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The possibility of spatially resolving the optical properties of atomically thin materials is especially appealing as they can be modulated at the micro- and nanoscale by reducing their thickness, changing the doping level or applying a…
We present total and specular reflectance measurements of various materials that are commonly (and uncommonly) used to provide baffling and/or to minimize the effect of stray light in optical systems. More specifically, we investigate the…
Understanding the evolution of dislocation structures during plastic deformation is critical for predicting the mechanical performance of metallic materials. In this work, we applied in situ scanning electron microscopy/electron backscatter…
Resonance ultrasound spectroscopy (RUS) is a non-destructive technique for evaluating elastic and an-elastic material properties. The frequencies of free vibrations for a carefully crafted sample are measured, and material properties can be…
Atomic-scale investigation on mechanical behaviors is highly necessary to fully understand the fracture mechanics especially of brittle materials, which are determined by atomic-scale phenomena (e.g., lattice trapping). Here, exfoliated…
A reduced order asymptotic homogenization based multiscale technique which can capture damage and inelastic effects in composite materials is proposed. This technique is based on two scale homogenization procedure where eigen strain…
For decades, nonlinear optics has been used to control the frequency and propagation of light in unique ways enabling a wide range of applications such as ultrafast lasing, sub-wavelength imaging, and novel sensing methods. Through this, a…
A misalignment of anisotropic crystallites causes small values of anisotropy and decreases the critical current density of textured polycrystalline superconductors. To relate the crystallite misalignment and out-plane anisotropy, the…
Real-world solids, such as rocks, soft tissues, and engineering materials, are often under some form of stress. Most real materials are also, to some degree, anisotropic due to their microstructure, a characteristic often called the…
Impedance mismatch between free space and absorptive materials is a fundamental issue plaguing the pursue of high-efficiency light absorption. In this work, we design and numerically demonstrate a type of non-resonant impedance-matched…
Highly ambitious initiatives aspire to propel a miniature spacecraft to a neighboring star within a human generation, leveraging the radiation pressure of lasers for propulsion. One of the main challenges to achieving this enormous feat is…
Quasi-two-dimensional (quasi-2D) materials hold promise for future electronics because of their unique band structures that result in electronic and mechanical properties sensitive to crystal strains in all three dimensions. Quantifying…
By integrating a dielectric microwave resonator with a piezoelectric-based strain device, we develop an in situ strain-tunable microwave spectroscopy technique that enables contactless measurements of superconducting properties under…
Lattice defects play a key role in determining the properties of crystalline materials. Probing the 3D lattice strains that govern their interactions remains a challenge. Bragg Coherent Diffraction Imaging (BCDI) allows strain to be…
Strain induced through fabrication, both by patterning and capping, can be used to change the properties of two-dimensional (2D) materials or other thin films. Here, we explore how capping layers impart strain to monolayer MoS$_{2}$ using…
Optical limiters are nonlinear devices that feature decreasing transmittance with increasing incident optical intensity, and thus can protect sensitive components from high-intensity illumination. The ideal optical limiter reflects rather…
Strain presents a straightforward tool to tune electronic properties of atomically thin nanomaterials that are highly sensitive to lattice deformations. While the influence of strain on the electronic band structure has been intensively…
Femtosecond laser fabrication enables the creation of a wide range of devices, but its scalability and yield can be limited by the lack of real-time, in-situ monitoring tools. In particular, there is a strong need for metrics that directly…
Diffraction tomography (DT) has been widely explored in transmission-mode configurations, enabling high-resolution, label-free 3D imaging. However, industrial metrology applications, such as semiconductor inspection, typically involve…
Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. However, a conventional ellipsometer, which utilizes a mechanically rotating polarizer and grating-based…