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We propose an inverse-design approach for computational spectrometers in which the scattering media are topology-optimized to achieve better performance in inference of unknown spectra. Unlike traditional end-to-end approaches, our inverse…
The practical strength of oxide glasses is greatly reduced by surface flaws that form during processing and use. Instrumented indentation can mimic such real-life damage events and induce flaws and cracking under controlled conditions. At…
The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next generation integrated electronic circuits. Modern transistor architectures for e.g. FinFETs…
Scatterometry is a fast, indirect and nondestructive optical method for the quality control in the production of lithography masks. Geometry parameters of line gratings are obtained from diffracted light intensities by solving an inverse…
It has been a widely growing interest in using silicon carbide (SiC)in high-power electronic devices. Yet, SiC wafers may contain killer defects that could reduce fabrication yield and make the device fall into unexpected failures. To…
Scattering often limits the controlled delivery of light in applications such as biomedical imaging, optogenetics, optical trapping, and fiber-optic communication or imaging. Such scattering can be controlled by appropriately shaping the…
This paper provides a novel approach to stitching surface images of rotationally symmetric parts. It presents a process pipeline that uses a feature-based stitching approach to create a distortion-free and true-to-life image from a video…
Compared to single-source imaging systems, dual-source imaging systems equipped with two cross-distributed scanning beams significantly enhance temporal resolution and capture more comprehensive object scanning information. Nevertheless,…
The Intelligent Fault Diagnosis of rotating machinery currently proposes some captivating challenges. Although results achieved by artificial intelligence and deep learning constantly improve, this field is characterized by several open…
Nanoscale optoelectronic components achieve functionality via spatial variation in electronic structure induced by composition, defects, and dopants. To dynamically change the local band alignment and influence defect states, a scanning…
The ability to design the scattering properties of electromagnetic structures is of fundamental interest in optical science and engineering. While there has been great practical success applying local optimization methods to electromagnetic…
Interferometric scattering microscopy (iSCAT) can image the dynamics of nanometer-scale systems. The typical approach to analyzing interferometric images involves intensive processing, which discards data and limits the precision of…
Optical metasurfaces performing analog image processing - such as spatial differentiation and edge detection - hold the potential to reduce processing times and power consumption, while avoiding bulky 4F lens systems. However, current…
Compact spectrometers based on disordered planar waveguides exhibit a rather high resolution with a relatively small footprint as compared to conventional spectrometers. This is achieved by multiple scattering of light which - if properly…
Direct optical detection and imaging of single nanoparticles on substrate in wide field underpin vast applications across different research fields. However, the speckles originating from the unavoidable random surface undulations of the…
We consider the inverse problem of determining the geometry of penetrable objects from scattering data generated by one incident wave at a fixed frequency. We first study an orthogonality sampling type method which is fast, simple to…
This paper introduces Spectral Incoherent Diffractive Imaging (SIDI) as a novel method for achieving dark-field imaging of nanostructures with heterogeneous oxidation states. With SIDI, shifts in photoemission profiles can be spatially…
Surface integral equations (SIEs)-based boundary element methods are widely used for analyzing electromagnetic scattering scenarii. However, after discretization of SIEs, the spectrum and eigenvectors of the boundary element matrices are…
The goal of synthetic aperture imaging is to estimate the reflectivity of a remote region of interest by processing data gathered with a moving sensor which emits periodically a signal and records the backscattered wave. We introduce and…
Accurate measurement of light wavelength is critical for applications in spectroscopy, optical communication, and semiconductor manufacturing, ensuring precision and consistency of sensing, high-speed data transmission and device…