English
Related papers

Related papers: Deep Learning-Based Defect Classification and Dete…

200 papers

A deep convolutional neural network has been developed to denoise atomic-resolution TEM image datasets of nanoparticles acquired using direct electron counting detectors, for applications where the image signal is severely limited by shot…

Recording atomic-resolution transmission electron microscopy (TEM) images is becoming increasingly routine. A new bottleneck is then analyzing this information, which often involves time-consuming manual structural identification. We have…

Image segmentation is fundamental to microstructural analysis for defect identification and structure-property correlation, yet remains challenging due to pronounced heterogeneity in materials images arising from varied processing and…

Computer Vision and Pattern Recognition · Computer Science 2026-03-17 Sanjeev S. Navaratna , Nikhil Thawari , Gunashekhar Mari , Amritha V P , Murugaiyan Amirthalingam , Rohit Batra

The security of deep learning (DL) systems is an extremely important field of study as they are being deployed in several applications due to their ever-improving performance to solve challenging tasks. Despite overwhelming promises, the…

Machine Learning · Computer Science 2022-08-19 Manaar Alam , Shubhajit Datta , Debdeep Mukhopadhyay , Arijit Mondal , Partha Pratim Chakrabarti

<<<This is a pre-acceptance version, please, go through Pattern Recognition Journal on Sciencedirect to read the final version>>>. Edge detection is the basis of many computer vision applications. State of the art predominantly relies on…

Computer Vision and Pattern Recognition · Computer Science 2023-02-28 Xavier Soria , Angel Sappa , Patricio Humanante , Arash Akbarinia

With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…

Computer Vision and Pattern Recognition · Computer Science 2023-08-17 Vic De Ridder , Bappaditya Dey , Sandip Halder , Bartel Van Waeyenberge

This work is addressing the problem of defect anomaly detection based on a clean reference image. Specifically, we focus on SEM semiconductor defects in addition to several natural image anomalies. There are well-known methods to create a…

Computer Vision and Pattern Recognition · Computer Science 2023-03-22 Nati Ofir , Yotam Ben Shoshan , Ran Badanes , Boris Sherman

Defect engineering has been profoundly employed to confer desirable functionality to materials that pristine lattices inherently lack. Although single atomic-resolution scanning transmission electron microscopy (STEM) images are widely…

The semi-airborne transient electromagnetic method (SATEM) is capable of conducting rapid surveys over large-scale and hard-to-reach areas. However, the acquired signals are often contaminated by complex noise, which can compromise the…

Machine Learning · Computer Science 2025-03-31 Shuang Wang , Ming Guo , Xuben Wang , Fei Deng , Lifeng Mao , Bin Wang , Wenlong Gao

Deep learning based image segmentation has achieved the state-of-the-art performance in many medical applications such as lesion quantification, organ detection, etc. However, most of the methods rely on supervised learning, which require a…

Computer Vision and Pattern Recognition · Computer Science 2020-04-20 Ruizhe Li , Dorothee Auer , Christian Wagner , Xin Chen

Skin lesions are an increasingly significant medical concern, varying widely in severity from benign to cancerous. Accurate diagnosis is essential for ensuring timely and appropriate treatment. This study examines the implementation of deep…

Computer Vision and Pattern Recognition · Computer Science 2024-09-09 Xiaoyi Liu , Zhou Yu , Lianghao Tan , Yafeng Yan , Ge Shi

Data-driven discovery of partial differential equations (PDEs) has attracted increasing attention in recent years. Although significant progress has been made, certain unresolved issues remain. For example, for PDEs with high-order…

Machine Learning · Computer Science 2021-09-14 Hao Xu , Dongxiao Zhang , Nanzhe Wang

Visual quality inspection in high performance manufacturing can benefit from automation, due to cost savings and improved rigor. Deep learning techniques are the current state of the art for generic computer vision tasks like classification…

Computer Vision and Pattern Recognition · Computer Science 2023-05-17 Ahmad Mohamad Mezher , Andrew E. Marble

Traditional machine learning approaches may fail to perform satisfactorily when dealing with complex data. In this context, the importance of data mining evolves w.r.t. building an efficient knowledge discovery and mining framework.…

Computer Vision and Pattern Recognition · Computer Science 2020-08-04 Abdul Mueed Hafiz , Ghulam Mohiuddin Bhat

Large training datasets almost always contain examples with inaccurate or incorrect labels. Deep Neural Networks (DNNs) tend to overfit training label noise, resulting in poorer model performance in practice. To address this problem, we…

Computer Vision and Pattern Recognition · Computer Science 2022-03-01 Chen Gong , Kong Bin , Eric J. Seibel , Xin Wang , Youbing Yin , Qi Song

Label noise in training data can significantly degrade a model's generalization performance for supervised learning tasks. Here we focus on the problem that noisy labels are primarily mislabeled samples, which tend to be concentrated near…

Machine Learning · Computer Science 2021-03-16 Hao-Chiang Shao , Hsin-Chieh Wang , Weng-Tai Su , Chia-Wen Lin

Deep neural network ensembles hold the potential of improving generalization performance for complex learning tasks. This paper presents formal analysis and empirical evaluation to show that heterogeneous deep ensembles with high ensemble…

Computer Vision and Pattern Recognition · Computer Science 2023-10-04 Yanzhao Wu , Ka-Ho Chow , Wenqi Wei , Ling Liu

Machine learning-based Deepfake detection models have achieved impressive results on benchmark datasets, yet their performance often deteriorates significantly when evaluated on out-of-distribution data. In this work, we investigate an…

Computer Vision and Pattern Recognition · Computer Science 2025-07-09 Haroon Wahab , Hassan Ugail , Lujain Jaleel

Recently, deep learning-based image denoising methods have achieved promising performance on test data with the same distribution as training set, where various denoising models based on synthetic or collected real-world training data have…

Computer Vision and Pattern Recognition · Computer Science 2022-06-09 Pengju Liu , Hongzhi Zhang , Jinghui Wang , Yuzhi Wang , Dongwei Ren , Wangmeng Zuo

In recent years, deep learning-based image compression, particularly through generative models, has emerged as a pivotal area of research. Despite significant advancements, challenges such as diminished sharpness and quality in…

Image and Video Processing · Electrical Eng. & Systems 2024-09-18 Ryugo Morita , Hitoshi Nishimura , Ko Watanabe , Andreas Dengel , Jinjia Zhou