Related papers: Towards 3D Magnetic Force Microscopy
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
We use a scanning nanometer-scale superconducting quantum interference device to map the stray magnetic field produced by individual ferromagnetic nanotubes (FNTs) as a function of applied magnetic field. The images are taken as each FNT is…
An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The…
In this work we introduce a new method of a ferromagnetic resonance (FMR) detection from thin, nm-size, films. Our setup is based on the commercial piezo-cantilever, used for atomic force microscopy. It has an option to rotate the sample in…
We present an imaging modality that enables detection of magnetic moments and their resulting stray magnetic fields. We use wide-field magnetic imaging that employs a diamond-based magnetometer and has combined magneto-optic detection (e.g.…
We report on the design, fabrication, and implementation of ultrasensitive micromechanical oscillators. Our ultrathin single-crystal silicon cantilevers with integrated magnetic structures are the first of their kind: They are fabricated…
Magnetic force microscopy (MFM) signals have recently been detected from whole pieces of mechanically exfoliated graphene and molybdenum disulfide (MoS2) nanosheets and magnetism of the two nanomaterials was claimed based on these…
We report a new spin manipulation protocol for periodically reversing the sample magnetization for Magnetic Resonance Force Microscopy. The protocol modulates the microwave excitation frequency synchronously with the position of the…
Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular…
Neutral atoms may be trapped via the interaction of their magnetic dipole moment with magnetic field gradients. One of the possible schemes is the cloverleaf trap. It is often desirable to have at hand a fast and precise technique for…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…
The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the…
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components…
A local magnetization measurement was performed with a Magnetic Force Microscope (MFM) to determine magnetization in domains of an exchange coupled [Co/Pt]/Co/Ru multilayer with predominant perpendicular anisotropy. The quantitative MFM…
A promising technique for measuring single electron spins is magnetic resonance force microscopy (MRFM), in which a microcantilever with a permanent magnetic tip is resonantly driven by a single oscillating spin. If the quality factor of…
The orientation of the tilted magnetic anisotropy has crucial importance in many spintronic devices. However, it is very challenging to determine it especially in very small structures produced by lithography. Here, we propose a new…
Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the mechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to…
The activated torsion oscillation magnetometer exploits the mechanical resonance of a cantilever beam, driven by the torque exerted on the sample by an ac field applied perpendicularly to the film plane. We describe a model for the…
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the…