Related papers: An alternative method of image simulation in high …
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…
The propagation of high-energy electrons in crystals is in general a complicated multiple scattering problem. However, along high-symmetry zone axes the problem can be mapped to the time evolution of a two-dimensional (2D) molecular system.…
Charge transfer multiplet (CTM) theory is a computationally undemanding and highly mature method for simulating the soft X-ray spectra of first-row transition metal complexes. However, CTM theory has seldom been applied to the simulation of…
Accurate determination of electronic stopping cross sections is critical for ion beam analysis and related applications. While transmission methods are well established, backscattering approaches remain less explored from a metrological…
Due to their radiation hardness, kilohertz frame rates, and high dynamic range, hybrid pixel detectors have recently expanded their application range to electron diffraction and recently also electron imaging. However, these detectors…
Many types of neutron spectrometer use a conventional primary spectrometer consisting of some collimator, a crystal monochromator and a second collimator. Conventional resolution descriptions use instrument parameter values to deduce the…
Atom interferometery is an exquisite measurement technique sensitive to inertial forces. However, it is commonly limited to a single sensitive axis, allowing high-precision multi-dimensional sensing only through subsequent or post-corrected…
There is an interest to replace computed tomography (CT) images with magnetic resonance (MR) images for a number of diagnostic and therapeutic workflows. In this article, predicting CT images from a number of magnetic resonance imaging…
Aberration-corrected optics have made electron microscopy at atomic-resolution a widespread and often essential tool for nanocharacterization. Image resolution is dominated by beam energy and the numerical aperture of the lens ({\alpha}),…
Aberration-corrected scanning electron microscopy (AC-STEM) can provide valuable information on the atomic structure of nanoclusters, an essential input for gaining an understanding of their physical and chemical properties. A systematic…
A high accuracy and high sensitivity system architecture is proposed for the read-out circuit of electrical impedance tomography system-on-chip. The switched ratiometric technique is applied in the proposed architecture. The proposed system…
To date, high-resolution electron microscopy has largely relied on using the phase of the exit wave function at the exit surface to form a high-resolution electron microscopic image. We have for the first time used chromatic aberration…
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches.…
Atomic-scale imaging offers a reliable tool to directly measure the movement of microscopic particles. We present a scheme for achieving a nondestructive and ultrasensitive imaging of Rydberg atoms within an ensemble of cold probe atoms.…
The two dominant radiotherapy methods are either simplified in terms of beam generation and handling, which compromises the energy deposition curve in tissues (photon therapy), or require extensive accelerator facilities and complex beam…
The maximum entropy method (MEM) is a well known deconvolution technique in radio-interferometry. This method solves a non-linear optimization problem with an entropy regularization term. Other heuristics such as CLEAN are faster but highly…
A systematic approach is presented to exploit the rich field transformation capabilities of Electromagnetic (EM) metasurfaces for creating a variety of illusions using the concept of metasurface holograms. A system level approach to…
Neutral helium atom microscopy, also referred to as scanning helium microscopy and commonly abbreviated SHeM or NAM (neutral atom microscopy), is a novel imaging technique that uses a beam of neutral helium atoms as an imaging probe. The…
Tomography can be used to reveal internal properties of a 3D object using any penetrating wave. Advanced tomographic imaging techniques, however, are vulnerable to both systematic and random errors associated with the experimental…
Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient…