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We demonstrate the potential of X-ray free-electron lasers (XFEL) to advancethe understanding of complex plasma dynamics by allowing for the first time nanometer and femtosecond resolution at the same time in plasma diagnostics. Plasma…
Label-free spectromicroscopy methods offer the capability to examine complex cellular phenomena. Electron and X-ray-based spectromicroscopy methods, though powerful, have been hard to implement with hydrated objects due to the vacuum…
Reflectometry is a technique that uses the light reflected by a sample to determine properties of the sample. Interferometric reflectometry uses interference between two beams, one of which is incident on ---and reflected back by--- a…
In a recent publication, Dalen, and Selst{\o}, Phys. Rev. A {\bf 111}, 033116 (2025), it was demonstrated how converged photo electron spectra could be determined using a complex absorbing potential on a truncated numerical domain…
Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
Reflection of light from surfaces is a very common, but complex phenomenon not only in science and technology, but in every day life. The underlying basic optical principles have been developed within the last five centuries using visible…
Total internal reflection fluorescence (TIRF) microscopy and its variants are key technologies for visualizing the dynamics of single molecules or organelles in live cells. Yet, truely quantitative TIRF remains problematic. One unknown…
Free-electron laser hard X-ray light sources can provide high fluence, femtosecond pulses, enabling the time-resolved probing of structural dynamics and elementary relaxation processes in molecules. Traditional X-ray elastic scattering from…
Using self-assembly techniques, x-ray reflectivity measurements, and computer simulations, we study the effective interaction between charged polymer rods and surfaces. Long-time Brownian dynamics simulations are used to measure the…
We present a model independent approach for the reconstruction of the atomic concentration profile in a nanoscale layered structure, as measured using the X-ray fluorescence yield modulated by an X-ray standing wave (XSW). The approach is…
The stability and emissivity of the online calibration blackbody used in high-precision infrared remote sensing detectors in extreme environments are the primary limiting factors for their measurement accuracy. Due to the limitations of…
We achieved a tripling of the maximum range of perpendicular momentum transfer (q_z) of X-ray scattering from liquid surfaces using a double crystal deflector setup to tilt the incident X-ray beam. This is obtained by using Miller indices…
Using molecular simulation to aid in the analysis of neutron reflectometry measurements is commonplace. However, reflectometry is a tool to probe large-scale structures, and therefore the use of all-atom simulation may be irrelevant. This…
Transition metal (TM) oxide heterostructure superlattices have attracted great attention in research communities because of their emergent interfacial phenomena that do not exist in the bulk form. In order to understand the mechanisms that…
Fabrication of semiconductor heterostructures is now so precise that metrology has become a key challenge for progress in science and applications. It is now relatively straightforward to characterize classic III-V and group IV…
Controlling the structure of polymer solutions near a solid surface is crucial for many industrial processes, as it significantly impacts solution flow and influences slip at the interface. To date, only a few techniques have been developed…
Relying on atomic scattering factors from evaluated databases, a new model for the reflectivity of x rays on solid surfaces has been developed for FLUKA v4-6.0. This model accounts for the variation of reflectivity as a function of the…
We have developed an improved method of time-resolved x-ray reflectivity (XRR) using monochromatic synchrotron radiation. Our method utilizes a polycapillary x-ray optic to create a range of incident angles and an area detector to collect…
We present a new computation method for simulating reflection high-energy electron diffraction and the total-reflection high-energy positron diffraction experiments. The two experiments are used commonly for the structural analysis of…