Related papers: SIM-STEM Lab: Incorporating Compressed Sensing The…
In this study we develop dimension-reduction techniques to accelerate diffusion model inference in the context of synthetic data generation. The idea is to integrate compressed sensing into diffusion models (hence, CSDM): First, compress…
Image sensors are the backbone of many imaging technologies of great importance to modern sciences, being particularly relevant in biomedicine. An ideal image sensor should be usable through all the electromagnetic spectrum (large…
Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…
Inpainting-based image compression is a promising alternative to classical transform-based lossy codecs. Typically it stores a carefully selected subset of all pixel locations and their colour values. In the decoding phase the missing…
Limitations on bandwidth and power consumption impose strict bounds on data rates of diagnostic imaging systems. Consequently, the design of suitable (i.e. task- and data-aware) compression and reconstruction techniques has attracted…
A simple, yet general, formalism for the optimized linear combination of astrophysical images is constructed and demonstrated. The formalism allows the user to combine multiple undersampled images to provide oversampled output at high…
Compressive sensing (CS) combines data acquisition with compression coding to reduce the number of measurements required to reconstruct a sparse signal. In optics, this usually takes the form of projecting the field onto sequences of random…
Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…
A sampling theorem on the sphere has been developed recently, requiring half as many samples as alternative equiangular sampling theorems on the sphere. A reduction by a factor of two in the number of samples required to represent a…
The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…
The paper focuses on Image Compression, explaining efficient approaches based on Frequent Pattern Mining(FPM). The proposed compression mechanism is based on clustering similar pixels in the image and thus using cluster identifiers in image…
Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules. A regular task of STM image…
Compressed sensing (CS) MRI relies on adequate undersampling of the k-space to accelerate the acquisition without compromising image quality. Consequently, the design of optimal sampling patterns for these k-space coefficients has received…
This work reveals an experimental microscopy acquisition scheme successfully combining Compressed Sensing (CS) and digital holography in off-axis and frequency-shifting conditions. CS is a recent data acquisition theory involving signal…
Inpainting, for filling missing image regions, is a crucial task in various applications, such as medical imaging and remote sensing. Trending data-driven approaches efficiency, for image inpainting, often requires extensive data…
Advances in techniques for thermal sampling in classical and quantum systems would deepen understanding of the underlying physics. Unfortunately, one often has to rely solely on inexact numerical simulation, due to the intractability of…
We present methods that can provide an exponential savings in the resources required to perform dynamic parameter estimation using quantum systems. The key idea is to merge classical compressive sensing techniques with quantum control…
Beam damage is a major limitation in electron microscopy that becomes increasingly severe at higher resolution. One possible route to circumvent radiation damage, which forms the basis for single-particle electron microscopy and related…
Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of…
Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration…