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Magnetic particle imaging (MPI) is an in-vivo imaging method to detect magnetic nanoparticles for blood vessel imaging and molecular target imaging. Compared with conventional molecular imaging devices (such as nuclear medicine imaging PET…
The continuous scaling of semiconductor-based technologies to micron and sub-micron regimes has resulted in higher device density and lower power dissipation. Many physical phenomena such as self-heating or current leakage become…
We present DeepCSI, a novel approach to Wi-Fi radio fingerprinting (RFP) which leverages standard-compliant beamforming feedback matrices to authenticate MU-MIMO Wi-Fi devices on the move. By capturing unique imperfections in off-the-shelf…
A localized measurement of the RF critical field on superconducting radio frequency (SRF) cavity materials is a key step to identify specific defects that produce quenches of SRF cavities. Two new measurements are performed to demonstrate…
Magnetic Particle Imaging (MPI) is an emerging medical imaging modality that is not yet adopted by clinical practice. Most of the working MPI prototypes including commercial-grade research MPI scanners utilize cylindrical bores that limit…
In traditional detection of the magnetic signal in the experiment, complicated electronic devices are usually set up to explore the feedback from the superconducting transition due to the external magnetic field. This kind of direct…
Stretchable conductors are of crucial relevance for emerging technologies such as wearable electronics, low-invasive bioelectronic implants or soft actuators for robotics. A critical issue for their development regards the understanding of…
Accurate characterisation of small defects remains a challenge in non-destructive testing (NDT). In this paper, a principle-component parametric-manifold mapping approach is applied to single-frequency eddy-current defect characterisation…
As semiconductor patterning dimensions shrink, more advanced Scanning Electron Microscopy (SEM) image-based defect inspection techniques are needed. Recently, many Machine Learning (ML)-based approaches have been proposed for defect…
Magnetic force microscopy (MFM) is long established as a powerful tool for probing the local manifestation of magnetic nanostructures across a range of temperatures and applied stimuli. A major drawback of the technique, however, is that…
Wide field-of-view magnetic field microscopy has been realised by probing shifts in optically detected magnetic resonance (ODMR) spectrum of Nitrogen Vacancy (NV) defect centers in diamond. However, these widefield diamond NV magnetometers…
We present $\phi$-OTDR for detecting and localising full spark-gap breakdowns by analysing backscattered light phase and frequency-domain signatures during high-voltage discharges synchronised with oscilloscope-recorded events. Measuring…
Imaging the magnetic configuration of thin-films has been a long-standing area of research. Since a few years, the emergence of two-dimensional ferromagnetic materials calls for innovation in the field of magnetic imaging. As the magnetic…
Defects such as dislocations impact materials properties and their response during external stimuli. Defect engineering has emerged as a possible route to improving the performance of materials over a wide range of applications, including…
The increasing complexity of advanced semiconductor packages, driven by chiplet architectures and 2.5D/3D integration, challenges conventional failure localization methods such as lock-in thermography (LIT) and complicates current Failure…
The paper presents algorithms to realize effectively and accurately the stepped-frequency waveform reflectometry (SFWR), i.e. the reflectometric technique based on the use of sinusoidal bursts. This technique is useful for monitoring the…
Magnetic Particle Imaging (MPI) is a tomographic imaging technique for determining the spatial distribution of superparamagnetic nanoparticles. Current MPI systems are capable of imaging iron masses over a wide dynamic range of more than…
As quantum computing hardware becomes more complex with ongoing design innovations and growing capabilities, the quantum computing community needs increasingly powerful techniques for fabrication failure root-cause analysis. This is…
The analysis of the electronic surface properties of transition metal oxides being key materials for future nanoelectronics requires a direct characterization of the conductivity with highest spatial resolution. Using local conductivity…
The coherence of quantum dot qubits fabricated in semiconductors is often limited by charge noise from defects in gate dielectrics, which are material- and process-dependent. Characterizing these defects is an important step towards…