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The present article proposes a data analysis method for experimentally-derived measurements, which consists of an auto-optimization procedure and a sensitivity analysis. The method was applied to the results of a total-reflection…

Positron emission tomography (PET) is widely used in various clinical applications, including cancer diagnosis, heart disease and neuro disorders. The use of radioactive tracer in PET imaging raises concerns due to the risk of radiation…

Computer Vision and Pattern Recognition · Computer Science 2017-12-13 Junshen Xu , Enhao Gong , John Pauly , Greg Zaharchuk

We present a simplified web-based application for simulating x-ray and photoelectron spectra of transition metals, built around the notion that web-based applications lower the bar for novice users. The application provides a simple…

Strongly Correlated Electrons · Physics 2021-09-14 T. P. Devereaux , B. Moritz , C. Jia , J. J. Kas , J. J. Rehr

We present an experimental set-up developed to perform optical spectroscopy experiments (Raman scattering and photoluminescence measurements) with a micrometer spatial resolution, in an extreme environment of low temperature, high magnetic…

We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in…

Computer Vision and Pattern Recognition · Computer Science 2019-08-21 Kevin de Haan , Zachary S. Ballard , Yair Rivenson , Yichen Wu , Aydogan Ozcan

Thin film systems are often analysed by using sputter depth profiling. First the sample gets eroded by inert gas ion impact during sputter depth profiling. Then the elemental composition of the freshly unveiled surface is determined by…

Instrumentation and Detectors · Physics 2017-11-28 Uwe Scheithauer

This chapter presents deep neural network based methods for enhancing the sensitivity of X-ray telescopic observations with imaging polarimeters. Deep neural networks can be used to determine photoelectron emission directions, photon…

Instrumentation and Methods for Astrophysics · Physics 2023-04-05 Abel L. Peirson

Electron matter interactions in electron microscopy produce both elastic and inelastic scattering, forming the basis for imaging and spectroscopy. However, the integration of electron energy loss spectroscopy (EELS) with 4D-STEM and…

Materials Science · Physics 2025-07-22 Yu Lei , Peng Wang

High-resolution spectroscopy in soft X-rays ($<2$ keV) requires diffractive elements to resolve any astrophysically relevant diagnostics, such as closely spaced lines, weak absorption lines, or line profiles. The Rowland torus geometry…

Instrumentation and Methods for Astrophysics · Physics 2024-08-21 Hans Moritz Günther , Casey T. DeRoo , Ralf K. Heilmann , Edward Hertz

Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution…

Advancements in fast electron detectors have enabled the statistically significant sampling of crystal structures on the nanometre scale by means of Scanning Electron Nanobeam Diffraction (SEND). Characterisation of structural similarity…

Materials Science · Physics 2022-07-28 Andy Bridger , William I. F. David , Thomas J. Wood , Mohsen Danaie , Keith T. Butler

Ptychography in a reflection geometry shows great promise for non-destructive imaging of 3-dimensional nanostructures at the surface of a thick substrate. A major challenge to obtain high quality reflection-ptychographic images under…

Angle-resolved photoemission spectroscopy (ARPES), an experimental technique based on the photoelectric effect, is arguably the most powerful method for probing the electronic structure of solids. The past decade has witnessed notable…

Materials Science · Physics 2021-06-21 Baiqing Lv , Tian Qian , Hong Ding

The optics of a number of future X-ray telescopes will have very long focal lengths (10 - 20 m), and will consist of a number of nested/stacked thin, grazing-incidence mirrors. The optical quality characterization of a real mirror can be…

Instrumentation and Methods for Astrophysics · Physics 2015-09-09 D. Spiga , S. Basso , M. Bavdaz , V. Burwitz , M. Civitani , O. Citterio , M. Ghigo , G. Hartner , B. Menz , G. Pareschi , L. Proserpio , B. Salmaso , G. Tagliaferri , E. Wille

The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical…

Emergent phenomena at complex-oxide interfaces have become a vibrant field of study in the past two decades due to the rich physics and a wide range of possibilities for creating new states of matter and novel functionalities for potential…

Materials Science · Physics 2024-06-19 C. -T. Kuo , G. Conti , J. E. Rault , C. M. Schneider , S. Nemšák , A. X. Gray

Achieving high spatial resolution is the goal of many imaging systems. Designing a high-resolution lens with diffraction-limited performance over a large field of view remains a difficult task in imaging system design. On the other hand,…

This project explores the design and development of a transition edge sensor (TES) spectrometer for resonant soft X- ray scattering (RSXS) measurements developed in collaboration between Argonne National Laboratory (ANL) and the National…

X-ray Ptychography is an advanced computational microscopy technique which is delivering exceptionally detailed quantitative imaging of biological and nanotechnology specimens. However coarse parametrisation in propagation distance,…

Image and Video Processing · Electrical Eng. & Systems 2021-10-20 Francesco Guzzi , George Kourousias , Fulvio Billè , Roberto Pugliese , Alessandra Gianoncelli , Sergio Carrato

Neutron reflectometry (NR) is a powerful technique to probe surfaces and interfaces. NR is inherently an indirect measurement technique, access to the physical quantities of interest (layer thickness, scattering length density, roughness),…

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