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Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
longitudinal magnetic field often suffers the saturation effect in strong magnetic field region when the measurement performs in a single-wavelength point and linear calibration is adopted. In this study, we develop a method that can judge…
Multi-dielectric coated coverslip can be designed to reach large optical field enhancements when working under proper illumination conditions and in total internal reflection. In an objective-based total internal reflection fluorescence…
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…
We investigate the potential to use a magneto-thermo-electric instability that may be induced in a mesoscopic magnetic multi-layer (F/f/F) to create and control magnetic superstructures. In the studied multilayer two strongly ferromagnetic…
This is the second of three papers describing an `absolute' calibration of the GONG magnetograph using an end-to-end simulation of its measurement process. In the first paper, we described the GONG instrument and our `end-to-end' simulation…
Multiresolution Matrix Factorization (MMF) was recently introduced as a method for finding multiscale structure and defining wavelets on graphs/matrices. In this paper we derive pMMF, a parallel algorithm for computing the MMF…
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…
A DC non-contact method for measuring the magnetostrictive strain in thin-films is demonstrated, achieving a state-of-the-art sensitivity of 0.1 ppm. In this method, an optical profilometer is used to measure the curvature induced in a…
As mechanical devices in the nano/micro length scale are increasingly employed, it is crucial to understand nanoscale friction and wear especially at technically relevant sliding velocities. Accordingly, a novel technique has been developed…
We report the local measurements of the magnetic penetration depth $\lambda$ in a superconducting Nb film using magnetic force microscopy (MFM). We developed a method for quantitative extraction of the penetration depth from…
Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing…
The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…
While quantum state tomography (QST) remains the gold standard for benchmarking and verifying quantum devices, it requires an exponentially large number of measurements and classical computational resources for generic quantum many-body…
Capacitance measurements are crucial for probing the electrical properties of materials. In this study, we develop and implement a capacitance measurement technique optimized for pulsed magnetic fields. Our approach employs an…
The multislice method, which simulates the propagation of the incident electron wavefunction through a crystal, is a well-established method for analyzing the multiple scattering effects that an electron beam may undergo. The inclusion of…
Magnetic Particle Imaging (MPI) is a novel medical imaging modality. One of the established methods for MPI reconstruction is based on the System Matrix (SM). However, the calibration of the SM is often time-consuming and requires repeated…
Atomic force microscopy (AFM) can be used to characterise several aspects of the surface degradation and reinforcement mechanisms of zirconia based ceramics, such as crack propagation, martensitic relief formation, grains pull-out and…
Current density distributions in active integrated circuits (ICs) result in patterns of magnetic fields that contain structural and functional information about the IC. Magnetic fields pass through standard materials used by the…
Primordial magnetic fields (PMFs) offer a compelling explanation for the origin of observed magnetic fields, especially on extragalactic scales. Such PMFs give rise to excess of power in small scale matter perturbations that could strongly…