Related papers: A Linear-Time Algorithm for Steady-State Analysis …
Traditional methodologies for analyzing electromigration (EM) in VLSI circuits first filter immortal wires using Blech's criterion, and then perform detailed EM analysis on the remaining wires. However, Blech's criterion was designed for…
In this paper, we modeled and simulated uneven current distribution for on-die interconnect structure. We show significant difference when considering uneven current distribution. Finite Element Method approach is used to analyze various…
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately predicting the time-to-failure of integrated circuits (IC)…
Reliability is a fundamental requirement in any microprocessor to guarantee correct execution over its lifetime. The design rules related to reliability depend on the process technology being used and the expected operating conditions of…
In this paper, we briefly introduce physical foundations of electromigration (EM) and present a few classical EMrelated theories. We discuss physical parameters affecting EM wire lifetime and we introduce some background related to the…
As integrated circuit technologies are moving to smaller technology nodes, Electromigration (EM) has become one of the most challenging problems facing the EDA industry. While numerical approaches have been widely deployed since they can…
In this paper, we develop a analytical model and algorithm for calculating uneven current distribution in via array structures. We propose a stress time translation formula and cumulative failure distribution equation to model the memory…
The electromigration (EM) of metallic lines is studied in terms of competition between two percolative processes taking place in a random resistor network. The effects associated with the transport of mass and with the consequent growth of…
The electronic interconnections in the state-of-the-art integrated circuit manufacturing have been scaled down to the micron or sub-micron scale. This results in a dramatic increase in the current density passing through interconnections,…
Electromigration phenomena in metallic lines are studied by using a biased resistor network model. The void formation induced by the electron wind is simulated by a stochastic process of resistor breaking, while the growth of mechanical…
Integrity and reliability of a national power grid system are essential to society's development and security. Among the power grid components, transmission lines are critical due to exposure and vulnerability to severe external conditions,…
Improving the controllability of power networks is crucial as they are highly complex networks operating in synchrony; even minor perturbations can cause desynchronization and instability. To that end, one needs to assess the criticality of…
In this paper, we propose an efficient parallelization strategy for boundary element method (BEM) solvers that perform the electromagnetic analysis of structures with lossy conductors. The proposed solver is accelerated with the adaptive…
Accurate dynamic modeling of power systems is essential to assess the stability of electrical power systems when faced with disturbances, which can trigger cascading failures leading to blackouts. A continuum model proves to be effective in…
Many electrical grid transients can be described by the propagation of electromechanical (EM) waves that couple oscillations of power flows over transmission lines and the inertia of synchronous generators. These EM waves can take several…
This paper presents the Virtual Element Method (VEM) for the modeling of crack propagation in 2D within the context of linear elastic fracture mechanics (LEFM). By exploiting the advantage of mesh flexibility in the VEM, we establish an…
Electron transfer (ET) across molecular chains including an impurity is studied based on a recently improved real-time path integral Monte Carlo (PIMC) approach [J. Chem. Phys. {\bf 121}, 12696 (2004)]. The reduced electronic dynamics is…
The procedure of comprehensive analysis of instability of current sheathes in a wide range of frequencies and wave lengths in the electrically neutral approximation has been developed. This comprehensive analysis of instability is based on…
Electrochemical impedance spectroscopy (EIS) is a widely used experimental technique for characterising materials and electrode reactions by observing their frequency-dependent impedance. Classical EIS measurements require the…
We propose an experimental methodology for probing the energy barrier inhomogeneity at the metal/semiconductor interface without the need for time-consuming microscopic survey. It is based on the known statistical nature of the interfacial…