Related papers: Very high frequency probes for atomic force micros…
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning…
New classical modalities of atomic force microscopy continue to emerge to achieve higher spatial, spectral, and temporal resolution for nanometrology of materials. Here, we introduce the concept of a quantum mechanical modality that…
Piezoelectric nanowires are promising materials for sensing, actuation and energy harvesting, due to their enhanced properties at the nanoscale. However, quantitative characterization of piezoelectricity in nanomaterials is challenging due…
Understanding the nanoscale carrier dynamics induced by light excitation is the key to unlocking futuristic devices and innovative functionalities in advanced materials. Optical pump-probe scanning tunneling microscopy (OPP-STM) has opened…
Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…
In this article, we measure the viscous damping $G'',$ and the associated stiffness $G',$ of a liquid flow in sphere-plane geometry in a large frequency range. In this regime, the lubrication approximation is expected to dominate. We first…
Developing nano-mechanical oscillators for ultrasensitive force detection is of great importance in exploring science. We report our achievement of ultrasensitive detection of the external force regarding the radio-frequency electric field…
Microscopies have become pillars of our characterization tools to observe biological systems and assemblies. Correlative and synchronous use of different microscopies relies on the fundamental assumption of non-interference during images…
In force sensing, optomechanics, and quantum motion experiments, it is typically advantageous to create lightweight, compliant mechanical elements with the lowest possible force noise. Here we report wafer-scale batch fabrication and…
When measuring quadratic values representative of random fluctuations, such as the thermal noise of Atomic Force Microscopy (AFM) cantilevers, the background measurement noise cannot be averaged to zero. We present a signal processing…
We report on our progress in the development of an atomic magnetometer (AM) based low-frequency magnetic particle imaging (MPI) scanner, expected to be free from Specific Absorption Rate (SAR) and Peripheral Nerve Stimulation (PNS)…
Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…
We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…
We present a silicon optomechanical nanobeam design with a dynamically tunable acoustic mode at 10.2 GHz. The resonance frequency can be shifted by 90 kHz/V^2 with an on-chip capacitor that was optimized to exert forces up to 1 $\mu$N at 10…
Currently, Atomic Force Microscopy (AFM) is the most preferred Scanning Probe Microscopy (SPM) method due to its numerous advantages. However, increasing the scanning speed and reducing the interaction forces between the probe's tip and the…
The quantitative measurement of viscoelasticity of nano-scaleentities is an important goal of nanotechnology research and there is considerable progress with advent of dynamic Atomic Force Microscopy. The hydrodynamics of cantilever, the…
Atomic Force Microscopy - Infrared (AFM-IR) has emerged as a useful technique for measuring absorption spectra with spatial resolution better than the optical diffraction limit. The technique relies on the movement of a probe for atomic…
Optically pumped magnetometers (OPMs) based on alkali-atom vapors are ultra-sensitive devices for dc and low-frequency ac magnetic measurements. Here, in combination with fast-field-cycling hardware and high-resolution spectroscopic…
Molecular dynamics simulations have been performed to understand true atomic resolution, which has been observed on the Si(111)-7$\times$7 surface by dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale contrast is…