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Related papers: Defect Detection Approaches Based on Simulated Ref…

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Major advancements in computer vision can primarily be attributed to the use of labeled datasets. However, acquiring labels for datasets often results in errors which can harm model performance. Recent works have proposed methods to…

Computer Vision and Pattern Recognition · Computer Science 2023-12-06 Maya Srikanth , Jeremy Irvin , Brian Wesley Hill , Felipe Godoy , Ishan Sabane , Andrew Y. Ng

Surveillance scenarios are prone to several problems since they usually involve low-resolution footage, and there is no control of how far the subjects may be from the camera in the first place. This situation is suitable for the…

Computer Vision and Pattern Recognition · Computer Science 2021-01-27 Angelo G. Menezes

As deep learning technology continues to evolve, the images yielded by generative models are becoming more and more realistic, triggering people to question the authenticity of images. Existing generated image detection methods detect…

Computer Vision and Pattern Recognition · Computer Science 2023-11-03 Xiuli Bi , Bo Liu , Fan Yang , Bin Xiao , Weisheng Li , Gao Huang , Pamela C. Cosman

Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…

Materials Science · Physics 2023-05-03 Stephanie M. Ribet , Colin Ophus , Roberto dos Reis , Vinayak P. Dravid

Deep learning methodologies have been employed in several different fields, with an outstanding success in image recognition applications, such as material quality control, medical imaging, autonomous driving, etc. Deep learning models rely…

Computer Vision and Pattern Recognition · Computer Science 2022-03-11 Saul Calderon-Ramirez , Shengxiang Yang , David Elizondo

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

Computer Vision and Pattern Recognition · Computer Science 2023-08-17 Vic De Ridder , Bappaditya Dey , Sandip Halder , Bartel Van Waeyenberge

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive…

Computer Vision and Pattern Recognition · Computer Science 2024-08-23 Blaž Rolih , Matic Fučka , Danijel Skočaj

The rapid advancement of machine learning technologies raises questions about the security of machine learning models, with respect to both training-time (poisoning) and test-time (evasion, impersonation, and inversion) attacks. Models…

Computer Vision and Pattern Recognition · Computer Science 2025-03-21 Xinheng Xie , Kureha Yamaguchi , Margaux Leblanc , Simon Malzard , Varun Chhabra , Victoria Nockles , Yue Wu

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

Materials Science · Physics 2021-06-03 Nik Dennler , Antonio Foncubierta-Rodriguez , Titus Neupert , Marilyne Sousa

Self-supervised learning allows for better utilization of unlabelled data. The feature representation obtained by self-supervision can be used in downstream tasks such as classification, object detection, segmentation, and anomaly…

Computer Vision and Pattern Recognition · Computer Science 2020-06-18 Rabia Ali , Muhammad Umar Karim Khan , Chong Min Kyung

The detection of manufacturing errors is crucial in fabrication processes to ensure product quality and safety standards. Since many defects occur very rarely and their characteristics are mostly unknown a priori, their detection is still…

Computer Vision and Pattern Recognition · Computer Science 2020-08-31 Marco Rudolph , Bastian Wandt , Bodo Rosenhahn

Point defects have a strong influence on the physical properties of materials, often dominating the electronic and optical behavior in semiconductors and insulators. The simulation and analysis of point defects is therefore crucial for…

Materials Science · Physics 2024-03-12 Jimmy-Xuan Shen , Lars F. Voss , Joel Basile Varley

Anomalies represent deviations from the intended system operation and can lead to decreased efficiency as well as partial or complete system failure. As the causes of anomalies are often unknown due to complex system dynamics, efficient…

Machine Learning · Computer Science 2021-08-31 Benjamin Lindemann , Benjamin Maschler , Nada Sahlab , Michael Weyrich

Recent efforts towards video anomaly detection (VAD) try to learn a deep autoencoder to describe normal event patterns with small reconstruction errors. The video inputs with large reconstruction errors are regarded as anomalies at the test…

Computer Vision and Pattern Recognition · Computer Science 2021-09-03 Yuandu Lai , Yahong Han , Yaowei Wang

Surface defect detection is significant in industrial production. However, detecting defects with varying textures and anomaly classes during the test time is challenging. This arises due to the differences in data distributions between…

Computer Vision and Pattern Recognition · Computer Science 2024-08-20 Yiran Song , Qianyu Zhou , Lizhuang Ma

In recent years, laser ultrasonic visualization testing (LUVT) has attracted much attention because of its ability to efficiently perform non-contact ultrasonic non-destructive testing.Despite many success reports of deep learning based…

Image and Video Processing · Electrical Eng. & Systems 2023-05-31 Miya Nakajima , Takahiro Saitoh , Tsuyoshi Kato

The goal of anomaly detection is to identify examples that deviate from normal or expected behavior. We tackle this problem for images. We consider a two-phase approach. First, using normal examples, a convolutional autoencoder (CAE) is…

Computer Vision and Pattern Recognition · Computer Science 2020-03-20 Natasa Sarafijanovic-Djukic , Jesse Davis

In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes a topical subject in the industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in…

Computer Vision and Pattern Recognition · Computer Science 2023-06-14 Yajie Cui , Zhaoxiang Liu , Shiguo Lian

Supervised anomaly detection methods perform well in identifying known anomalies that are well represented in the training set. However, they often struggle to generalise beyond the training distribution due to decision boundaries that lack…

Machine Learning · Computer Science 2025-11-18 Zahra Zamanzadeh Darban , Qizhou Wang , Charu C. Aggarwal , Geoffrey I. Webb , Ehsan Abbasnejad , Mahsa Salehi

Overhead line inspection greatly benefits from defect recognition using visible light imagery. Addressing the limitations of existing feature extraction techniques and the heavy data dependency of deep learning approaches, this paper…

Computer Vision and Pattern Recognition · Computer Science 2023-12-08 Weixi Wang , Xichen Zhong , Xin Li , Sizhe Li , Xun Ma