Related papers: Angular X-ray Cross-Correlation Analysis Applied t…
Angular x-ray cross-correlation analysis (AXCCA) is a technique which allows quantitative measurement of the angular anisotropy of x-ray diffraction patterns and provides insights into the orientational order in the system under…
Angular x-ray cross-correlation analysis (XCCA) is an approach to study the structure of disordered systems using the results of x-ray scattering experiments. In this paper we summarize recent theoretical developments related to the Fourier…
Angular x-ray cross-correlation analysis (XCCA) is an approach to study the structure of disordered systems using the results of coherent x-ray scattering experiments. Here, we present the results of simulations that validate our…
We applied the analysis of x-ray intensity angular correlation function to dilute ensembles of identical spinel crystals. Firstly, we show that the angular correlation from measured diffraction patterns with many crystals per shot converges…
We applied angular X-ray Cross-Correlation analysis (XCCA) to scattering images from a femtosecond resolution LCLS X-ray free-electron laser (XFEL) pump-probe experiment with solvated PtPOP ([Pt$_2$(P$_2$O$_5$H$_2$)$_4$]$^{4-}$) metal…
In a recent article (P.Wochner et al., PNAS (2009)) x-ray scattering intensity correlations around a ring, in the speckle diffraction pattern of a colloidal glass, were shown to display a remarkable ~ cos(n $\phi$) dependence on the angular…
A coherent x-ray diffraction experiment was performed on an isolated colloidal crystal grain at the coherence beamline P10 at PETRA III. Using azimuthal rotation scans the three-dimensional (3D) scattered intensity in reciprocal space from…
Established x-ray diffraction methods allow for high-resolution structure determination of crystals, crystallized protein structures or even single molecules. While these techniques rely on coherent scattering, incoherent processes like…
An application of resonant inelastic x-ray scattering technique for studying of optical scale excitations in electron-correlated materials is discussed. Examples are given including data obtained for 3d transition metal, lanthanide, and…
The diffraction patterns of crystalline materials with local order contain sharp Bragg reflections as well as highly structured diffuse scattering. The instrumental requirements, experimental parameters and data processing techniques for…
X-ray crystallography (XC) is an experimental technique used to determine three-dimensional crystalline structures. The acquired data in XC, called diffraction patterns, is the Fourier magnitudes of the unknown crystalline structure. To…
We show that the combination of X-ray scattering with a nanofocused beam and X-ray cross correlation analysis is an efficient means for the full structural characterization of mesocrystalline nanoparticle assemblies with a single…
A reciprocal space formulation of the Cluster Variation is used in order to extract effective pair interactions in alloys from experimental short-range order diffuse intensities. The method is applied to the analysis of the short range…
A general formalism of X-ray scattering from different kinds of surface morphologies is described. Based on a description of the surface morphology at the atomic scale through the use of the paracrystal model and discrete distributions of…
A spherical tensor expansion is carried out to express the resonant inelastic scattering cross-section as a sum of products of fundamental spectra with tensors involving wavevectors and polarization vectors of incident and scattered…
Resonant Inelastic X-ray scattering (RIXS) is a synchrotron-based spectroscopy that has seen growing interest across a range of scientific disciplines beyond fundamental physics. The interpretation of experimental RIXS data requires…
The angular correlation is a method for measuring the distribution of structure in the Universe, through the statistical properties of the angular distribution of galaxies on the sky. We measure the angular correlation of galaxies from the…
Experimentally obtained X-ray diffraction (XRD) patterns can be difficult to solve, precluding the full characterization of materials, pharmaceuticals, and geological compounds. Herein, we propose a method based upon a multi-objective…
This paper considers the refraction and diffraction of waves in three-dimensional crystals formed by anisotropically scattering centers. The partial wave expansion method is used to consider the effect of multiple rescattering of waves by…
The spherically bent crystal analyzer (SBCA) is a widely-adopted hard x-ray optic, renowned for its good energy resolution and large collection solid angle. It is frequently employed in synchrotron-based techniques like Resonant Inelastic…