Related papers: Accuracy of Refractive Index Spectroscopy by Broad…
In this work we compute the resonant wavelength of whispering gallery modes for bulk-fused silica microspheres including chromatic dispersion. This is done following two methods: by solving the exact characteristic equation and, on the…
PASCO scientific 012-05187C Precision Interferometer is used in Michelson mode to investigate wavelengths and refractive indices. From varying the distance of the movable mirror in the Michelson setup the wavelength of the HeNe laser beam…
This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (non-iterative) and…
The set of realizable refractive indices as a function of frequency is considered. For passive media we give bounds for the refractive index variation in a finite bandwidth. Special attention is given to the loss and index variation in the…
Precise measurement of the refractive index of stable silicon isotopes $^{28}$Si, $^{29}$Si, $^{30}$Si single crystals with enrichments above 99.9 at.% and a silicon single crystal $^{nat}$Si of natural isotopic composition is performed…
Better knowing the precision on the measured value of the Brillouin peak frequencies is essen-tial in order to use it to deduce parameters related to studied materials. Modern methods for evaluating uncertainties are based on the…
In this work we present a refractive index sensor based on the leaky radiation of a microfiber. The 5.3um diameter microfiber is fabricated by drawing a commercial optical fiber. When the microfiber is immersed into a liquid with larger…
We have developed a white light interferometric microscope (WLIM), which can spatially resolve the change in the complex index of refraction and apply it to study reversible photodegradation of 1,4-Diamino-9,10-anthraquinone doped into…
We apply spinning-disc picometrology to measure the complex refractive index of graphene on thermal oxide on silicon. The refractive index varies from n = 2.4-1.0i at 532 nm to n = 3.0-1.4i at 633 nm at room temperature. The dispersion is…
Spectroscopy with entanglement has shown great potential to break limitations of traditional spectroscopic measurements, yet the role of entanglement in spectroscopic multi-parameter joint measurement, particularly in the infrared optical…
We present the methods and results for broadband group delay dispersion measurements for all-monocrystalline and amorphous-crystalline hybrid supermirrors, as well as an all-amorphous mirror in the wavelength range from…
In this paper, we show how the combined use of low coherence interferometry, balanced detection and data processing comparable to that used in Fourier transform spectrometry allows us to characterize with ultimate resolutions (sub-ppm in…
We introduce a new approach for measuring both the effective medium and the transport properties of light propagation in heterogeneous media. Our method utilizes the conceptual equivalence of frequency variation with a change in the…
The refractive index of silicon at $\gamma$-ray energies from 181 - 1959 keV was investigated using the GAMS6 double crystal spectrometer and found to follow the predictions of the classical scattering model. This is in contrast to earlier…
We performed high-resolution Fourier-transform infrared (FTIR) spectroscopy of a polymethyl methacrylate (PMMA) sphere of unknown size in the Mie scattering region. Apart from a slow, oscillatory structure (wiggles), which is due to an…
Motivated by non-destructive testing of optical fiber, we consider the problem of determining the index of refraction of a two-dimensional medium from magnitude of the total field resulting from known incident plane waves at a fixed…
We present two uniqueness results for the inverse problem of determining an index of refraction by the corresponding acoustic far-field measurement encoded into the scattering amplitude. The first one is a local uniqueness in determining a…
Optical cavities provide high sensitivity to dispersion since their resonance frequencies depend on the index of refraction. We present a direct, broadband, and accurate measurement of the modes of a high finesse cavity using an optical…
The dispersive part of the refractive index of vanadium is determined by measuring the angular displacement of the first order diffraction peak of a V/Fe superlattice. The measurements were made using elliptically polarized synchrotron…
We apply a pulsed-light interferometer to measure both the intensity and the phase of light that is transmitted through a strongly scattering disordered material. From a single set of measurements we obtain the time-resolved intensity,…