Related papers: Metasurface array for single-shot spectroscopic el…
Coating thickness measurement and inspection of defects beneath optically opaque surfaces are among the most promising commercial applications of the terahertz (THz) imaging technology. However, there are two main sources of complexity in…
Accurate and fast 3D imaging of specular surfaces still poses major challenges for state-of-the-art optical measurement principles. Frequently used methods, such as phase-measuring deflectometry (PMD) or shape-from-polarization (SfP), rely…
Dielectric metasurfaces require high refractive index contrast materials for optimum performance. This requirement imposes a severe restraint; devices have either been demonstrated at wavelengths of 700nm and above using high-index…
Mid-infrared (MIR) spectroscopy is a powerful technique employed for a variety of applications, including gas sensing, industrial inspection, astronomy, surveillance, and imaging. Thin-film narrowband interference filters, targeted to…
Polarimetric imaging has a wide range of applications for uncovering features invisible to human eyes and conventional imaging sensors. Compact, fast, cost-effective and accurate full-Stokes polarimetric imaging sensors are highly desirable…
We present the use of a commercially available fixed-angle multi-wavelength ellipsometer for quickly measuring the thickness of NbN thin films for the fabrication and performance improvement of superconducting nanowire single photon…
We introduce a conceptual framework for a lensless imaging system which employs an active metasurface as a high-frequency, continuously tunable amplitude and phase modulation aperture, coupled to a discrete single-pixel detector. Using an…
Measuring light's state of polarization is an inherently difficult problem, since the phase information between orthogonal polarization states is typically lost in the detection process. In this work, we bring to the fore the equivalence…
We show how to correctly extract from the ellipsometric data the surface susceptibility and the surface conductivity that describe the optical properties of monolayer $\rm MoS_2$. Theoretically, these parameters stem from modelling a…
Strain-engineering of materials encompasses significant elastic deformation and leads to breaking of the lattice symmetry and as a consequence to the emergence of optical anisotropy. However, the capability to image and map local strain…
Generalized ellipsometry, a non-destructive optical characterization technique, is employed to determine geometrical structure parameters and anisotropic dielectric properties of highly spatially coherent three-dimensionally nanostructured…
Tin sulphide thin films of p-type conductivity were grown on glass substrates. The refractive index of the as grown films, calculated using both Transmission and ellipsometry data were found to follow the Sellmeier dispersion model. The…
We present a non-destructive, spatially resolved thickness characterization method for rhombohedral (3R) molybdenum disulfide (MoS$_2$) on polydimethylsiloxane (PDMS) substrates. Unlike broadband spectroscopic approaches, the proposed…
The refractive index of single microparticles is derived from precise measurement and rigorous modeling of the stiffness of a laser trap. We demonstrate the method for particles of four different materials with diameters from 1.6 to 5.2…
This article aims to provide a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique in that information about the physical properties of a sample…
Metasurfaces are artificial thin materials that achieve optical thickness through thin geometrical structure. This feature of metasurfaces results in unprecedented benefits for enhancing the performance of optoelectronic devices. In this…
In this paper, a wideband and low-scattering metasurface in terahertz (THz) is introduced. The proposed coding metasurface is composed of four different graphene square patches in one layer, which has a distinct bias voltage. By optimizing…
An ellipsometer is a vital precision tool used for measuring optical parameters with wide applications in many fields, including accurate measurements in film thickness, optical constants, structural profiles, etc. However, the precise…
Dielectric metasurfaces are structured thin films with thickness smaller than the wavelength that aim at replacing and enhancing conventional bulk optical components by structuring local resonances across an aperture. At visible and…
We present a new instrumentation and calibration procedure for terahertz time-domain spectroscopic ellipsometry (THz-TDSE) that is a newly established characterization technique. The experimental setup is capable of providing arbitrary…