Related papers: Defect Detection on Semiconductor Wafers by Distri…
With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…
A change points detection aims to catch an abrupt disorder in data distribution. Common approaches assume that there are only two fixed distributions for data: one before and another after a change point. Real-world data are richer than…
Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…
Rare properties remain a challenge for statistical model checking (SMC) due to the quadratic scaling of variance with rarity. We address this with a variance reduction framework based on lightweight importance splitting observers. These…
A distributed data collection algorithm to accurately store and forward information obtained by wireless sensor networks is proposed. The proposed algorithm does not depend on the sensor network topology, routing tables, or geographic…
Current object segmentation algorithms are based on the hypothesis that one has access to a very large amount of data. In this paper, we aim to segment objects using only tiny datasets. To this extent, we propose a new automatic part-based…
Latent defect screening is challenged by extremely low failure rates, high-dimensional test data, and absence of labeled anomalies. We propose the first unsupervised anomaly detection framework incorporating a Diffusion Transformer. Raw…
We report on a new algorithm for detection of crystallographic information in 3D, as retained in Atom Probe Tomography (APT), with improved robustness and signal detection performance. The algorithm is underpinned by 1D distribution…
Object detection is one of the most important and challenging branches of computer vision, which has been widely applied in peoples life, such as monitoring security, autonomous driving and so on, with the purpose of locating instances of…
Sensor networks aim at monitoring their surroundings for event detection and object tracking. But, due to failure, or death of sensors, false signal can be transmitted. In this paper, we consider the problems of distributed fault detection…
In this paper, we discuss a class of distributed detection algorithms which can be viewed as implementations of Bayes' law in distributed settings. Some of the algorithms are proposed in the literature most recently, and others are first…
In this paper, given a random uniform distribution of sensor nodes on a 2-D plane, a fast self-organized distributed algorithm is proposed to find the maximum number of partitions of the nodes such that each partition is connected and…
Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is…
Early object detection (OD) is a crucial task for the safety of many dynamic systems. Current OD algorithms have limited success for small objects at a long distance. To improve the accuracy and efficiency of such a task, we propose a novel…
Community detection has become an extremely active area of research in recent years, with researchers proposing various new metrics and algorithms to address the problem. Recently, the Weighted Community Clustering (WCC) metric was proposed…
This paper deals with the problem of designing a distributed fault detection and isolation algorithm for nonlinear large-scale systems that are subjected to multiple fault modes. To solve this problem, a network of communicating detection…
A scattering vector is a local descriptor including multiscale and multi-direction co-occurrence information. It is computed with a cascade of wavelet decompositions and complex modulus. This scattering representation is locally translation…
Detection and description of keypoints from an image is a well-studied problem in Computer Vision. Some methods like SIFT, SURF or ORB are computationally really efficient. This paper proposes a solution for a particular case study on…
High-dimensional feature selection is a central problem in a variety of application domains such as machine learning, image analysis, and genomics. In this paper, we propose graph-based tests as a useful basis for feature selection. We…
Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement…