Related papers: A Continual Learning Framework for Adaptive Defect…
Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose…
Leather is a type of natural, durable, flexible, soft, supple and pliable material with smooth texture. It is commonly used as a raw material to manufacture luxury consumer goods for high-end customers. To ensure good quality control on the…
New production techniques have emerged that have made it possible to produce metal parts with more complex shapes, making the quality control process more difficult. This implies that the visual and superficial analysis has become even more…
Maintaining sewer systems in large cities is important, but also time and effort consuming, because visual inspections are currently done manually. To reduce the amount of aforementioned manual work, defects within sewer pipes should be…
State-of-the-art machine learning models require access to significant amount of annotated data in order to achieve the desired level of performance. While unlabelled data can be largely available and even abundant, annotation process can…
Automatic detection of visual anomalies and changes in the environment has been a topic of recurrent attention in the fields of machine learning and computer vision over the past decades. A visual anomaly or change detection algorithm…
Machine learning models are essential tools in various domains, but their performance can degrade over time due to changes in data distribution or other factors. On one hand, detecting and addressing such degradations is crucial for…
Given a (machine learning) classifier and a collection of unlabeled data, how can we efficiently identify misclassification patterns presented in this dataset? To address this problem, we propose a human-machine collaborative framework that…
Visual inspection is the predominant technique for evaluating the condition of civil infrastructure. The recent advances in unmanned aerial vehicles (UAVs) and artificial intelligence have made the visual inspections faster, safer, and more…
Traditional discriminative computer vision relies predominantly on static projections, mapping input features to outputs in a single computational step. Although efficient, this paradigm lacks the iterative refinement and robustness…
Roads are an essential mode of transportation, and maintaining them is critical to economic growth and citizen well-being. With the continued advancement of AI, road surface inspection based on camera images has recently been extensively…
Anomaly detection based on 3D point cloud data is an important research problem and receives more and more attention recently. Untrained anomaly detection based on only one sample is an emerging research problem motivated by real…
This paper presents a CAD-based approach for automated surface defect detection. We leverage the a-priori knowledge embedded in a CAD model and integrate it with point cloud data acquired from commercially available stereo and depth…
This paper investigates a general framework to discover categories of unlabeled scene images according to their appearances (i.e., textures and structures). We jointly solve the two coupled tasks in an unsupervised manner: (i) classifying…
Machine Learning approaches are good in solving problems that have less information. In most cases, the software domain problems characterize as a process of learning that depend on the various circumstances and changes accordingly. A…
Recent multi-modal contrastive learning models have demonstrated the ability to learn an embedding space suitable for building strong vision classifiers, by leveraging the rich information in large-scale image-caption datasets. Our work…
Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…
As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the…
This paper proposes inverse feature learning as a novel supervised feature learning technique that learns a set of high-level features for classification based on an error representation approach. The key contribution of this method is to…
We present a framework for efficient perceptual inference that explicitly reasons about the segmentation of its inputs and features. Rather than being trained for any specific segmentation, our framework learns the grouping process in an…