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While deep neural networks (NN) significantly advance image compressed sensing (CS) by improving reconstruction quality, the necessity of training current CS NNs from scratch constrains their effectiveness and hampers rapid deployment.…

Computer Vision and Pattern Recognition · Computer Science 2025-02-04 Bin Chen , Zhenyu Zhang , Weiqi Li , Chen Zhao , Jiwen Yu , Shijie Zhao , Jie Chen , Jian Zhang

Defect detection plays a crucial role in infrared non-destructive testing systems, offering non-contact, safe, and efficient inspection capabilities. However, challenges such as low resolution, high noise, and uneven heating in infrared…

Computer Vision and Pattern Recognition · Computer Science 2023-11-20 Bozhen Hu , Bin Gao , Cheng Tan , Tongle Wu , Stan Z. Li

Since the defect detection of conventional industry components is time-consuming and labor-intensive, it leads to a significant burden on quality inspection personnel and makes it difficult to manage product quality. In this paper, we…

Computer Vision and Pattern Recognition · Computer Science 2025-10-07 Wei-Lung Mao , Chun-Chi Wang , Po-Heng Chou , Yen-Ting Liu

Defect detection is a basic and essential task in automatic parts production, especially for automotive engine precision parts. In this paper, we propose a new idea to construct a deep convolutional network combining related knowledge of…

Computer Vision and Pattern Recognition · Computer Science 2018-10-30 Zhenshen Qu , Jianxiong Shen , Ruikun Li , Junyu Liu , Qiuyu Guan

Diffusion models (DMs) have revolutionized image generation, producing high-quality images with applications spanning various fields. However, their ability to create hyper-realistic images poses significant challenges in distinguishing…

Computer Vision and Pattern Recognition · Computer Science 2024-09-10 Santosh , Li Lin , Irene Amerini , Xin Wang , Shu Hu

This work is addressing the problem of defect anomaly detection based on a clean reference image. Specifically, we focus on SEM semiconductor defects in addition to several natural image anomalies. There are well-known methods to create a…

Computer Vision and Pattern Recognition · Computer Science 2023-03-22 Nati Ofir , Yotam Ben Shoshan , Ran Badanes , Boris Sherman

With high device integration density and evolving sophisticated device structures in semiconductor chips, detecting defects becomes elusive and complex. Conventionally, machine learning (ML)-guided failure analysis is performed with offline…

Machine Learning · Computer Science 2025-07-08 Bangjian Zhou , Pan Jieming , Maheswari Sivan , Aaron Voon-Yew Thean , J. Senthilnath

Remote sensing image change description represents an innovative multimodal task within the realm of remote sensing processing.This task not only facilitates the detection of alterations in surface conditions, but also provides…

Computer Vision and Pattern Recognition · Computer Science 2025-07-08 Dongwei Sun , Jing Yao , Wu Xue , Changsheng Zhou , Pedram Ghamisi , Xiangyong Cao

New production techniques have emerged that have made it possible to produce metal parts with more complex shapes, making the quality control process more difficult. This implies that the visual and superficial analysis has become even more…

Computer Vision and Pattern Recognition · Computer Science 2022-03-01 Francisco Javier Yagüe , Jose Francisco Diez-Pastor , Pedro Latorre-Carmona , Cesar Ignacio Garcia Osorio

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Weakly supervised medical image segmentation (MIS) using generative models is crucial for clinical diagnosis. However, the accuracy of the segmentation results is often limited by insufficient supervision and the complex nature of medical…

Computer Vision and Pattern Recognition · Computer Science 2024-04-26 Zhihao Shuai , Yinan Chen , Shunqiang Mao , Yihan Zho , Xiaohong Zhang

Industrial defect detection systems face critical limitations when confined to one-class anomaly detection paradigms, which assume uniform outlier distributions and struggle with data scarcity in real-world manufacturing environments. We…

Computer Vision and Pattern Recognition · Computer Science 2026-03-09 Muhammad Aqeel , Federico Leonardi , Francesco Setti

Diffusion probabilistic models (DPMs) have achieved impressive success in visual generation. While, they suffer from slow inference speed due to iterative sampling. Employing fewer sampling steps is an intuitive solution, but this will also…

Computer Vision and Pattern Recognition · Computer Science 2025-06-17 Hu Yu , Hao Luo , Fan Wang , Feng Zhao

In recent years, Denoising Diffusion Models have demonstrated remarkable success in generating semantically valuable pixel-wise representations for image generative modeling. In this study, we propose a novel end-to-end framework, called…

Image and Video Processing · Electrical Eng. & Systems 2023-03-21 Zhaohu Xing , Liang Wan , Huazhu Fu , Guang Yang , Lei Zhu

Latent defect screening is challenged by extremely low failure rates, high-dimensional test data, and absence of labeled anomalies. We propose the first unsupervised anomaly detection framework incorporating a Diffusion Transformer. Raw…

Machine Learning · Computer Science 2026-05-27 Yuxuan Yin , Chen He , Todd Jacobs , Jialei He , Boxun Xu , Robert Jin , Peng Li

Medical image segmentation is crucial for many healthcare tasks, including disease diagnosis and treatment planning. One key area is the segmentation of skin lesions, which is vital for diagnosing skin cancer and monitoring patients. In…

Computer Vision and Pattern Recognition · Computer Science 2025-07-22 Salah Eddine Bekhouche , Gaby Maroun , Fadi Dornaika , Abdenour Hadid

Substation meters play a critical role in monitoring and ensuring the stable operation of power grids, yet their detection of cracks and other physical defects is often hampered by a severe scarcity of annotated samples. To address this…

Computer Vision and Pattern Recognition · Computer Science 2026-01-15 Jackie Alex , Justin Petter

In the field of transmission electron microscopy, data interpretation often lags behind acquisition methods, as image processing methods often have to be manually tailored to individual datasets. Machine learning offers a promising approach…

Image and Video Processing · Electrical Eng. & Systems 2021-07-07 C. K. Groschner , Christina Choi , M. C. Scott

Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in…

Computer Vision and Pattern Recognition · Computer Science 2023-11-09 Arti Kumbhar , Amruta Chougule , Priya Lokhande , Saloni Navaghane , Aditi Burud , Saee Nimbalkar

Surface defect detection plays an increasingly important role in manufacturing industry to guarantee the product quality. Many deep learning methods have been widely used in surface defect detection tasks, and have been proven to perform…

Computer Vision and Pattern Recognition · Computer Science 2021-08-17 Jiahui Cheng , Bin Guo , Jiaqi Liu , Sicong Liu , Guangzhi Wu , Yueqi Sun , Zhiwen Yu