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Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…

Materials Science · Physics 2025-06-17 Steven R. Spurgeon

Scanning transmission electron microscopy (STEM) has become the technique of choice for quantitative characterization of atomic structure of materials, where the minute displacements of atomic columns from high-symmetry positions can be…

Materials Science · Physics 2021-10-05 Kevin M. Roccapriore , Nicole Creange , Maxim Ziatdinov , Sergei V. Kalinin

The motion of electrons in or near solids, liquids and gases can be tracked by forcing their ejection with attosecond x-ray pulses, derived from femtosecond lasers. The momentum of these emitted electrons carries the imprint of the…

Mesoscale and Nanoscale Physics · Physics 2017-06-14 C. W. Barlow-Myers , N. J. Pine , W. A. Bryan

We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…

Instrumentation and Detectors · Physics 2026-03-19 Akira Yasuhara , Takumi Sannomiya , Ryoichi Horisaki

Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…

Instrumentation and Detectors · Physics 2018-12-05 Fehmi S. Yasin , Tyler R. Harvey , Jordan J. Chess , Jordan S. Pierce , Colin Ophus , Peter Ercius , Benjamin J. McMorran

The concept of compressive sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based…

Instrumentation and Detectors · Physics 2016-03-23 Armand Béché , Bart Goris , Bert Freitag , Jo Verbeeck

Although in-situ transmission electron microscopy (TEM) of nanomaterials has been gaining importance in recent years, difficulties in sample preparation have limited the number of studies on electrical properties. Here, a support-based…

Mesoscale and Nanoscale Physics · Physics 2024-03-14 Simon Hettler , Mohammad Furqan , Raul Arenal

Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent…

Signal Processing · Electrical Eng. & Systems 2025-07-02 Amir Javadi Rad , Amirafshar Moshtaghpour , Dongdong Chen , Angus I. Kirkland

The advent of modern, high-speed electron detectors has made the collection of multidimensional hyperspectral transmission electron microscopy datasets, such as 4D-STEM, a routine. However, many microscopists find such experiments daunting…

State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of…

Computational Physics · Physics 2023-03-31 I. Lobato , T. Friedrich , S. Van Aert

Pixelated detectors in scanning transmission electron microscopy (STEM) generate large volumes of data, often tens to hundreds of GB per scan. However, to make current advancements scalable and enable widespread adoption, it is essential to…

Instrumentation and Detectors · Physics 2025-07-16 Arno Annys , Hoelen L. Lalandec Robert , Saleh Gholam , Joke Hadermann , Jo Verbeeck

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

The desire to image specimens in liquids has led to the development of open-cell and closed-cell techniques in transmission electron microscopy (TEM). The closed-cell approach is currently more common in TEM and has yielded new insights…

Applied Physics · Physics 2023-08-22 Barnaby D. A. Levin , Diane Haiber , Qianlang Liu , Peter A. Crozier

Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron-microscopes in a wide variety…

Thermal transport in nanostructures plays a critical role in modern technologies. As devices shrink, techniques that can measure thermal properties at nanometer and nanosecond scales are increasingly needed to capture transient,…

Understanding microstructural evolution under extreme thermal conditions is essential for advancing metal additive manufacturing (AM). This work demonstrates the feasibility of employing micro-electro-mechanical system (MEMS) heating…

Materials Science · Physics 2026-01-12 C. Koenig , P. Mayr , J. R. Jinschek , A. Bastos Fanta

Recent improvements in large language models (LLMs) have had a dramatic effect on capabilities and productivity across many disciplines involving critical thinking and writing. The development of the model context protocol (MCP) provides a…

Significant progress has been made in spatial resolution using environmental transmission electron microscopes (ETEM), which now enables atomic resolution visualization of structural transformation under variable temperature and gas…

Materials Science · Physics 2015-06-18 Wenpei Gao , Jianbo Wu , Xiaofeng Zhang , Aram Yoon , J. Mabon , W. Swiech , W. L. Wilson , H. Yang , Jian-Min Zuo

Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the…

Image and Video Processing · Electrical Eng. & Systems 2018-02-28 Étienne Monier , Thomas Oberlin , Nathalie Brun , Marcel Tencé , Marta de Frutos , Nicolas Dobigeon

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive…

Applied Physics · Physics 2023-08-11 Hsu-Chih Ni , Renliang Yuan , Jiong Zhang , Jian-Min Zuo