English
Related papers

Related papers: A Deep Learning Based Automatic Defect Analysis Fr…

200 papers

Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer structures that define device performance. Developing effective…

In this research work, we have proposed a thermal tiny-YOLO multi-class object detection (TTYMOD) system as a smart forward sensing system that should remain effective in all weather and harsh environmental conditions using an end-to-end…

Computer Vision and Pattern Recognition · Computer Science 2023-01-19 Muhammad Ali Farooq , Waseem Shariff , Faisal Khan , Peter Corcoran

Although convolutional neural networks have made outstanding achievements in visible light target detection, there are still many challenges in infrared small object detection because of the low signal-to-noise ratio, incomplete object…

Computer Vision and Pattern Recognition · Computer Science 2024-08-15 Zhonglin Chen , Anyu Geng , Jianan Jiang , Jiwu Lu , Di Wu

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

Computer Vision and Pattern Recognition · Computer Science 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

Deep learning has been constantly improving in recent years and a significant number of researchers have devoted themselves to the research of defect detection algorithms. Detection and recognition of small and complex targets is still a…

Computer Vision and Pattern Recognition · Computer Science 2024-06-24 Siddiqui Muhammad Yasir , Hyunsik Ahn

Tracking droplets in microfluidics is a challenging task. The difficulty arises in choosing a tool to analyze general microfluidic videos to infer physical quantities. The state-of-the-art object detector algorithm You Only Look Once (YOLO)…

Computer Vision and Pattern Recognition · Computer Science 2023-01-20 Mihir Durve , Sibilla Orsini , Adriano Tiribocchi , Andrea Montessori , Jean-Michel Tucny , Marco Lauricella , Andrea Camposeo , Dario Pisignano , Sauro Succi

In this work, we try to address the challenging problem of dimple detection and segmentation in Titanium alloys using machine learning methods, especially neural networks. The images i.e. fractographs are obtained using a Scanning Election…

Image and Video Processing · Electrical Eng. & Systems 2020-10-02 Ashish Sinha , K S Suresh

This paper proposes an efficient, low-complexity and anchor-free object detector based on the state-of-the-art YOLO framework, which can be implemented in real time on edge computing platforms. We develop an enhanced data augmentation…

Computer Vision and Pattern Recognition · Computer Science 2023-02-16 Shihan Liu , Junlin Zha , Jian Sun , Zhuo Li , Gang Wang

Phase contrast transmission electron microscopy (TEM) is a powerful tool for imaging the local atomic structure of materials. TEM has been used heavily in studies of defect structures of 2D materials such as monolayer graphene due to its…

Materials Science · Physics 2021-09-01 Robbie Sadre , Colin Ophus , Anstasiia Butko , Gunther H Weber

Deep learning methods for computer vision tasks show promise for automating the data analysis of camera trap images. Ecological camera traps are a common approach for monitoring an ecosystem's animal population, as they provide continual…

Computer Vision and Pattern Recognition · Computer Science 2018-03-30 Stefan Schneider , Graham W. Taylor , Stefan C. Kremer

Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in…

Surface defects on Printed Circuit Boards (PCBs) directly compromise product reliability and safety. However, achieving high-precision detection is challenging because PCB defects are typically characterized by tiny sizes, high texture…

Computer Vision and Pattern Recognition · Computer Science 2026-01-19 Meng Han

Since the defect detection of conventional industry components is time-consuming and labor-intensive, it leads to a significant burden on quality inspection personnel and makes it difficult to manage product quality. In this paper, we…

Computer Vision and Pattern Recognition · Computer Science 2025-10-07 Wei-Lung Mao , Chun-Chi Wang , Po-Heng Chou , Yen-Ting Liu

Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…

Instrumentation and Detectors · Physics 2018-12-05 Fehmi S. Yasin , Tyler R. Harvey , Jordan J. Chess , Jordan S. Pierce , Colin Ophus , Peter Ercius , Benjamin J. McMorran

Topological defects play a key role in the structures and dynamics of liquid crystals (LCs) and other ordered systems. There is a recent interest in studying defects in different biological systems with distinct textures. However, a robust…

Soft Condensed Matter · Physics 2025-01-20 Haijie Ren , Weiqiang Wang , Wentao Tang , Rui Zhang

Academic integrity continues to face the persistent challenge of examination cheating. Traditional invigilation relies on human observation, which is inefficient, costly, and prone to errors at scale. Although some existing AI-powered…

Computer Vision and Pattern Recognition · Computer Science 2026-04-20 Van-Truong Le , Le-Khanh Nguyen , Trong-Doanh Nguyen

Defects and microstructural features spanning the atomic level to the microscale play deterministic roles in the expressed properties of materials. Yet studies of material evolution in response to environmental stimuli most often correlate…

The exotic internal structure of polar topologies in multi-ferroic materials offers a rich landscape for materials science research. As the spatial scale of these entities are often sub-atomic in nature, aberration corrected transmission…

Two-dimensional (2D) materials and heterostructures exhibit unique physical properties, necessitating efficient and accurate characterization methods. Leveraging advancements in artificial intelligence, we introduce a deep learning-based…

Machine Learning · Computer Science 2025-03-04 Junqi He , Yujie Zhang , Jialu Wang , Tao Wang , Pan Zhang , Chengjie Cai , Jinxing Yang , Xiao Lin , Xiaohui Yang

As it requires a huge number of parameters when exposed to high dimensional inputs in video detection and classification, there is a grand challenge to develop a compact yet accurate video comprehension at terminal devices. Current works…

Computer Vision and Pattern Recognition · Computer Science 2018-06-08 Yuan Cheng , Guangya Li , Hai-Bao Chen , Sheldon X. -D. Tan , Hao Yu