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Overconfidence is a common issue for deep neural networks, limiting their deployment in real-world applications. To better estimate confidence, existing methods mostly focus on fully-supervised scenarios and rely on training labels. In this…

Machine Learning · Computer Science 2023-07-21 Chen Li , Xiaoling Hu , Chao Chen

Reliable uncertainty estimation has become a crucial requirement for the industrial deployment of deep learning algorithms, particularly in high-risk applications such as autonomous driving and medical diagnosis. However, mainstream…

Machine Learning · Computer Science 2024-09-10 Junyu Gao , Mengyuan Chen , Liangyu Xiang , Changsheng Xu

In this paper, we propose TEDL, a two-stage learning approach to quantify uncertainty for deep learning models in classification tasks, inspired by our findings in experimenting with Evidential Deep Learning (EDL) method, a recently…

Machine Learning · Computer Science 2022-09-14 Xue Li , Wei Shen , Denis Charles

Sewer pipe faults, such as leaks and blockages, can lead to severe consequences including groundwater contamination, property damage, and service disruption. Traditional inspection methods rely heavily on the manual review of CCTV footage…

Robotics · Computer Science 2025-07-31 Alex George , Will Shepherd , Simon Tait , Lyudmila Mihaylova , Sean R. Anderson

In recent years, defect prediction, one of the major software engineering problems, has been in the focus of researchers since it has a pivotal role in estimating software errors and faulty modules. Researchers with the goal of improving…

Software Engineering · Computer Science 2020-04-07 Ahmad Hasanpour , Pourya Farzi , Ali Tehrani , Reza Akbari

The accuracy of deep neural networks is significantly influenced by the effectiveness of mini-batch construction during training. In single-label scenarios, such as binary and multi-class classification tasks, it has been demonstrated that…

Machine Learning · Computer Science 2024-12-24 Ao Zhou , Bin Liu , Jin Wang , Grigorios Tsoumakas

This paper proposes a self-explainable Deep Learning (SE-DL) system for an image classification problem that performs self-error detection. The self-error detection is key to improving the DL system's safe operation, especially in…

Computer Vision and Pattern Recognition · Computer Science 2022-11-01 Mohammad Mahdi Karimi , Azin Heidarshenas , William W. Edmonson

Uncertainty estimation is a key factor that makes deep learning reliable in practical applications. Recently proposed evidential neural networks explicitly account for different uncertainties by treating the network's outputs as evidence to…

Machine Learning · Computer Science 2023-07-03 Danruo Deng , Guangyong Chen , Yang Yu , Furui Liu , Pheng-Ann Heng

Recent evolution in deep learning has proven its value for CT-based lung nodule classification. Most current techniques are intrinsically black-box systems, suffering from two generalizability issues in clinical practice. First,…

Image and Video Processing · Electrical Eng. & Systems 2022-02-28 Hanxiao Zhang , Liang Chen , Xiao Gu , Minghui Zhang , Yulei Qin , Feng Yao , Zhexin Wang , Yun Gu , Guang-Zhong Yang

Detecting and evaluating surface coating defects is important for marine vessel maintenance. Currently, the assessment is carried out manually by qualified inspectors using international standards and their own experience. Automating the…

Computer Vision and Pattern Recognition · Computer Science 2022-03-21 Li Yu , Kareem Metwaly , James Z. Wang , Vishal Monga

Deep learning has played a major role in the interpretation of dermoscopic images for detecting skin defects and abnormalities. However, current deep learning solutions for dermatological lesion analysis are typically limited in providing…

Computer Vision and Pattern Recognition · Computer Science 2021-07-20 Gun-Hee Lee , Han-Bin Ko , Seong-Whan Lee

For the sake of recognizing and classifying textile defects, deep learning-based methods have been proposed and achieved remarkable success in single-label textile images. However, detecting multi-label defects in a textile image remains…

Computer Vision and Pattern Recognition · Computer Science 2021-02-02 Bing Wei , Kuangrong Hao , Lei Gao

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the…

Machine Learning · Computer Science 2024-03-21 Kamal Taha

Deep Learning sets the state-of-the-art in many challenging tasks showing outstanding performance in a broad range of applications. Despite its success, it still lacks robustness hindering its adoption in medical applications. Modeling…

Computer Vision and Pattern Recognition · Computer Science 2019-09-19 Agnieszka Tomczack , Nassir Navab , Shadi Albarqouni

Current deep learning solutions are well known for not informing whether they can reliably classify an example during inference. One of the most effective ways to build more reliable deep learning solutions is to improve their performance…

Machine Learning · Computer Science 2022-08-09 David Macêdo

Numerous real-world problems from a diverse set of application areas exist that exhibit temporal dependencies. We focus on a specific type of time series classification which we refer to as aggregated time series classification. We consider…

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

Computer Vision and Pattern Recognition · Computer Science 2024-07-18 Amit Prasad , Bappaditya Dey , Victor Blanco , Sandip Halder

State-of-the-art, high capacity deep neural networks not only require large amounts of labelled training data, they are also highly susceptible to label errors in this data, typically resulting in large efforts and costs and therefore…

Machine Learning · Computer Science 2020-07-20 Christian Haase-Schütz , Rainer Stal , Heinz Hertlein , Bernhard Sick

Deep regression is an important problem with numerous applications. These range from computer vision tasks such as age estimation from photographs, to medical tasks such as ejection fraction estimation from echocardiograms for disease…

Computer Vision and Pattern Recognition · Computer Science 2023-02-16 Weihang Dai , Xiaomeng Li , Kwang-Ting Cheng

Recent advances in deep learning have achieved impressive gains in classification accuracy on a variety of types of data, including images and text. Despite these gains, however, concerns have been raised about the calibration, robustness,…

Machine Learning · Computer Science 2018-11-20 Dallas Card , Michael Zhang , Noah A. Smith