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Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

Pseudo-heterodyne scattering-type scanning near-field optical microscopy (sSNOM) is applied in the mid-infrared region to detect the chemical composition of biomolecules on the nanoscale. However, the application of sSNOM in molecular…

Instrumentation and Detectors · Physics 2025-08-06 Yusuke Sakiyama , Emanuel Pfitzner , Santiago H. Andany , Georg E. Fantner , Joachim Heberle

The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…

Mesoscale and Nanoscale Physics · Physics 2015-03-19 Franz J. Giessibl , Florian Pielmeier , Toyoaki Eguchi , Toshu An , Yukio Hasegawa

The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the…

We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100…

Mesoscale and Nanoscale Physics · Physics 2014-04-03 S. E. de Graaf , A. V. Danilov , A. Adamyan , S. E. Kubatkin

We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…

Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf,…

The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…

Materials Science · Physics 2011-09-05 David Busch , Qingze Zou , Baskar Ganapathysubramanian

The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…

Applied Physics · Physics 2024-06-19 Omur E Dagdeviren

Three-dimensional atomic force microscopy (3D-AFM) has been a powerful tool to probe the atomic-scale structure of solid-liquid interfaces. As a nanoprobe moves along the 3D volume of interfacial liquid, the probe-sample interaction force…

We adjust the transient dynamics of a piezo-actuated bimorph Atomic Force Microscopy (AFM) probe using a state feedback controller. This approach enables us to adjust the quality factor and the resonance frequency of the probe…

Atomic Physics · Physics 2012-04-16 Bilal Orun , Serkan Necipoglu , Cagatay Basdogan , Levent Guvenc

Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…

Mesoscale and Nanoscale Physics · Physics 2023-08-01 Alba R. Piacenti , Casey Adam , Nicholas Hawkins , Ryan Wagner , Jacob Seifert , Yukinori Taniguchi , Roger Proksch , Sonia Contera

Measuring the mechanical response of liquid interfaces without direct contact remains a major experimental challenge, particularly in liquid-liquid systems where no solid reference exists. Here, we develop a frequency-modulation atomic…

Soft Condensed Matter · Physics 2026-05-29 Lucie Corral , Christian Curtil , Medhi Lagaize , Marc Leonetti , Hubert R. Klein

We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled…

Pattern Formation and Solitons · Physics 2020-10-06 E. V. Kazantseva , Y. Braiman , J. Barhen

Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types,…

Instrumentation and Detectors · Physics 2023-06-29 Mustafa Kangül , Navid Asmari , Santiago H. Andany , Marcos Penedo , Georg E. Fantner

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…

Mesoscale and Nanoscale Physics · Physics 2013-02-06 Daniel Platz , Daniel Forchheimer , Erik A. Tholen , David B. Haviland

Mechanical force is an essential feature for many physical and biological processes.1-12 Remote measurement of mechanical signals with high sensitivity and spatial resolution is needed for diverse applications, including robotics,13…

Atomic force microscopy (AFM) using qPlus sensors is a powerful tool for high-resolution analysis in various liquids, including high-viscosity or opaque environments. However, the relatively high displacement sensor noise density (n_{ds}),…

Instrumentation and Detectors · Physics 2026-05-05 Takashi Ichii , Shuji Tokitoh , Yuto Nishiwaki , Toru Utsunomiya

Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing \cite{RMPforce2003, Rugar2004, YazdiIEEE}. These sensors often rely on the measurement of the displacement amplitude of mechanical…

Quantum Physics · Physics 2017-03-08 Ravid Shaniv , Roee Ozeri

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…