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Learning the distance metric between pairs of examples is of great importance for learning and visual recognition. With the remarkable success from the state of the art convolutional neural networks, recent works have shown promising…

Computer Vision and Pattern Recognition · Computer Science 2015-11-23 Hyun Oh Song , Yu Xiang , Stefanie Jegelka , Silvio Savarese

Deep metric learning maps visually similar images onto nearby locations and visually dissimilar images apart from each other in an embedding manifold. The learning process is mainly based on the supplied image negative and positive training…

Computer Vision and Pattern Recognition · Computer Science 2020-09-14 Chang-Hui Liang , Wan-Lei Zhao , Run-Qing Chen

We propose a semantic similarity metric for image registration. Existing metrics like Euclidean Distance or Normalized Cross-Correlation focus on aligning intensity values, giving difficulties with low intensity contrast or noise. Our…

Machine Learning · Computer Science 2021-04-21 Steffen Czolbe , Oswin Krause , Aasa Feragen

Deep metric learning is an important area due to its applicability to many domains such as image retrieval and person re-identification. The main drawback of such models is the necessity for labeled data. In this work, we propose to…

Computer Vision and Pattern Recognition · Computer Science 2019-11-19 Xuefei Cao , Bor-Chun Chen , Ser-Nam Lim

Image retrieval methods rely on metric learning to train backbone feature extraction models that can extract discriminant queries and reference (gallery) feature representations for similarity matching. Although state-of-the-art accuracy…

Computer Vision and Pattern Recognition · Computer Science 2024-12-12 Madhu Kiran , Kartikey Vishnu , Rafael M. O. Cruz , Eric Granger

Managing the dynamic regions in the photometric loss formulation has been a main issue for handling the self-supervised depth estimation problem. Most previous methods have alleviated this issue by removing the dynamic regions in the…

Computer Vision and Pattern Recognition · Computer Science 2022-05-23 Geonho Cha , Ho-Deok Jang , Dongyoon Wee

Deep embeddings answer one simple question: How similar are two images? Learning these embeddings is the bedrock of verification, zero-shot learning, and visual search. The most prominent approaches optimize a deep convolutional network…

Computer Vision and Pattern Recognition · Computer Science 2018-01-17 Chao-Yuan Wu , R. Manmatha , Alexander J. Smola , Philipp Krähenbühl

In deep metric learning (DML), high-level input data are represented in a lower-level representation (embedding) space, such that samples from the same class are mapped close together, while samples from disparate classes are mapped further…

Computer Vision and Pattern Recognition · Computer Science 2023-04-03 Ryan Furlong , Vincent O'Brien , James Garland , Daniel Palacios-Alonso , Francisco Dominguez-Mateos

Learning fine-grained image similarity is a challenging task. It needs to capture between-class and within-class image differences. This paper proposes a deep ranking model that employs deep learning techniques to learn similarity metric…

Computer Vision and Pattern Recognition · Computer Science 2014-04-21 Jiang Wang , Yang song , Thomas Leung , Chuck Rosenberg , Jinbin Wang , James Philbin , Bo Chen , Ying Wu

Image classification is a fundamental computer vision task and an important baseline for deep metric learning. In decades efforts have been made on enhancing image classification accuracy by using deep learning models while less attention…

Computer Vision and Pattern Recognition · Computer Science 2025-01-14 Yunfeng Zhao , Huiyu Zhou , Fei Wu , Xifeng Wu

This paper introduces a novel approach to evaluating deep learning models' capacity for in-diagram logic interpretation. Leveraging the intriguing realm of visual illusions, we establish a unique dataset, InDL, designed to rigorously test…

Computer Vision and Pattern Recognition · Computer Science 2023-06-07 Haobo Yang , Wenyu Wang , Ze Cao , Zhekai Duan , Xuchen Liu

Deep Metric Learning (DML) plays a critical role in various machine learning tasks. However, most existing deep metric learning methods with binary similarity are sensitive to noisy labels, which are widely present in real-world data. Since…

Computer Vision and Pattern Recognition · Computer Science 2021-11-02 Jiexi Yan , Lei Luo , Cheng Deng , Heng Huang

Meta-learning that uses implicit gradient have provided an exciting alternative to standard techniques which depend on the trajectory of the inner loop training. Implicit meta-learning (IML), however, require computing $2^{nd}$ order…

Machine Learning · Computer Science 2023-10-31 Fady Rezk

Geometric shape features have been widely used as strong predictors for image classification. Nevertheless, most existing classifiers such as deep neural networks (DNNs) directly leverage the statistical correlations between these shape…

Computer Vision and Pattern Recognition · Computer Science 2024-11-20 Tonmoy Hossain , Jing Ma , Jundong Li , Miaomiao Zhang

Deep neural networks trained for classification have been found to learn powerful image representations, which are also often used for other tasks such as comparing images w.r.t. their visual similarity. However, visual similarity does not…

Computer Vision and Pattern Recognition · Computer Science 2019-07-24 Björn Barz , Joachim Denzler

To solve deep metric learning problems and producing feature embeddings, current methodologies will commonly use a triplet model to minimise the relative distance between samples from the same class and maximise the relative distance…

Computer Vision and Pattern Recognition · Computer Science 2017-07-28 Ben Harwood , Vijay Kumar B G , Gustavo Carneiro , Ian Reid , Tom Drummond

Metric learning aims to embed one metric space into another to benefit tasks like classification and clustering. Although a greatly distorted metric space has a high degree of freedom to fit training data, it is prone to overfitting and…

Machine Learning · Computer Science 2015-05-12 Renjie Liao , Jianping Shi , Ziyang Ma , Jun Zhu , Jiaya Jia

Accurately quantifying uncertainty in large language models (LLMs) is crucial for their reliable deployment, especially in high-stakes applications. Current state-of-the-art methods for measuring semantic uncertainty in LLMs rely on strict…

Machine Learning · Computer Science 2024-10-31 Yashvir S. Grewal , Edwin V. Bonilla , Thang D. Bui

Remote sensing image segmentation faces persistent challenges in distinguishing morphologically similar categories and adapting to diverse scene variations. While existing methods rely on implicit representation learning paradigms, they…

Computer Vision and Pattern Recognition · Computer Science 2025-03-11 Xuechao Zou , Yue Li , Shun Zhang , Kai Li , Shiying Wang , Pin Tao , Junliang Xing , Congyan Lang

Deep Metric Learning trains a neural network to map input images to a lower-dimensional embedding space such that similar images are closer together than dissimilar images. When used for item retrieval, a query image is embedded using the…

Computer Vision and Pattern Recognition · Computer Science 2022-10-05 Konstantin Kobs , Andreas Hotho