptychography is a recently proposed imaging technique that yields high-resolution images by computationally transcending the diffraction blur of an optical system. At the crux of this method is the phase retrieval algorithm, which…

Computer Vision and Pattern Recognition · Computer Science 2018-05-10 Lokesh Boominathan , Mayug Maniparambil , Honey Gupta , Rahul Baburajan , Kaushik Mitra

The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to…

Materials Science · Physics 2021-01-19 Yu-Tsun Shao , Renliang Yuan , Haw-Wen Hsiao , Qun Yang , Yang Hu , Jian-Min Zuo

Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…

Materials Science · Physics 2024-06-04 Jiake Wei , Zhangze Xu , Wenjie Shen , Bin Feng , Ryo Ishikawa , Naoya Shibata , Yuichi Ikuhara , Xuedong Bai

Determining the phase of a wave from intensity measurements has many applications in fields such as electron microscopy, visible light optics, and medical imaging. Propagation based phase retrieval, where the phase is obtained from…

Image and Video Processing · Electrical Eng. & Systems 2018-04-10 Zachary David Cleary Kemp

In phase retrieval, the goal is to recover a complex signal from the magnitude of its linear measurements. While many well-known algorithms guarantee deterministic recovery of the unknown signal using i.i.d. random measurement matrices,…

Information Theory · Computer Science 2017-03-24 Boshra Rajaei , Sylvain Gigan , Florent Krzakala , Laurent Daudet

New lensless diffractive X-ray technic for micro-scale imaging of biological tissue is based on quantitative phase retrieval schemes. By incorporating refraction, this method yields improved contrast compared to purely absorption-based…

Numerical Analysis · Mathematics 2018-03-28 Victor Palamodov

Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or…

Instrumentation and Detectors · Physics 2026-04-23 Matthew Mosse , Jonathan J. P. Peters , Eoin Moynihan , James A. Gott , Ana M. Sanchez , Michele Conroy , Lewys Jones

This review article provides a contemporary overview of phase retrieval in optical imaging, linking the relevant optical physics to the information processing methods and algorithms. Its purpose is to describe the current state of the art…

Information Theory · Computer Science 2014-03-03 Yoav Shechtman , Yonina C. Eldar , Oren Cohen , Henry N. Chapman , Jianwei Miao , Mordechai Segev

Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisition of conventional electron tomography tilt series can…

Materials Science · Physics 2020-10-01 Hans Vanrompay , Alexander Skorikov , Eva Bladt , Armand Béché , Bert Freitag , Jo Verbeeck , Sara Bals

The evolution of synchrotrons towards higher brilliance beams has increased the possible sample-to-detector propagation distances for which the source confusion circle does not lead to geometrical blurring. This makes it possible to push…

Ptychography is a computational method of microscopy that recovers high-resolution transmission images of samples from a series of diffraction patterns. While conventional phase retrieval algorithms can iteratively recover the images, they…

Image and Video Processing · Electrical Eng. & Systems 2024-10-24 Ryuma Nakahata , Shehtab Zaman , Mingyuan Zhang , Fake Lu , Kenneth Chiu

Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data…

Computer Vision and Pattern Recognition · Computer Science 2021-08-24 Josh Kacher , Yao Xie , Sven P. Voigt , Shixiang Zhu , Henry Yuchi , Jordan Key , Surya R. Kalidindi

Signal recovery from nonlinear measurements involves solving an iterative optimization problem. In this paper, we present a framework to optimize the sensing parameters to improve the quality of the signal recovered by the given iterative…

Image and Video Processing · Electrical Eng. & Systems 2020-06-09 Zikui Cai , Rakib Hyder , M. Salman Asif

In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterisation of a material's functional properties using in-situ experiments are becoming more widely available. As the practicable…

Materials Science · Physics 2024-09-20 Julie Marie Bekkevold , Jonathan J. P. Peters , Ryo Ishikawa , Naoya Shibata , Lewys Jones

The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan…

Materials Science · Physics 2021-08-11 Philipp M. Pelz , Ian Johnson , Colin Ophus , Peter Ercius , Mary C. Scott

The mutual intensity and its equivalent phase-space representations quantify an optical field's state of coherence and are important tools in the study of light propagation and dynamics, but they can only be estimated indirectly from…

Optics · Physics 2017-11-16 Chenglong Bao , George Barbastathis , Hui Ji , Zuowei Shen , Zhengyun Zhang

The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However,…

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