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In-situ X-ray diffraction (XRD) and transmission electron microscopy (TEM) have been used to investigate many physical science phenomena, ranging from phase transitions, chemical reaction and crystal growth to grain boundary dynamics. A…

Reflection High-Energy Electron Diffraction (RHEED) is a powerful tool to probe the surface reconstruction during MBE growth. However, raw RHEED patterns are difficult to interpret, especially when the wafer is rotating. A more accessible…

Mesoscale and Nanoscale Physics · Physics 2025-08-12 Abdourahman Khaireh-Walieh , Alexandre Arnoult , Sébastien Plissard , Peter R. Wiecha

Single-crystal X-ray diffraction (SC-XRD) is the gold standard technique to characterize crystal structures in solid state. Despite significant advances in automation for structure solution, the refinement stage still depends heavily on…

Materials Science · Physics 2025-12-04 Wen-Lin Luo , Yi Yuan , Cheng-Hui Li , Yue Zhao , Jing-Lin Zuo

Grazing incidence X-ray diffraction (GIXD) is widely used for the structural characterization of thin films, particularly for analyzing phase composition and the orientation distribution of crystallites. While various tools exist for…

We report an interpretation method for deep learning models that allows us to handle high-dimensional spectral data in materials science. The proposed method uses feature extraction and clustering analysis to categorize materials into…

Materials Science · Physics 2025-10-21 Akira Takahashi , Yu Kumagai , Arata Takamatsu , Fumiyasu Oba

We describe a diffraction microscopy technique based on refractive optics to study structural variations in crystals. The X-ray beam diffracted by a crystal was magnified by beryllium parabolic refractive lenses on a 2D X-ray camera. The…

Optics · Physics 2014-12-16 Thomas Roth , Carsten Detlefs , Irina Snigireva , Anatoly Snigirev

This paper presents an adaptive image sampling algorithm based on Deep Learning (DL). The adaptive sampling mask generation network is jointly trained with an image inpainting network. The sampling rate is controlled in the mask generation…

Computer Vision and Pattern Recognition · Computer Science 2019-12-17 Qiqin Dai , Henry Chopp , Emeline Pouyet , Oliver Cossairt , Marc Walton , Aggelos K. Katsaggelos

Periodic material or crystal property prediction using machine learning has grown popular in recent years as it provides a computationally efficient replacement for classical simulation methods. A crucial first step for any of these…

Machine Learning · Computer Science 2024-05-08 Jonathan Balasingham , Viktor Zamaraev , Vitaliy Kurlin

We propose a novel data-driven approach for analyzing synchrotron Laue X-ray microdiffraction scans based on machine learning algorithms. The basic architecture and major components of the method are formulated mathematically. We…

Materials Science · Physics 2020-10-12 Yintao Song , Nobumichi Tamura , Chenbo Zhang , Mostafa Karami , Xian Chen

Here we show that the low temperature phase of magnetite is associated with an effective, although fractional, ordering of the charge. Evidence and a quantitative evaluation of the atomic charges are achieved by using resonant x-ray…

Strongly Correlated Electrons · Physics 2009-11-11 E. Nazarenko , J. E. Lorenzo , Y. Joly , J. L. Hodeau , D. Mannix , C. Marin

Serial crystallography is the field of science that studies the structure and properties of crystals via diffraction patterns. In this paper, we introduce a new serial crystallography dataset comprised of real and synthetic images; the…

A new procedure aiming at disentangling the instrumental profile broadening and the relevant X-ray powder diffraction (XRPD) profile shape is presented. The technique consists of three steps: denoising by means of wavelet transforms,…

Materials Science · Physics 2008-12-02 A. Cervellino , C. Giannini , A. Guagliardi , M. Ladisa

The diffraction patterns of crystalline materials with local order contain sharp Bragg reflections as well as highly structured diffuse scattering. The instrumental requirements, experimental parameters and data processing techniques for…

Materials Science · Physics 2023-11-29 Romy Poppe , Joke Hadermann

Most material discrimination in security inspections is based on dual-energy x-ray imaging, which enables the determination of a material's effective atomic number (Zeff) as well as electron density and its consequent classification as…

Materials Science · Physics 2023-08-16 A. Astolfo , I. G. Haig , D. Bate , A. Olivo , P. Modregger

Synchrotron-based X-ray computed tomography is widely used for investigating inner structures of specimens at high spatial resolutions. However, potential beam damage to samples often limits the X-ray exposure during tomography experiments.…

Image and Video Processing · Electrical Eng. & Systems 2020-09-30 Ziling Wu , Tekin Bicer , Zhengchun Liu , Vincent De Andrade , Yunhui Zhu , Ian T. Foster

Knowledge gained through X-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. Atomic details of sample structures is achievable by…

Optics · Physics 2016-09-14 Hong Yu , Ronghua Lu , Shensheng Han , Honglan Xie , Guohao Du , Tiqiao Xiao , Daming Zhu

This paper explores optimal methods for obtaining one-dimensional (1D) powder pattern intensities from two-dimensional (2D) planar detectors with good estimates of their standard deviations. We describe methods to estimate uncertainties…

Materials Science · Physics 2014-09-12 Xiaohao Yang , Pavol Juhas , Simon J. L. Billinge

Imperfections in X-ray imaging systems can limit their performance, especially in High Energy Density (HED) or Inertial Fusion Energy (IFE)-relevant experiments that are typically single shot, by introducing structured, non-stationary…

Automation can transform productivity in research activities that use liquid handling, such as organic synthesis, but it has made less impact in materials laboratories, which require sample preparation steps and a range of solid-state…

The detection and classification of exfoliated two-dimensional (2D) material flakes from optical microscope images can be automated using computer vision algorithms. This has the potential to increase the accuracy and objectivity of…

Computer Vision and Pattern Recognition · Computer Science 2026-02-06 Jan-Lucas Uslu , Alexey Nekrasov , Alexander Hermans , Bernd Beschoten , Bastian Leibe , Lutz Waldecker , Christoph Stampfer
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