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Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose…

Computer Vision and Pattern Recognition · Computer Science 2025-03-28 Jaewoo Song , Daemin Park , Kanghyun Baek , Sangyub Lee , Jooyoung Choi , Eunji Kim , Sungroh Yoon

Leather is a type of natural, durable, flexible, soft, supple and pliable material with smooth texture. It is commonly used as a raw material to manufacture luxury consumer goods for high-end customers. To ensure good quality control on the…

Computer Vision and Pattern Recognition · Computer Science 2019-05-29 Sze-Teng Liong , Y. S. Gan , Yen-Chang Huang , Kun-Hong Liu , Wei-Chuen Yau

New production techniques have emerged that have made it possible to produce metal parts with more complex shapes, making the quality control process more difficult. This implies that the visual and superficial analysis has become even more…

Computer Vision and Pattern Recognition · Computer Science 2022-03-01 Francisco Javier Yagüe , Jose Francisco Diez-Pastor , Pedro Latorre-Carmona , Cesar Ignacio Garcia Osorio

Maintaining sewer systems in large cities is important, but also time and effort consuming, because visual inspections are currently done manually. To reduce the amount of aforementioned manual work, defects within sewer pipes should be…

Computer Vision and Pattern Recognition · Computer Science 2024-04-10 Bach Ha , Birgit Schalter , Laura White , Joachim Koehler

State-of-the-art machine learning models require access to significant amount of annotated data in order to achieve the desired level of performance. While unlabelled data can be largely available and even abundant, annotation process can…

Machine Learning · Computer Science 2020-10-15 Rahaf Aljundi , Nikolay Chumerin , Daniel Olmeda Reino

Automatic detection of visual anomalies and changes in the environment has been a topic of recurrent attention in the fields of machine learning and computer vision over the past decades. A visual anomaly or change detection algorithm…

Computer Vision and Pattern Recognition · Computer Science 2022-09-07 Sahar Salimpour , Jorge Peña Queralta , Tomi Westerlund

Machine learning models are essential tools in various domains, but their performance can degrade over time due to changes in data distribution or other factors. On one hand, detecting and addressing such degradations is crucial for…

Machine Learning · Computer Science 2023-09-28 Florian Heinrichs

Given a (machine learning) classifier and a collection of unlabeled data, how can we efficiently identify misclassification patterns presented in this dataset? To address this problem, we propose a human-machine collaborative framework that…

Machine Learning · Computer Science 2023-12-20 Bao Nguyen , Viet Anh Nguyen

Visual inspection is the predominant technique for evaluating the condition of civil infrastructure. The recent advances in unmanned aerial vehicles (UAVs) and artificial intelligence have made the visual inspections faster, safer, and more…

Image and Video Processing · Electrical Eng. & Systems 2022-10-25 Kareem Eltouny , Seyedomid Sajedi , Xiao Liang

Traditional discriminative computer vision relies predominantly on static projections, mapping input features to outputs in a single computational step. Although efficient, this paradigm lacks the iterative refinement and robustness…

Computer Vision and Pattern Recognition · Computer Science 2026-03-17 Om Govind Jha , Manoj Bamniya , Ayon Borthakur

Roads are an essential mode of transportation, and maintaining them is critical to economic growth and citizen well-being. With the continued advancement of AI, road surface inspection based on camera images has recently been extensively…

Computer Vision and Pattern Recognition · Computer Science 2024-07-16 Linh Trinh , Ali Anwar , Siegfried Mercelis

Anomaly detection based on 3D point cloud data is an important research problem and receives more and more attention recently. Untrained anomaly detection based on only one sample is an emerging research problem motivated by real…

Machine Learning · Computer Science 2025-07-29 Juan Du , Dongheng Chen

This paper presents a CAD-based approach for automated surface defect detection. We leverage the a-priori knowledge embedded in a CAD model and integrate it with point cloud data acquired from commercially available stereo and depth…

Computer Vision and Pattern Recognition · Computer Science 2025-01-31 Matteo Dalle Vedove , Matteo Bonetto , Edoardo Lamon , Luigi Palopoli , Matteo Saveriano , Daniele Fontanelli

This paper investigates a general framework to discover categories of unlabeled scene images according to their appearances (i.e., textures and structures). We jointly solve the two coupled tasks in an unsupervised manner: (i) classifying…

Computer Vision and Pattern Recognition · Computer Science 2015-02-03 Liang Lin , Ruimao Zhang , Xiaohua Duan

Machine Learning approaches are good in solving problems that have less information. In most cases, the software domain problems characterize as a process of learning that depend on the various circumstances and changes accordingly. A…

Software Engineering · Computer Science 2015-06-26 Saiqa Aleem , Luiz Fernando Capretz , Faheem Ahmed

Recent multi-modal contrastive learning models have demonstrated the ability to learn an embedding space suitable for building strong vision classifiers, by leveraging the rich information in large-scale image-caption datasets. Our work…

Machine Learning · Computer Science 2023-02-09 Yuhui Zhang , Jeff Z. HaoChen , Shih-Cheng Huang , Kuan-Chieh Wang , James Zou , Serena Yeung

Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…

Computer Vision and Pattern Recognition · Computer Science 2025-06-05 Chien-Fu , Huang , Katherine Sieg , Leonid Karlinksy , Nash Flores , Rebekah Sheraw , Xin Zhang

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the…

Computer Vision and Pattern Recognition · Computer Science 2023-11-23 Qiyu Wei , Wei Zhao , Xiaoyan Zheng , Zeng Zeng

This paper proposes inverse feature learning as a novel supervised feature learning technique that learns a set of high-level features for classification based on an error representation approach. The key contribution of this method is to…

Machine Learning · Computer Science 2020-03-10 Behzad Ghazanfari , Fatemeh Afghah , MohammadTaghi Hajiaghayi

We present a framework for efficient perceptual inference that explicitly reasons about the segmentation of its inputs and features. Rather than being trained for any specific segmentation, our framework learns the grouping process in an…

Computer Vision and Pattern Recognition · Computer Science 2016-11-29 Klaus Greff , Antti Rasmus , Mathias Berglund , Tele Hotloo Hao , Jürgen Schmidhuber , Harri Valpola
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