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Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…

Machine Learning · Computer Science 2024-06-11 Tobias Schlosser , Frederik Beuth , Michael Friedrich , Danny Kowerko

Defect detection is a basic and essential task in automatic parts production, especially for automotive engine precision parts. In this paper, we propose a new idea to construct a deep convolutional network combining related knowledge of…

Computer Vision and Pattern Recognition · Computer Science 2018-10-30 Zhenshen Qu , Jianxiong Shen , Ruikun Li , Junyu Liu , Qiuyu Guan

Overhead line inspection greatly benefits from defect recognition using visible light imagery. Addressing the limitations of existing feature extraction techniques and the heavy data dependency of deep learning approaches, this paper…

Computer Vision and Pattern Recognition · Computer Science 2023-12-08 Weixi Wang , Xichen Zhong , Xin Li , Sizhe Li , Xun Ma

In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low…

Machine Learning · Computer Science 2025-04-25 Cheng Shen , Yuewei Liu

Industrial surface defect detection (SDD) is critical for ensuring product quality and manufacturing reliability. Due to the diverse shapes and sizes of surface defects, SDD faces two main challenges: intraclass difference and interclass…

Computer Vision and Pattern Recognition · Computer Science 2025-11-27 Yuxi Liu , Yunfeng Ma , Yi Tang , Min Liu , Shuai Jiang , Yaonan Wang

Surface inspection systems are an important application domain for computer vision, as they are used for defect detection and classification in the manufacturing industry. Existing systems use hand-crafted features which require extensive…

Image and Video Processing · Electrical Eng. & Systems 2019-04-10 Selim Arikan , Kiran Varanasi , Didier Stricker

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

Computer Vision and Pattern Recognition · Computer Science 2022-11-07 Bappaditya Dey , Enrique Dehaerne , Kasem Khalil , Sandip Halder , Philippe Leray , Magdy A. Bayoumi

Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in…

Computer Vision and Pattern Recognition · Computer Science 2023-11-09 Arti Kumbhar , Amruta Chougule , Priya Lokhande , Saloni Navaghane , Aditi Burud , Saee Nimbalkar

As of today, the best accuracy in line segment detection (LSD) is achieved by algorithms based on convolutional neural networks - CNNs. Unfortunately, these methods utilize deep, heavy networks and are slower than traditional model-based…

Computer Vision and Pattern Recognition · Computer Science 2022-09-13 Lev Teplyakov , Leonid Erlygin , Evgeny Shvets

Defect detection is one of the most important yet challenging tasks in the quality control stage in the manufacturing sector. In this work, we introduce a Tensor Convolutional Neural Network (T-CNN) and examine its performance on a real…

Computer Vision and Pattern Recognition · Computer Science 2024-04-29 Pablo Martin-Ramiro , Unai Sainz de la Maza , Sukhbinder Singh , Roman Orus , Samuel Mugel

Quality control is a fundamental component of many manufacturing processes, especially those involving casting or welding. However, manual quality control procedures are often time-consuming and error-prone. In order to meet the growing…

Computer Vision and Pattern Recognition · Computer Science 2018-09-05 Max Ferguson , Ronay Ak , Yung-Tsun Tina Lee , Kincho H. Law

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

Computer Vision and Pattern Recognition · Computer Science 2023-08-17 Vic De Ridder , Bappaditya Dey , Sandip Halder , Bartel Van Waeyenberge

Current CNN-based infrared small target detection(IRSTD) methods generally overlook the heterogeneity between shallow and deep features, leading to inefficient collaboration between shallow fine grained structural information and deep…

Computer Vision and Pattern Recognition · Computer Science 2025-07-29 Taoran Yue , Xiaojin Lu , Jiaxi Cai , Yuanping Chen , Shibing Chu

Continual shrinking of pattern dimensions in the semiconductor domain is making it increasingly difficult to inspect defects due to factors such as the presence of stochastic noise and the dynamic behavior of defect patterns and types.…

Computer Vision and Pattern Recognition · Computer Science 2023-08-16 Vic De Ridder , Bappaditya Dey , Enrique Dehaerne , Sandip Halder , Stefan De Gendt , Bartel Van Waeyenberge

A current trend in industries such as semiconductors and foundry is to shift their visual inspection processes to Automatic Visual Inspection (AVI) systems, to reduce their costs, mistakes, and dependency on human experts. This paper…

Computer Vision and Pattern Recognition · Computer Science 2021-09-22 Masoud Jalayer , Reza Jalayer , Amin Kaboli , Carlotta Orsenigo , Carlo Vercellis

Due to the rapid development of IoT technology, automatic guided vehicles (AGVs) interact with an industrial control system (ICS) through the wireless network to support the freight distribution in the automated warehouse. However, the…

Networking and Internet Architecture · Computer Science 2020-06-04 Ting-Cian Bai , Chin-Ya Huang

We propose an object detection method that improves the accuracy of the conventional SSD (Single Shot Multibox Detector), which is one of the top object detection algorithms in both aspects of accuracy and speed. The performance of a deep…

Computer Vision and Pattern Recognition · Computer Science 2017-11-07 Jisoo Jeong , Hyojin Park , Nojun Kwak

In electronics manufacturing, solder joint defects are a common problem affecting a variety of printed circuit board components. To identify and correct solder joint defects, the solder joints on a circuit board are typically inspected…

Computer Vision and Pattern Recognition · Computer Science 2022-11-21 Hayden Gunraj , Paul Guerrier , Sheldon Fernandez , Alexander Wong

Accurate Defect detection is crucial for ensuring the trustworthiness of intelligent railway systems. Current approaches rely on single deep-learning models, like CNNs, which employ a large amount of data to capture underlying patterns.…

Computer Vision and Pattern Recognition · Computer Science 2023-11-28 Rahatara Ferdousi , Fedwa Laamarti , Chunsheng Yang , Abdulmotaleb El Saddik

Solid-State Drives (SSDs) have significant performance advantages over traditional Hard Disk Drives (HDDs) such as lower latency and higher throughput. Significantly higher price per capacity and limited lifetime, however, prevents…

Hardware Architecture · Computer Science 2021-11-08 Shahriar Ebrahimi , Reza Salkhordeh , Seyed Ali Osia , Ali Taheri , Hamid Reza Rabiee , Hossein Asadi
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