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A deep learning approach to blind denoising of images without complete knowledge of the noise statistics is considered. We propose DN-ResNet, which is a deep convolutional neural network (CNN) consisting of several residual blocks…
Quality control is a fundamental component of many manufacturing processes, especially those involving casting or welding. However, manual quality control procedures are often time-consuming and error-prone. In order to meet the growing…
Deep learning methodologies have been employed in several different fields, with an outstanding success in image recognition applications, such as material quality control, medical imaging, autonomous driving, etc. Deep learning models rely…
Transforming in-situ transmission electron microscopy (TEM) imaging into a tool for spatially-resolved operando characterization of solid-state reactions requires automated, high-precision semantic segmentation of dynamically evolving…
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this…
In this research, we introduce a unified end-to-end Automated Defect Classification-Detection-Segmentation (ADCDS) framework for classifying, detecting, and segmenting multiple instances of semiconductor defects for advanced nodes. This…
Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…
This paper presents a deep learning approach for the classification of Engineering (CAD) models using Convolutional Neural Networks (CNNs). Owing to the availability of large annotated datasets and also enough computational power in the…
The nature of the atomic defects on the hydrogen passivated Si (100) surface is analyzed using deep learning and scanning tunneling microscopy (STM). A robust deep learning framework capable of identifying atomic species, defects, in the…
A semi-supervised learning framework using the feedforward-designed convolutional neural networks (FF-CNNs) is proposed for image classification in this work. One unique property of FF-CNNs is that no backpropagation is used in model…
Deep Neural Networks (DNNs) provide state-of-the-art solutions in several difficult machine perceptual tasks. However, their performance relies on the availability of a large set of labeled training data, which limits the breadth of their…
Technology to recognize the type of component represented by a point cloud is required in the reconstruction process of an as-built model of a process plant based on laser scanning. The reconstruction process of a process plant through…
As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the…
Deep convolutional neural networks (CNNs) have been widely used in surface defect detection. However, no CNN architecture is suitable for all detection tasks and designing effective task-specific requires considerable effort. The neural…
It is a long-term goal to transfer biological processing principles as well as the power of human recognition into machine vision and engineering systems. One of such principles is visual attention, a smart human concept which focuses…
The popularity of Software Defined Networks (SDNs) has grown in recent years, mainly because of their ability to simplify network management and improve network flexibility. However, this also makes them vulnerable to various types of cyber…
In the 21st-century information age, with the development of big data technology, effectively extracting valuable information from massive data has become a key issue. Traditional data mining methods are inadequate when faced with…
Although automated pathology classification using deep learning (DL) has proved to be predictively efficient, DL methods are found to be data and compute cost intensive. In this work, we aim to reduce DL training costs by pre-training a…
Integrated circuit manufacturing is highly complex, comprising hundreds of process steps. Defects can arise at any stage, causing yield loss and ultimately degrading product reliability. Supervised methods require extensive human annotation…
Deep Linear and Nonlinear learning methods have already been vital machine learning methods for investigating the hierarchical features such as functional connectivity in the human brain via functional Magnetic Resonance signals; however,…