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Bayesian Additive Regression Trees (BART) is a fully Bayesian approach to modeling with ensembles of trees. BART can uncover complex regression functions with high dimensional regressors in a fairly automatic way and provide Bayesian…

Machine Learning · Statistics 2018-07-11 Edward George , Prakash Laud , Brent Logan , Robert McCulloch , Rodney Sparapani

In the context of multivariate nonparametric regression with missing covariates, we propose Pattern Embedded Neural Networks (PENNs), which can be applied in conjunction with any existing imputation technique. In addition to a neural…

Methodology · Statistics 2025-04-30 Tianyi Ma , Tengyao Wang , Richard J. Samworth

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

Computer Vision and Pattern Recognition · Computer Science 2024-07-18 Amit Prasad , Bappaditya Dey , Victor Blanco , Sandip Halder

The problem of machine learning with missing values is common in many areas. A simple approach is to first construct a dataset without missing values simply by discarding instances with missing entries or by imputing a fixed value for each…

Machine Learning · Statistics 2018-03-02 Hiroyuki Hanada , Toshiyuki Takada , Jun Sakuma , Ichiro Takeuchi

Traditional neural networks provide deterministic predictions without inherent uncertainty estimates. While Bayesian Neural Networks (BNNs) offer a principled approach to uncertainty quantification, their computational complexity limits…

Machine Learning · Statistics 2026-05-25 Rouaa Hoblos , Noura Dridi , Noureddine Zerhouni , Zeina Al Masry

Imbalanced data with a skewed class distribution are common in many real-world applications. Deep Belief Network (DBN) is a machine learning technique that is effective in classification tasks. However, conventional DBN does not work well…

Machine Learning · Computer Science 2018-05-08 Chong Zhang , Kay Chen Tan , Haizhou Li , Geok Soon Hong

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

Computer Vision and Pattern Recognition · Computer Science 2024-07-16 Bappaditya Dey , Vic De Ridder , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge

The Dirichlet process (DP) is one of the most popular Bayesian nonparametric models. An open problem with the DP is how to choose its infinite dimensional parameter (base measure) in case of lack of prior information. In this work we…

Statistics Theory · Mathematics 2014-02-21 Alessio Benavoli , Francesca Mangili , Fabrizio Ruggeri , Marco Zaffalon

Bayesian network classifiers (BNCs) possess a number of properties desirable for a modern classifier: They are easily interpretable, highly scalable, and offer adaptable complexity. However, traditional methods for learning BNCs have…

Machine Learning · Computer Science 2025-05-30 Connor Cooper , Geoffrey I. Webb , Daniel F. Schmidt

Classifying samples in incomplete datasets is a common aim for machine learning practitioners, but is non-trivial. Missing data is found in most real-world datasets and these missing values are typically imputed using established methods,…

We develop a general class of Bayesian repulsive Gaussian mixture models that encourage well-separated clusters, aiming at reducing potentially redundant components produced by independent priors for locations (such as the Dirichlet…

Methodology · Statistics 2017-10-24 Fangzheng Xie , Yanxun Xu

When analyzing data from multiple sources, it is often convenient to strike a careful balance between two goals: capturing the heterogeneity of the samples and sharing information across them. We introduce a novel framework to model a…

Methodology · Statistics 2026-03-02 Laura D'Angelo , Bernardo Nipoti , Andrea Ongaro

The development of computer vision and in-situ monitoring using visual sensors allows the collection of large datasets from the additive manufacturing (AM) process. Such datasets could be used with machine learning techniques to improve the…

Computer Vision and Pattern Recognition · Computer Science 2023-09-06 Xiao Liu , Alessandra Mileo , Alan F. Smeaton

In many applications the process of generating label information is expensive and time consuming. We present a new method that combines active and semi-supervised deep learning to achieve high generalization performance from a deep…

Machine Learning · Computer Science 2018-03-06 Matthias Rottmann , Karsten Kahl , Hanno Gottschalk

Among existing uncertainty estimation approaches, Dirichlet Prior Network (DPN) distinctly models different predictive uncertainty types. However, for in-domain examples with high data uncertainties among multiple classes, even a DPN model…

Machine Learning · Computer Science 2021-01-07 Jay Nandy , Wynne Hsu , Mong Li Lee

Automatic defect detection for 3D printing processes, which shares many characteristics with change detection problems, is a vital step for quality control of 3D printed products. However, there are some critical challenges in the current…

Computer Vision and Pattern Recognition · Computer Science 2023-08-04 Yushuo Niu , Ethan Chadwick , Anson W. K. Ma , Qian Yang

We propose a Bayesian nonparametric mixture model for the reconstruction and prediction from observed time series data, of discretized stochastic dynamical systems, based on Markov Chain Monte Carlo methods (MCMC). Our results can be used…

Applications · Statistics 2017-10-03 Christos Merkatas , Konstantinos Kaloudis , Spyridon J. Hatjispyros

During the past few decades, missing-data problems have been studied extensively, with a focus on the ignorable missing case, where the missing probability depends only on observable quantities. By contrast, research into non-ignorable…

Methodology · Statistics 2019-08-06 Yukun Liu , Pengfei Li , Jing Qin

A classic inferential statistical problem is the goodness-of-fit (GOF) test. Such a test can be challenging when the hypothesized parametric model has an intractable likelihood and its distributional form is not available. Bayesian methods…

Machine Learning · Statistics 2023-11-13 Forough Fazeli-Asl , Michael Minyi Zhang , Lizhen Lin

In this paper, we showed that the no-arbitrage condition holds if the market follows the mixture of the geometric Brownian motion (GBM). The mixture of GBM can incorporate heavy-tail behavior of the market. It automatically leads us to…

Methodology · Statistics 2018-05-02 Sourish Das , Aritra Halder , Ananya Lahiri , Dipak K Dey
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