Related papers: AFM-based Hamaker Constant Determination with Blin…
The twisted light modes used in modern atomic physics experiments can be contaminated by small admixtures of plane wave radiation. Although these admixtures hardly reveal themselves in the beam intensity profile, they may seriously affect…
This paper proposes an auxiliary vector filtering (AVF) algorithm based on a constrained constant modulus (CCM) design for robust adaptive beamforming. This scheme provides an efficient way to deal with filters with a large number of…
Contact electrification (CE) remains a critical challenge in advanced material technologies where uncontrolled surface charging can compromise manufacturability, reliability, and performance in practical applications. Ultrathin glass with…
Molecular dynamics simulations have been performed to understand true atomic resolution, which has been observed on the Si(111)-7$\times$7 surface by dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale contrast is…
We present differential $UBV$ photoelectric photometry obtained by Williamon of the short-period A-type W~UMa binary MW~Pav. With the Wilson-Devinney analysis program we obtained a simultaneous solution of these observations with the $UBV$…
Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…
Magnetic force microscopy (MFM) measurements generally provide phase images which represent the signature of domain structures on the surface of nanomaterials. To quantitatively determine magnetic stray fields based on an MFM image requires…
In this work, the tip convolution effect in atomic force microscopy is revisited to illustrate the capabilities of cubic objects for determination of the tip shape and size. Using molecular-based cubic nanoparticles as a reference, a…
We use a combination of high-redshift observables to extract the strongest constraints to date on the fraction of axion fuzzy dark matter (FDM) in the mass window $10^{-26}\,\mathrm{eV}\!\lesssim\!…
We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance…
The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since they predetermine SPM resolution and electronic structure…
The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…
The Lifshitz theory of van der Waals forces is utilized for the systematic calculation of the non-retarded room temperature Hamaker constants between 26 identical isotropic elemental metals that are embedded in vacuum or in pure water. The…
Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…
The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…
Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…
The Hamaker constants, which are coefficients providing quantitative information on intermolecular forces, were calculated for a number of different materials according to the Lifshitz theory via simple DFT calculations without any…
High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) is a vital tool for characterizing single-atom catalysts (SACs). However, reliable elemental identification of different atoms remains challenging because…
Scanning probe microscopy (SPM) has been extensively applied to probe interfacial water in many interdisciplinary fields but the disturbance of the probes on the hydrogen-bonding structure of water has remained an intractable problem. Here…