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In-line polarimeters perform non-destructive polarization measurements of optical signals, and play a critical role in monitoring and controlling the polarization environment in for example optical networks. While current in-line…
The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted…
Stealthy false data injection attacks on cyber-physical systems (CPSs) introduce erroneous measurement information to on-board sensors with the purpose to degrade system performance. An intelligent attacker is able to leverage knowledge of…
We describe a setup for optical quality assurance of silicon microstrip sensors. Pattern recognition algorithms were developed to analyze microscopic scans of the sensors for defects. It is shown that the software has a recognition and…
In this study, we developed a new proton detector system called CATCH, which was designed for a scattering experiment involving a $\Sigma$ hyperon and a proton (J-PARC E40). CATCH is a cylindrical detector system covering an inner target…
We consider an inverse scattering problem to identify the locations or shapes of unknown anomalies from scattering parameter data collected by a small number of dipole antennas. Most of researches does not considered the influence of dipole…
Symmetries and tunability are of fundamental importance in wave scattering control, but symmetries are often obvious upon visual inspection which constitutes a significant vulnerability of metamaterial wave devices to reverse-engineering…
We present an efficient machine learning framework for detection and classification of nanoparticles on surfaces that are detected in the far-field with Coherent Fourier Scatterometry (CFS). We study silicon wafers contaminated with…
Polarization is a fundamental property of light that carries distinct and valuable information. Consequently, its precise measurement is crucial for numerous applications, including biomedical imaging, remote sensing, and optical…
Printed Circuit boards (PCBs) are one of the most important stages in making electronic products. A small defect in PCBs can cause significant flaws in the final product. Hence, detecting all defects in PCBs and locating them is essential.…
Statistical quality control in semiconductor manufacturing hinges on effective diagnostics of wafer bin maps, wherein a key challenge is to detect how defective chips tend to spatially cluster on a wafer--a problem known as spatial pattern…
Silent Errors within hardware devices occur when an internal defect manifests in a part of the circuit which does not have check logic to detect the incorrect circuit operation. The results of such a defect can range from flipping a single…
The increase in HPC systems size and complexity, together with increasing on-chip transistor density, power limitations, and number of components, render modern HPC systems subject to soft errors. Silent data corruptions (SDCs) are…
Many fabless semiconductor companies outsource their designs to third-party fabrication houses. As trustworthiness of chain after outsourcing including fabrication houses is not established, any adversary in between, with malicious intent…
Intrusion Detection is an invaluable part of computer networks defense. An important consideration is the fact that raising false alarms carries a significantly lower cost than not detecting at- tacks. For this reason, we examine how…
The operation of solid-state qubits often relies on single-shot readout using a nanoelectronic charge sensor, and the detection of events in a noisy sensor signal is crucial for high fidelity readout of such qubits. The most common…
Recently, recycled field-programmable gate arrays (FPGAs) pose a significant hardware security problem due to the proliferation of the semiconductor supply chain. Ring oscillator (RO) based frequency analyzing technique is one of the…
This study critically examines the methodological rigor in credit card fraud detection research, revealing how fundamental evaluation flaws can overshadow algorithmic sophistication. Through deliberate experimentation with improper…
Accurate detection and characterization of nanoparticles within confined spaces is crucial for applications ranging from nanofluidics to biotechnology. We present a novel approach that combines interferometric scattering (iSCAT) detection…
This paper presents novel methods for parameter identification in electrical grids with small numbers of spatially distributed measuring devices, which is an issue for distribution system operators managing aged and not properly mapped…