Related papers: Correcting for probe wandering by precession path …
This work introduces a method for preprocessing measurements of electrical impedance tomography to considerably reduce the effect uncertainties in the electrode contacts have on the reconstruction quality, without a need to explicitly…
We experimentally map the transverse profile of diffraction-limited beams using photon-number-resolving detectors. We observe strong compression of diffracted beam profiles for high detected photon number. This effect leads to higher…
Deep learning-based models have demonstrated remarkable success in solving illposed inverse problems; however, many fail to strictly adhere to the physical constraints imposed by the measurement process. In this work, we introduce a…
Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan…
A ray-tracing (RT) enhanced back-projection algorithm (RT-BPA) for microwave imaging in multipath environments is presented. By tightly incorporating the concept of ray-tracing into a generalized version of traditional BPA, this method…
Being able to see beyond the direct line of sight is an intriguing prospective and could benefit a wide variety of important applications. Recent work has demonstrated that time-resolved measurements of indirect diffuse light contain…
In this paper, we develop a novel phase retrieval approach to reconstruct x-ray differential phase shift induced by an object. A primary advantage of our approach is a higher-order accuracy over that with the conventional linear…
Electrical impedance tomography aims at reconstructing the conductivity inside a physical body from boundary measurements of current and voltage at a finite number of contact electrodes. In many practical applications, the shape of the…
The problem of image segmentation is known to become particularly challenging in the case of partial occlusion of the object(s) of interest, background clutter, and the presence of strong noise. To overcome this problem, the present paper…
Diffraction analysis in four dimensional scanning transmission electron microscopy now enables the mapping of local structures including symmetry, strain, and polarization of materials. However, measuring the distribution of these…
Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors…
Visual localization is the task of accurate camera pose estimation in a known scene. It is a key problem in computer vision and robotics, with applications including self-driving cars, Structure-from-Motion, SLAM, and Mixed Reality.…
We establish a series of deep convolutional neural networks to automatically analyze position averaged convergent beam electron diffraction patterns. The networks first calibrate the zero-order disk size, center position, and rotation…
The accuracy of the information that can be extracted from electron diffraction patterns is often limited by the presence of optical distortions. Existing distortion characterization techniques typically require knowledge of the reciprocal…
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…
The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However,…
We report the development of deep learning coherent electron diffractive imaging at sub-angstrom resolution using convolutional neural networks (CNNs) trained with only simulated data. We experimentally demonstrate this method by applying…
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…
An electron beam traversing a structured plasmonic field is shown to undergo diffraction with characteristic angular patterns of both elastic and inelastic outgoing electron components. In particular, a plasmonic {\it grating} (e.g., a…
Accurate reconstruction of recoil-electron directions is critical for enhancing the point-spread function of electron-tracking Compton cameras (ETCCs) in gamma-ray imaging. Although full three-dimensional (3D) readout systems achieve…