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We present a reflectivity-based method for measuring the in-plane refractive index of transparent van der Waals (vdW) materials. The approach enables the characterization of as small as $3 \times 3$~{\textmu}m$^2$ exfoliated flakes on a…

Optics · Physics 2025-11-19 Xavier Zambrana-Puyalto , Alexander Johan Olsen , Søren Raza

The emerging Au-assisted exfoliation technique provides a wealth of large-area and high-quality ultrathin two-dimensional (2D) materials compared with traditional tape-based exfoliation. Fast, damage-free, and reliable determination of the…

Optical microscopy is believed to be an efficient method for identifying layer number of two-dimensional 2D materials. However, since illuminants, cameras and their parameters are different from lab to lab, it is impossible to identify…

Materials Science · Physics 2019-03-27 Jiayu Lei , Jiafan Qu , Peng Wang , Hu Jiang , Hongyan Shi , Xiudong Sun , Bo Gao

High-energy X-ray diffraction methods can non-destructively map the 3D microstructure and associated attributes of metallic polycrystalline engineering materials in their bulk form. These methods are often combined with external stimuli…

The C2DB is a highly curated open database organizing a wealth of computed properties for more than 4000 atomically thin two-dimensional (2D) materials. Here we report on new materials and properties that were added to the database since…

Most of the studied two-dimensional (2D) materials have been obtained by exfoliation of van der Waals crystals. Recently, there has been growing interest in fabricating synthetic 2D crystals which have no layered bulk analogues. These…

The past few years have witnessed vibrant efforts in discovering new two-dimensional (2D) semiconductor materials from both academia and the industry, due to their promising potential in resolving the severe performance deterioration of…

Human-Computer Interaction · Computer Science 2026-05-07 Kavinda Athapaththu , Shiwei Chen , Yuan Fang , Sanchali Mitra , Yee Sin Ang , Yong Wang

We demonstrate a smart laser-diffraction analysis technique for particle mixture identification. We retrieve information about the size, geometry, and ratio concentration of two-component heterogeneous particle mixtures with an efficiency…

Image and Video Processing · Electrical Eng. & Systems 2022-02-03 Arturo Villegas , Mario A. Quiroz-Juarez , Alfred U'Ren , Juan P. Torres , Roberto de J. Leon-Montiel

We perform extensive density functional theory (DFT) calculations to determine the stability and elementary properties of 4249 previously unexplored monolayer crystals. The monolayers comprise the most stable subset (energy within 0.1…

Materials Science · Physics 2024-06-18 Peder Lyngby , Kristian Sommer Thygesen

Two-dimensional (2D) materials are categorized into van der Waals (vdW) and non-vdW types. However, no relevant descriptors have been proposed for identifying the latter. Here, we identify the non-vdW 2D materials by calculating the…

Materials Science · Physics 2025-08-05 Shota Ono

Two-dimensional (2D) materials are frequently associated with the sheets which form bulk layered compounds bonded by van der Waals (vdW) forces. The anisotropy and weak interaction between the sheets have also been the main criteria in the…

Materials Science · Physics 2022-01-24 Rico Friedrich , Mahdi Ghorbani-Asl , Stefano Curtarolo , Arkady V. Krasheninnikov

The detection and classification of microplastics in water remain a significant challenge due to their diverse properties and the limitations of traditional optical methods. Standard spectroscopic techniques often suffer from the strong…

Computer Vision and Pattern Recognition · Computer Science 2026-03-25 Leonard Saur , Marc von Pawlowski , Ulrich Gengenbach , Ingo Sieber , Hossein Shirali , Lorenz Wührl , Xiangyu Weng , Rainer Kiko , Christian Pylatiuk

Recent research in computational imaging largely focuses on developing machine learning (ML) techniques for image reconstruction, which requires large-scale training datasets consisting of measurement data and ground-truth images. However,…

Image and Video Processing · Electrical Eng. & Systems 2023-09-26 Maximilian B. Kiss , Sophia B. Coban , K. Joost Batenburg , Tristan van Leeuwen , Felix Lucka

Electronic and optoelectronic applications of two-dimensional (2D) semiconductors demand precise control over material quality, including thickness, composition, doping, and defect density. Conventional benchmarking methods (e.g., charge…

Materials Science · Physics 2025-06-24 Zhenghan Peng , Adeyemi Uthman , Zhepeng Zhang , Anh Tuan Hoang , Xiang Zhu , Eric Pop , Andrew J. Mannix

The discovery of two-dimensional (2D) materials with tailored properties is critical to meet the increasing demands of high-performance applications across flexible electronics, optoelectronics, catalysis, and energy storage. However,…

Materials Science · Physics 2025-07-02 Zhongwei Liu , Zhimin Zhang , Xuwei Liu , Mingjia Yao , Xin He , Yuanhui Sun , Xin Chen , Lijun Zhang

Here, we propose a method to determine the thickness of the most common transition metal dichalcogenides (TMDCs) placed on the surface of transparent stamps, used for the deterministic placement of two-dimensional materials, by analyzing…

Crystal-graph attention networks have emerged recently as remarkable tools for the prediction of thermodynamic stability and materials properties from unrelaxed crystal structures. Previous networks trained on two million materials…

The thickness of 2D materials not only plays a crucial role in determining the performance of nanoelectronic and optoelectronic devices but also introduces complexities in predicting volume-dependent properties such as energy storage…

Materials Science · Physics 2024-05-27 Chinedu Ekuma

A fundamental challenge in materials science pertains to elucidating the relationship between stoichiometry, stability, structure, and property. Recent advances have shown that machine learning can be used to learn such relationships,…

Materials Science · Physics 2022-03-17 Rhys E. A. Goodall , Abhijith S. Parackal , Felix A. Faber , Rickard Armiento , Alpha A. Lee

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to…

Computer Vision and Pattern Recognition · Computer Science 2023-10-18 Nitish Shukla
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