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We establish a series of deep convolutional neural networks to automatically analyze position averaged convergent beam electron diffraction patterns. The networks first calibrate the zero-order disk size, center position, and rotation…

Data Analysis, Statistics and Probability · Physics 2018-06-05 Weizong Xu , James M. LeBeau

Characterizing long-range electric fields and built-in potentials in functional materials at nano- to micrometer scales is of supreme importance for optimizing devices. E.g., the functionality of semiconductor heterostructures or battery…

Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…

Recent advances in scanning transmission electron and scanning tunneling microscopies allow researchers to measure materials structural and electronic properties, such as atomic displacements and charge density modulations, at an Angstrom…

In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan pattern in STEM imaging on the beam damage in a specific…

Materials Science · Physics 2021-05-03 D. Jannis , A. Velazco , A. Béché , J. Verbeeck

Materials with tailored quantum properties can be engineered from atomic scale assembly techniques, but existing methods often lack the agility and accuracy to precisely and intelligently control the manufacturing process. Here we…

In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…

Computer Vision and Pattern Recognition · Computer Science 2025-03-19 Ganesh Raghavendran , Bing Han , Fortune Adekogbe , Shuang Bai , Bingyu Lu , William Wu , Minghao Zhang , Ying Shirley Meng

Electron tomography has achieved higher resolution and quality at reduced doses with recent advances in compressed sensing. Compressed sensing (CS) theory exploits the inherent sparse signal structure to efficiently reconstruct…

Computational Physics · Physics 2020-12-02 Jonathan Schwartz , Huihuo Zheng , Marcus Hanwell , Yi Jiang , Robert Hovden

The information content of atomic resolution scanning transmission electron microscopy (STEM) images can often be reduced to a handful of parameters describing each atomic column, chief amongst which is the column position. Neural networks…

Materials Science · Physics 2023-02-22 Jingrui Wei , Ben Blaiszik , Aristana Scourtas , Dane Morgan , Paul M. Voyles

Electromagnetic (EM) sensing is a wide-spread contactless examination technique in science, engineering and military. However, conventional sensing systems are mostly lack of intelligence, which not only require expensive hardware and…

Signal Processing · Electrical Eng. & Systems 2019-12-06 Hao-Yang Li , Han-Ting Zhao , Meng-Lin Wei , Heng-Xin Ruan , Ya Shuang , Tie Jun Cui , Lianlin Li

Deep kernel learning aims at designing nonlinear combinations of multiple standard elementary kernels by training deep networks. This scheme has proven to be effective, but intractable when handling large-scale datasets especially when the…

Computer Vision and Pattern Recognition · Computer Science 2018-05-01 Mingyuan Jiu , Hichem Sahbi

Neural implicit functions have achieved impressive results for reconstructing 3D shapes from single images. However, the image features for describing 3D point samplings of implicit functions are less effective when significant variations…

Computer Vision and Pattern Recognition · Computer Science 2022-02-01 Yixin Zhuang , Yunzhe Liu , Yujie Wang , Baoquan Chen

Learning latent representations of registered meshes is useful for many 3D tasks. Techniques have recently shifted to neural mesh autoencoders. Although they demonstrate higher precision than traditional methods, they remain unable to…

Computer Vision and Pattern Recognition · Computer Science 2020-10-22 Yi Zhou , Chenglei Wu , Zimo Li , Chen Cao , Yuting Ye , Jason Saragih , Hao Li , Yaser Sheikh

Single-beam scanning electron microscopes (SEM) are widely used to acquire massive data sets for biomedical study, material analysis, and fabrication inspection. Datasets are typically acquired with uniform acquisition: applying the…

Image and Video Processing · Electrical Eng. & Systems 2021-01-11 Lu Mi , Hao Wang , Yaron Meirovitch , Richard Schalek , Srinivas C. Turaga , Jeff W. Lichtman , Aravinthan D. T. Samuel , Nir Shavit

Direct electron detectors in scanning transmission electron microscopy give unprecedented possibilities for structure analysis at the nanoscale. In electronic and quantum materials, this new capability gives access to, for example, emergent…

Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a…

Image and Video Processing · Electrical Eng. & Systems 2020-05-21 Jeffrey M. Ede , Richard Beanland

Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of…

Accurate structural analysis is essential to gain physical knowledge and understanding of atomic-scale processes in materials from atomistic simulations. However, traditional analysis methods often reach their limits when applied to…

We report the development and implementation of a hypothesis learning based automated experiment, in which the microscope operating in the autonomous mode identifies the physical laws behind the material's response. Specifically, we explore…

Current system thermal-hydraulic codes have limited credibility in simulating real plant conditions, especially when the geometry and boundary conditions are extrapolated beyond the range of test facilities. This paper proposes a…

Machine Learning · Computer Science 2020-01-14 Han Bao , Nam Dinh , Linyu Lin , Robert Youngblood , Jeffrey Lane , Hongbin Zhang