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In this study, we investigated the application of the direct sampling method (DSM) to identify small dielectric objects in a limited-aperture inverse scattering problem. Unlike previous studies, we consider the bistatic measurement…

Numerical Analysis · Mathematics 2025-09-16 Won-Kwang Park

Wind turbines are subjected to continuous rotational stresses and unusual external forces such as storms, lightning, strikes by flying objects, etc., which may cause defects in turbine blades. Hence, it requires a periodical inspection to…

Computer Vision and Pattern Recognition · Computer Science 2024-01-02 Md Fazle Rabbi , Solayman Hossain Emon , Ehtesham Mahmud Nishat , Tzu-Liang , Tseng , Atira Ferdoushi , Chun-Che Huang , Md Fashiar Rahman

Scanning transmission electron microscopy (STEM) is now the primary tool for exploring functional materials on the atomic level. Often, features of interest are highly localized in specific regions in the material, such as ferroelectric…

Materials Science · Physics 2021-08-11 Nicole Creange , Ondrej Dyck , Rama K. Vasudevan , Maxim Ziatdinov , Sergei V. Kalinin

Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…

Computer Vision and Pattern Recognition · Computer Science 2025-04-04 Hesong Li , Ziqi Wu , Ruiwen Shao , Tao Zhang , Ying Fu

Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various functional properties in real space with angstrom-level…

Recent advances in scanning tunneling and transmission electron microscopies (STM and STEM) have allowed routine generation of large volumes of imaging data containing information on the structure and functionality of materials. The…

Disordered Systems and Neural Networks · Physics 2021-06-24 Maxim Ziatdinov , Chun Yin Wong , Sergei V. Kalinin

We propose to use the defect creation energy loss in commonly used high energy physics solid state detectors as a tool to statistically identify dark matter signal from background. We simulate the energy loss in the process of defect…

Instrumentation and Detectors · Physics 2020-02-12 Fedja Kadribasic , Nader Mirabolfathi , Kai Nordlund , Flyura Djurabekova

Despite decades of research, the ultimate goal of nanotechnology--top-down manipulation of individual atoms--has been directly achieved with only one technique: scanning probe microscopy. In this Review, we demonstrate that scanning…

Change detection and irregular object extraction in 3D point clouds is a challenging task that is of high importance not only for autonomous navigation but also for updating existing digital twin models of various industrial environments.…

Computer Vision and Pattern Recognition · Computer Science 2023-12-18 Nikolaos Stathoulopoulos , Anton Koval , George Nikolakopoulos

We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This…

Materials Science · Physics 2024-05-29 Jiadong Dan , Cheng Zhang , Xiaoxu Zhao , N. Duane Loh

Crystal property prediction, governed by quantum mechanical principles, is computationally prohibitive to solve exactly for large many-body systems using traditional density functional theory. While machine learning models have emerged as…

Materials Science · Physics 2026-01-28 Bin Cao , Yang Liu , Longhan Zhang , Yifan Wu , Zhixun Li , Yuyu Luo , Hong Cheng , Yang Ren , Tong-Yi Zhang

In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterisation of a material's functional properties using in-situ experiments are becoming more widely available. As the practicable…

Materials Science · Physics 2024-09-20 Julie Marie Bekkevold , Jonathan J. P. Peters , Ryo Ishikawa , Naoya Shibata , Lewys Jones

Recognition of objects with subtle differences has been used in many practical applications, such as car model recognition and maritime vessel identification. For discrimination of the objects in fine-grained detail, we focus on deep…

Computer Vision and Pattern Recognition · Computer Science 2019-07-23 Kaan Karaman , Erhan Gundogdu , Aykut Koc , A. Aydin Alatan

Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration…

Materials Science · Physics 2023-06-29 Juhyeok Lee , Moosung Lee , YongKeun Park , Colin Ophus , Yongsoo Yang

In four-dimensional scanning transmission electron microscopy (4D STEM) a focused beam is scanned over a specimen and a diffraction pattern is recorded at each position using a pixelated detector. During the experiment, it must be ensured…

From a process development perspective, diamond growth via chemical vapor deposition has made significant strides. However, challenges persist in achieving high quality and large-area material production. These difficulties include…

Computer Vision and Pattern Recognition · Computer Science 2024-04-12 Rohan Reddy Mekala , Elias Garratt , Matthias Muehle , Arjun Srinivasan , Adam Porter , Mikael Lindvall

Precession Electron Diffraction (PED) offers a number of advantages for crystal structure analysis and solving unknown structures using electron diffraction. The current article uses many-beam simulations of PED intensities, in combination…

Materials Science · Physics 2025-09-22 W. Sinkler , L. D. Marks

We show that diffraction intensity into the First Order Laue Zone (FOLZ) of a crystal can have a strong azimuthal dependence, where this FOLZ ring appears solely because of unidirectional atom position modulation. Such a modulation was…

Materials Science · Physics 2023-10-03 Aurys Silinga , Christopher S. Allen , Juri Barthel , Colin Ophus , Ian MacLaren

Due to the high complexity and technical requirements of industrial production processes, surface defects will inevitably appear, which seriously affects the quality of products. Although existing lightweight detection networks are highly…

Computer Vision and Pattern Recognition · Computer Science 2024-08-27 Xuyi Yu

This paper explores optimal methods for obtaining one-dimensional (1D) powder pattern intensities from two-dimensional (2D) planar detectors with good estimates of their standard deviations. We describe methods to estimate uncertainties…

Materials Science · Physics 2014-09-12 Xiaohao Yang , Pavol Juhas , Simon J. L. Billinge