Related papers: Compressive Scanning Transmission Electron Microsc…
Telemonitoring of electroencephalogram (EEG) through wireless body-area networks is an evolving direction in personalized medicine. Among various constraints in designing such a system, three important constraints are energy consumption,…
Compressive sensing (CS), aiming to reconstruct an image/signal from a small set of random measurements has attracted considerable attentions in recent years. Due to the high dimensionality of images, previous CS methods mainly work on…
Ultra low radiation dose in X-ray Computed Tomography (CT) is an important clinical objective in order to minimize the risk of carcinogenesis. Compressed Sensing (CS) enables significant reductions in radiation dose to be achieved by…
X-Ray Fluorescence (XRF) scanning is a widespread technique of high importance and impact since it provides chemical composition maps crucial for several scientific investigations. There are continuous requirements for larger, faster and…
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…
Region-based methods have proven necessary for improving segmentation accuracy of neuronal structures in electron microscopy (EM) images. Most region-based segmentation methods use a scoring function to determine region merging. Such…
Strain engineering is used to obtain desirable materials properties in a range of modern technologies. Direct nanoscale measurement of the three-dimensional strain tensor field within these materials has however been limited by a lack of…
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…
The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…
Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity…
Optical imaging of quantum emitters is essential for a wide range of quantum applications. Conventional confocal imaging relies on point-by-point raster scanning, which is inherently time-consuming and photon-inefficient, particularly for…
Aberration corrected scanning transmission electron microscopes (STEM) enable to determine local strain fields, composition and bonding states at atomic resolution. The precision to locate atomic columns is often obstructed by scan…
Since its discovery over the last decade, Compressed Sensing (CS) has been successfully applied to Magnetic Reso- nance Imaging (MRI). It has been shown to be a powerful way to reduce scanning time without sacrificing image quality. MR…
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…
Compressed sensing (CS) is a signal processing framework for efficiently reconstructing a signal from a small number of measurements, obtained by linear projections of the signal. In this paper we present an end-to-end deep learning…
Recently, it has been shown that compressed sensing (CS) has the potential to lower energy consumption in wireless electrocardiogram (ECG) systems. By reducing the number of acquired measurements, the communication burden is decreased and…
Electrochemistry is the underlying mechanism in a variety of energy conversion and storage systems, and it is well known that the composition, structure, and properties of electrochemical materials near active interfaces often deviates…
The Controlled Source Electromagnetic (CSEM) method aims to image electrical resistivity at intermediate depths (0-3 km) for geothermal, mineral, and groundwater exploration. It was developed both as a deeper extension of DC resistivity…
Electrochemical strains are a ubiquitous feature of solid state ionic devices ranging from ion batteries and fuel cells to electroresistive and memristive memories. Recently, we proposed a scanning probe microscopy (SPM) based approach,…
Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…